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    I.S. EN IEC 60749-26:2018

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  16-04-2018

    Publisher:  National Standards Authority of Ireland

    For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
    Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

    Dates of withdrawal of national standards are available from NSAI.

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    Table of Contents - (Show below) - (Hide below)

    National foreword
    FOREWORD
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Apparatus and required equipment
    5 Stress test equipment qualification and routine verification
    6 Classification procedure
    7 Failure criteria
    8 Component classification
    Annex A (informative) - HBM test method flow chart
    Annex B (informative) - HBM test equipment parasitic properties
    Annex C (informative) - Example of testing a product using
            Table 2, Table 3, or Table 2 with a two-pin HBM tester
    Annex D (informative) - Examples of coupled non-supply pin pairs
    Annex E (normative) - Cloned non-supply (I/O) pin sampling
            test method
    Bibliography

    Abstract - (Show below) - (Hide below)

    Defines the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

    General Product Information - (Show below) - (Hide below)

    Development Note Supersedes I.S. EN 60749-26. (04/2018)
    Document Type Standard
    Publisher National Standards Authority of Ireland
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
    ESDA/JEDEC JS-001 : 2017 ELECTROSTATIC DISCHARGE SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) - COMPONENT LEVEL
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