• I.S. EN IEC 60749-17:2019

    Current The latest, up-to-date edition.

    Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 60749-17:2019)

    Available format(s):  Hardcopy, PDF

    Language(s):  English - French

    Published date:  28-05-2019

    Publisher:  National Standards Authority of Ireland

    For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
    Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

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    Abstract - (Show below) - (Hide below)

    The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation.

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    Committee TC 47
    Document Type Standard
    Product Note THIS STANDARD ALSO REFERS TO ASTM E 1018 The date of any NSAI previous adoption may not match the date of its original CEN/CENELEC document.<br>
    Publisher National Standards Authority of Ireland
    Status Current
    Supersedes
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