• IEC 60068-2-17:1994

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  28-06-2023

    Language(s):  English - French, Russian, Spanish, Castilian

    Published date:  07-07-1994

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    Contents
    Committees responsible
    National foreword
    Foreword
    Survey of sealing tests
    1. Definitions
    2. Test Qa: Sealing of bushes, spindles and gaskets
    2.1 Object
    2.2 Scope
    2.3 General description of the test
    2.4 Initial measurements
    2.5 Conditions
    2.6 Final measurements
    2.7 Information to be given
    3. Test Qc: Container sealing, gas leakage
    3.1 Object
    3.2 Scope
    3.3 General description of the test
    3.4 Test Method 1
    3.5 Test Method 2
    3.6 Test Method 3
    3.7 Information to be given in the relevant specification
    4. Test Qd: Container sealing, seepage of filling liquid
    4.1 Object
    4.2 Scope
    4.3 General description of the test
    4.4 Severities
    4.5 Preconditioning
    4.6 Initial measurements
    4.7 Conditioning
    4.8 Final measurements
    4.9 Information to be given in the relevant specification
    5. Test Qf: Immersion
    5.1 Object
    5.2 General description of the test
    5.3 Initial measurements
    5.4 Preconditioning
    5.5 Conditioning
    5.6 Recovery
    5.7 Final measurements
    5.8 Information to be given in the relevant specification
    6. Test Qk: Sealing tracer gas method with mass
         spectrometer
    6.1 Object
    6.2 Scope
    6.3 General description of the test
    6.4 Test Method 1 (for specimens not filled with helium
         during manufacturing)
    6.5 Test Method 2 (for specimens filled with helium during
         manufacturing or for the requirements of this test)
    6.6 Test Method 3 (applicable to specimens to be mounted
         on bulkheads or panels)
    6.7 Information to be given in the relevant specification
    7. Test Ql: Bomb pressure test
    7.1 Object
    7.2 Scope
    7.3 General description of the test
    7.4 Initial measurements
    7.5 Conditioning
    7.6 Recovery
    7.7 Final measurements
    7.8 Information to be given in the relevant specification
    8. Test Qm: Tracer gas sealing test with internal
         pressurization
    8.1 Object
    8.2 Scope
    8.3 General description of the test
    8.4 Pre-conditioning
    8.5 Conditioning
    8.6 Information to be given in the relevant specification
    9. Test Qy: Pressure rise sealing test
    9.1 Object
    9.2 Scope
    9.3 General description of the test
    9.4 Calibration of the test equipment
    9.5 Information to be given in the relevant specification
    Annexes
    A. Example of a test chamber for Test Qa
    B. Guidance for Test Qc
    C. Guidance for Test Qd
    D. Interrelation of test parameters for Test Qk
    E. Guidance for Test Qk
    F. Guidance for Test Ql
    G. Guidance for Test Qm
    H. Guidance for Test Qy

    Abstract - (Show below) - (Hide below)

    Includes a number of tests which use different conditioning procedures appropriate for different application.

    General Product Information - (Show below) - (Hide below)

    Committee TC 104
    Development Note Also numbered as BS EN 60068-2.17. (09/2005) Stability Date: 2019. (10/2012)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    UNI EN 1300 : 2014 SECURE STORAGE UNITS - CLASSIFICATION FOR HIGH SECURITY LOCKS ACCORDING TO THEIR RESISTANCE TO UNAUTHORIZED OPENING
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    BS EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    BS EN 153000:1998 Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
    12/30258507 DC : 0 BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    S.R. CEN ISO/TS 14907-1:2015 ELECTRONIC FEE COLLECTION - TEST PROCEDURES FOR USER AND FIXED EQUIPMENT - PART 1: DESCRIPTION OF TEST PROCEDURES (ISO/TS 14907-1:2015)
    10/30235845 DC : 0 BS EN 61881-3 - RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITOR FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITORS
    BS EN 60939-1:2010 Passive filter units for electromagnetic interference suppression Generic specification
    10/30211766 DC : 0 BS EN 61881-3 - RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT CAPACITORS FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITOR
    BS EN 62575-1:2016 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
    I.S. EN 61810-1:2015 ELECTROMECHANICAL ELEMENTARY RELAYS - PART 1: GENERAL AND SAFETY REQUIREMENTS
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    14/30295044 DC : 0 BS ISO 19095-3 - ADHESIVES - EVALUATION OF THE ADHESION INTERFACE PERFORMANCE IN PLASTIC-METAL ASSEMBLIES - PART 3: TEST METHODS
    NF EN 61462 : 2008 COMPOSITE HOLLOW INSULATORS - PRESSURIZED AND UNPRESSURIZED INSULATORS FOR USE IN ELECTRICAL EQUIPMENT WITH RATED VOLTAGE GREATER THAN 1000 V - DEFINITIONS, TEST METHODS, ACCEPTANCE CRITERIA AND DESIGN RECOMMENDATIONS
    NF EN 60137 : 2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
    BS EN 1300:2013 Secure storage units. Classification for high security locks according to their resistance to unauthorized opening
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    PD CEN ISO/TS 14907-1:2015 Electronic fee collection. Test procedures for user and fixed equipment Description of test procedures
    13/30264600 DC : 0 BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID
    BS 6201-3:1982 Fixed capacitors for use in electronic equipment Specification for fixed capacitors for radio interference suppression. Selection of methods of test and general requirements
    BS EN 61300-2-23:1997 Fibre optic interconnecting devices and passive components. Basic test and measurement procedures. Tests Sealing for non-pressurized closures of fibre optic devices
    15/30325282 DC : 0 BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
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    BS EN 60749:1999 Semiconductor devices. Mechanical and climatic test methods
    13/30286159 DC : 0 BS EN 62435-1 - ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 1: GENERAL
    BS EN 196103:2000 Blank detail specification: Rotary switches. Assessment level Y
    04/30112662 DC : DRAFT APR 2004 IEC 61810-7 ED.2 - ELECTROMECHANICAL ELEMENTARY RELAYS - PART 7: TEST AND MEASUREMENT PROCEDURES
    UNE-EN 1300:2014 Secure storage units - Classification for high security locks according to their resistance to unauthorized opening
    BS EN 60539-1:2016 Directly heated negative temperature coefficient thermistors Generic specification
    BS IEC/IEEE 62271-37-013:2015 High-voltage switchgear and controlgear Alternating-current generator circuit-breakers
    BS EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
    DIN EN 138000 : 1997 GENERIC SPECIFICATION; FIXED INDUCTORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION (INDUCTORS FOR WHICH SAFETY TESTS ARE REQUIRED)
    DD CEN ISO/TS 14907-1:2010 Electronic fee collection. Test procedures for user and fixed equipment Description of test procedures
    13/30286167 DC : 0 BS EN 62435-5 - ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 5 - DIE & WAFER DEVICES
    I.S. EN 60749-8:2003 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 8: SEALING
    14/30257408 DC : 0 BS IEC/IEEE 62271-37-013 ED 1.0 - HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR - PART 37-013: ALTERNATING-CURRENT GENERATOR CIRCUIT-BREAKERS
    11/30251478 DC : 0 BS EN 1300 - SECURE STORAGE UNITS - CLASSIFICATION FOR HIGH SECURITY LOCKS ACCORDING TO THEIR RESISTANCE TO UNAUTHORIZED OPENING
    NF EN 60384-1 : 2016 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    BS EN 60384-1:2016 Fixed capacitors for use in electronic equipment Generic specification
    BS EN 60938-1:2000 Fixed inductors for electromagnetic interference suppression Generic specification
    BS QC 750111:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A
    05/30132097 DC : DRAFT JUNE 2005 IEC 60679-1 ED 3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    02/211632 DC : DRAFT DEC 2002 IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS
    CEI EN 60749-8 : 2004 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 8: SEALING
    OIML R 143 : 2009 INSTRUMENTS FOR THE CONTINUOUS MEASUREMENT OF SO[2] IN STATIONARY SOURCE EMISSIONS
    BS EN 61881-3 : 2012 RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITORS FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITORS
    BS EN 60749-8:2003 Semiconductor devices. Mechanical and climatic test methods Sealing
    BS EN 165000-1:1996 Film and hybrid integrated circuits Generic specification. Capability approval procedure
    BS CECC68000(1990) : AMD 9184 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: QUARTZ CRYSTAL UNITS
    CSA E60384.14 : 2014 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 14: SECTIONAL SPECIFICATION - FIXED CAPACITORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION AND CONNECTION TO THE SUPPLY MAINS
    C22.2 NO. 31-18 Switchgear assemblies
    I.S. EN 60044-8:2002 INSTRUMENT TRANSFORMERS - PART 8: ELECTRONIC CURRENT TRANSFORMERS
    BS EN 60044-8:2002 Instrument transformers Electronic current transformers
    IEC PAS 62435:2005 Electronic components - Long-duration storage of electronic components - Guidance for implementation
    CSA C60044-8 : 2007 : R2016 INSTRUMENT TRANSFORMERS - PART 8: ELECTRONIC CURRENT TRANSFORMERS
    I.S. CLC TS 50466:2006 LONG DURATION STORAGE OF ELECTRONIC COMPONENTS - SPECIFICATION FOR IMPLEMENTATION
    I.S. EN 61811-51:2002 ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 51: BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING TELECOM RELAYS OF ASSESSED QUALITY - NON-STANDARDIZED TYPES AND CONSTRUCTION
    I.S. EN 168000:1994 QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION)
    I.S. EN 60689:2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
    CEI EN 50526-1 : 2013 RAILWAY APPLICATIONS - FIXED INSTALLATIONS - D.C. SURGE ARRESTERS AND VOLTAGE LIMITING DEVICES - PART 1: SURGE ARRESTERS
    CEI EN 60689 : 2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
    I.S. EN 60694:1999 COMMON SPECIFICATIONS FOR HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR STANDARDS
    I.S. EN 61810-7:2006 ELECTROMECHANICAL ELEMENTARY RELAYS - PART 7: TEST AND MEASUREMENT PROCEDURES
    EN 62271-1:2017 High-voltage switchgear and controlgear - Part 1: Common specifications for alternating current switchgear and controlgear
    IEC TS 61462:1998 Composite insulators - Hollow insulators for use in outdoor and indoor electrical equipment - Definitions, test methods, acceptance criteria and design recommendations
    I.S. EN 60137:2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
    I.S. EN 60679-1:2017 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 62575-1:2016 RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    UNE-EN 60099-4:2016 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    I.S. EN 61248-1:1998 TRANSFORMERS AND INDUCTORS FOR USE IN ELECTRONIC AND TELECOMMUNICATION EQUIPMENT - PART 1: GENERIC SPECIFICATION
    I.S. EN 62246-1-1:2013 REED SWITCHES - PART 1-1: GENERIC SPECIFICATION - QUALITY ASSESSMENT (IEC 62246-1-1:2013 (EQV))
    IEC 61253-1:1993 Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
    EN 60137:2017 Insulated bushings for alternating voltages above 1 000 V
    I.S. EN 60939-1:2010 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    NF EN 60122-1 : 2003 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    IEC 62246-1:2015 Reed switches - Part 1: Generic specification
    IEC 60694:1996+AMD1:2000+AMD2:2001 CSV Common specifications for high-voltage switchgear and controlgear standards
    EN 60099-4:2014 Surge arresters - Part 4: Metal-oxide surge arresters without gaps for a.c. systems
    IEC 60384-1:2016 RLV Fixed capacitors for use in electronic equipment - Part 1: Generic specification
    EN 60749-8:2003 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
    EN 61811-51:2002 Electromechanical all-or-nothing relays - Part 51: Blank detail specification - Electromechanical all-or-nothing telecom relays of assessed quality - Non-standardized types and construction
    EN 60747-5-2:2001/A1:2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
    EN 153000:1998 Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
    EN 61019-1 : 2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
    EN 62246-1:2015 Reed switches - Part 1: Generic specification
    EN 60694:1996/A2:2001 COMMON SPECIFICATIONS FOR HIGH-VOLTAGE SWITCHGEAR AND CONTROLGEAR STANDARDS
    EN 196000 : 92 AMD 1 2001 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: ELECTROMECHANICAL SWITCHES
    EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
    EN 60939-1:2010 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    CLC/TS 50466:2006 Long duration storage of electronic components - Specification for implementation
    EN 129000:1993/A1:1995 GENERIC SPECIFICATION - FIXED RF WOUND INDUCTORS
    EN 61811-54:2002 Electromechanical all-or-nothing relays - Part 54: Blank detail specification - Electromechanical all-or-nothing telecom relays of assessed quality - Two change-over contacts, 15 mm x 7,5 mm base
    EN 62435-1:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
    EN 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    EN 60068-3-4:2002 Environmental testing - Part 3-4: Supporting documentation and guidance - Damp heat tests
    EN 61881-2 : 2012 RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITORS FOR POWER ELECTRONICS - PART 2: ALUMINIUM ELECTROLYTIC CAPACITORS WITH NON SOLID ELECTROLYTE (IEC 61881-2:2012)
    EN 181000:1994 Generic Specification: Fibre optic branching devices
    EN 180000:1995 Generic specification: Fibre optic attenuators
    EN 117000:1991 Generic Specification: Solid state all-or-nothing relays of assessed quality - Generic data and methods of test
    EN 168000 : 1993 AMD 2 1998 GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS
    12/30268003 DC : 0 BS EN 60939-3 - PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 3: HARMONIZED STANDARD FOR PASSIVE FILTER UNITS FOR WHICH SAFETY TESTS ARE APPROPRIATE
    09/30200407 DC : 0 BS EN 50526-1 - RAILWAY APPLICATIONS - FIXED INSTALLATIONS - D.C. SURGE ARRESTERS AND VOLTAGE LIMITING DEVICES - PART 1: SURGE ARRESTERS
    13/30278343 DC : 0 BS EN 62246-1 - REED SWITCHES - PART 1: GENERIC SPECIFICATION
    BS EN 60358-1:2012 Coupling capacitors and capacitor dividers General rules
    06/30157868 DC : 0 BS EN 60393-1 - POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    BS IEC 61275:2013 Radiation protection instrumentation. Measurement of discrete radionuclides in the environment. In situ photon spectrometry system using a germanium detector
    03/101947 DC : DRAFT FEB 2003 IEC 60939-1 ED.2.0 - PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
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    11/30243761 DC : 0 BS ISO 14708-7 - IMPLANTS FOR SURGERY - ACTIVE IMPLANTABLE MEDICAL DEVICES - PART 7: PARTICULAR REQUIREMENTS FOR COCHLEAR IMPLANT SYSTEMS
    BS EN 196403:2000 Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y
    BS EN 61462:2007 Composite hollow insulators. Pressurized and unpressurized insulators for use in electrical equipment with rated voltage greater than 1000 V. Definitions, test methods, acceptance criteria and design recommendations
    BS IEC 60747-4.2 : 2000 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION
    02/203604 DC : DRAFT MAR 2002 IEC 61810-1. ED.2 - ELEMENTARY RELAYS - PART 1: SAFETY-RELATED AND GENERAL REQUIREMENTS
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    I.S. EN 61462:2007 COMPOSITE HOLLOW INSULATORS - PRESSURIZED AND UNPRESSURIZED INSULATORS FOR USE IN ELECTRICAL EQUIPMENT WITH RATED VOLTAGE GREATER THAN 1 000 V - DEFINITIONS, TEST METHODS, ACCEPTANCE CRITERIA AND DESIGN RECOMMENDATIONS
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    BS EN 196000:1993 Harmonized system of quality assessment for electronic components. Generic specification. Electromechanical switches
    BS EN 181000:1995 Harmonized system of quality assessment for electronic components. Generic specification. Fibre optic branching devices
    CEI EN 60393-1 : 2010 POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
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    I.S. EN 62146-1:2014 GRADING CAPACITORS FOR HIGH-VOLTAGE ALTERNATING CURRENT CIRCUIT-BREAKERS - PART 1: GENERAL
    BS EN 138000:1997 Harmonized system of quality assessment for electronic components. Generic specification: fixed inductors for electromagnetic interference suppression (inductors for which safety tests are required)
    IEC 60137:2017 Insulated bushings for alternating voltages above 1000 V
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    I.S. EN 60384-1:2016 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    I.S. EN 61007:1998 TRANSFORMERS AND INDUCTORS FOR USE IN ELECTRONIC AND TELECOMMUNICATION EQUIPMENT - MEASURING METHODS AND TEST PROCEDURES
    I.S. EN 60358-1:2012 COUPLING CAPACITORS AND CAPACITOR DIVIDERS - PART 1: GENERAL RULES (IEC 60358-1:2012 (EQV))
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    I.S. EN 153000:1998 DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION)
    CEI EN 60068-3-4 : 2002 ENVIRONMENTAL TESTING - PART 3-4: SUPPORTING DOCUMENTATION AND GUIDANCE DAMP HEAT TESTS
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    CEI EN 61300-2-23 : 2012 FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-23: TESTS - SEALING FOR NON-PRESSURIZED CLOSURES OF FIBRE OPTIC DEVICES
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    06/30153438 DC : DRAFT JULY 2006 BS IEC 60539-1 ED.2 - DIRECTLY HEATED NEGATIVE TEMPERATURE COEFFICIENT THERMISTORES - PART 1: GENERIC SPECIFICATION
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    BS IEC 60748-11:2000 Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits
    BS EN 120000:1996 Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
    BIS IS/IEC 60862-1 : 2003 SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
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    15/30329267 DC : 0 BS EN 60747-17 - SEMICONDUCTOR DEVICES - PART 17: MAGNETIC AND CAPACITIVE COUPLER FOR BASIC AND REINFORCED ISOLATION
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    BS QC790100(1991) : 1991 AMD 10586 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
    I.S. EN 62604-1:2015 SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
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    NF EN 60044-8 : 2006 INSTRUMENT TRANSFORMERS - PART 8: ELECTRONIC CURRENT TRANSDUCERS
    CSA C60044-2 : 2007 INSTRUMENT TRANSFORMERS - PART 2: INDUCTIVE VOLTAGE TRANSFORMERS
    CSA C60044-8 :2007 INSTRUMENT TRANSFORMERS - PART 8: ELECTRONIC CURRENT TRANSFORMERS
    BS EN 167000:1993 Harmonized system of quality assessment for electronic components. Generic specification: piezoelectric filters
    I.S. EN 61869-1:2009 INSTRUMENT TRANSFORMERS - PART 1: GENERAL REQUIREMENTS
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    CEI EN 60122-1 : 2004 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 138000:1998 FIXED INDUCTORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION (INDUCTORS FOR WHICH SAFETY TESTS ARE REQUIRED) (GENERIC SPECIFICATION)
    PREN 50526-1 : DRAFT 2009 RAILWAY APPLICATIONS - FIXED INSTALLATIONS - D.C. SURGE ARRESTERS AND VOLTAGE LIMITING DEVICES - PART 1: SURGE ARRESTERS
    I.S. EN 133000:1998 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION (GENERIC SPECIFICATION)
    I.S. EN 60384-14:2016 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 14: SECTIONAL SPECIFICATION - FIXED CAPACITORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION AND CONNECTION TO THE SUPPLY MAINS
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    I.S. EN 60099-4:2014 SURGE ARRESTERS - PART 4: METAL-OXIDE SURGE ARRESTERS WITHOUT GAPS FOR A.C. SYSTEMS
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    CEI EN 60747-5-2 : 2002 DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS
    I.S. EN 60393-1:2009 POTENTIOMETERS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    IEC 60748-11:1990 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
    IEC PAS 60747-17:2011 Semiconductor devices - Discrete devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation
    IEC 60393-1:2008 Potentiometers for use in electronic equipment - Part 1: Generic specification
    I.S. EN 60938-1:1999 FIXED INDUCTORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    IEC 60512-7:1993 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests
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    IEC 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    IEC 60044-8:2002 Instrument transformers - Part 8: Electronic current transformers
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    05/30137416 DC : 0
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    03/101948 DC : DRAFT FEB 2003 IEC 60939-2 ED.2.0 - PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 2: SECTIONAL SPECIFICATION - TEST METHODS AND GENERAL REQUIREMENTS
    03/103740 DC : DRAFT FEB 2003 IEC 61337-1 ED.1 - FILTERS USING WAVEGUIDE TYPE DIELECTRIC RESONATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
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    06/30149145 DC : DRAFT OCT 2006 IEC 60384-1 - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
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    PD 6521:1988 Summaries of test methods for environmental testing of electrotechnical products
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    I.S. EN 196110:2002 SECTIONAL SPECIFICATION: ROTARY SWITCHES - CAPABILITY APPROVAL
    I.S. EN 165000-1:1998 FILM AND HYBRID INTEGRATED CIRCUITS - PART 1: GENERIC SPECIFICATION CAPABILITY APPROVAL PROCEDURE
    I.S. EN 50526-1:2012 RAILWAY APPLICATIONS - FIXED INSTALLATIONS - D.C. SURGE ARRESTERS AND VOLTAGE LIMITING DEVICES - PART 1: SURGE ARRESTERS
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    I.S. EN 60747-5-5:2011 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS
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    I.S. CECC 33000:1994 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION (GENERIC SPECIFICATION)
    CSA C61869-1 : 2014 INSTRUMENT TRANSFORMERS - PART 1: GENERAL REQUIREMENTS
    IEC 60261:1989 Sealing test for pressurized waveguide tubing and assemblies
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    I.S. EN 1300:2013 SECURE STORAGE UNITS - CLASSIFICATION FOR HIGH SECURITY LOCKS ACCORDING TO THEIR RESISTANCE TO UNAUTHORIZED OPENING
    IEC 61007:1994 Transformers and inductors for use in electronic and telecommunication equipment - Measuring methods and test procedures
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    IEC 60938-1:1999+AMD1:2006 CSV Fixed inductors for electromagnetic interference suppression - Part 1: Generic specification
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    IEC 60747-5-5:2007+AMD1:2013 CSV Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
    IEC 60384-1:2016 Fixed capacitors for use in electronic equipment - Part 1: Generic specification
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    IEC 60384-14:2013+AMD1:2016 CSV Fixed capacitors for use in electronic equipment - Part 14: Sectional specification - Fixed capacitors for electromagnetic interference suppression and connection to the supply mains
    ISO/TS 14907-1:2015 Electronic fee collection Test procedures for user and fixed equipment Part 1: Description of test procedures
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    IEC 60939-2:2005 Passive filter units for electromagnetic interference suppression - Part 2: Sectional specification - Passive filter units for which safety tests are appropriate - Test methods and general requirements
    IEC 61248-1:1996 Transformers and inductors for use in electronic and telecommunication equipment - Part 1: Generic specification
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    IEC 60068-3-4:2001 Environmental testing - Part 3-4: Supporting documentation and guidance - Damp heat tests
    IEC 62146-1:2013+AMD1:2016 CSV Grading capacitors for high-voltage alternating current circuit-breakers - Part 1: General
    IEC 61811-54:2002 Electromechanical all-or-nothing relays - Part 54: Blank detail specification - Electromechanical all-or-nothing telecom relays of assessed quality - Two change-over contacts, 15 mm x 7,5 mm base
    IEC 61300-2-23:2010 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-23: Tests - Sealing for non-pressurized closures of fibre optic devices
    UNE-EN 61300-2-23:2011 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures -- Part 2-23: Tests - Sealing for non-pressurized closures of fibre optic devices
    UNE-EN 45502-2-3:2010 Active implantable medical devices -- Part 2-3: Particular requirements for cochlear and auditory brainstem implant systems
    BS EN 62435-5:2017 Electronic components. Long-term storage of electronic semiconductor devices Die and wafer devices
    IEC 60747-5-2:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
    EN 61811-1:2015 Electromechanical telecom elementary relays of assessed quality - Part 1: Generic specification and blank detail specification
    EN 61811-52:2002 Electromechanical all-or-nothing relays - Part 52: Blank detail specification - Electromechanical all-or-nothing telecom relays of assessed quality - Two change-over contacts, 20 mm x 10 mm base
    EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    EN 61462:2007 Composite hollow insulators - Pressurized and unpressurized insulators for use in electrical equipment with rated voltage greater than 1 000 V - Definitions, test methods, acceptance criteria and design recommendations
    ENV 12646 : 1997 BAR CODING - TEST SPECIFICATIONS FOR BAR CODE SCANNERS AND DECODERS
    EN 282 : 1991 AVALANCHE BEACONS - TRANSMITTER/RECEIVER SYSTEMS - SAFETY REQUIREMENTS AND TESTING
    EN 180000 : 1995 GENERIC SPECIFICATION: FIBRE OPTIC ATTENUATORS
    EN 45502-2-3:2010 Active implantable medical devices - Part 2-3: Particular requirements for cochlear and auditory brainstem implant systems
    ENV 12648 : 1997 BAR CODING - TEST SPECIFICATIONS FOR BAR CODE PRINTERS
    EN 2349-412:2007 Aerospace series - Requirements and test procedures for relays and contactors - Part 412: Seal
    I.S. EN 60068-3-4:2002 ENVIRONMENTAL TESTING - PART 3-4: SUPPORTING DOCUMENTATION AND GUIDANCE - DAMP HEAT TESTS
    BS EN 62435-1:2017 Electronic components. Long-term storage of electronic semiconductor devices General
    UNE-EN 50526-1:2012 Railway applications - Fixed installations - D.C. surge arresters and voltage limiting devices - Part 1: Surge arresters
    DD IEC/PAS 62435:2005 Electronic components. Long duration storage of electronic components. Guidance for implementation
    BS EN 61811-1:2015 Electromechanical telecom elementary relays of assessed quality Generic specification and blank detail specification
    BS EN 61869-1:2009 Instrument transformers General requirements
    BS CECC 16000-1:1992 Harmonized system of quality assessment for electronic components. Generic specification: electromechanical all-or-nothing relays General
    DD IEC/PAS 60747-17:2011 Semiconductor devices. Discrete devices Magnetic and capacitive coupler for basic and reinforced isolation
    11/30243576 DC : DRAFT FEB 2011 BS EN 62643-1 - ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    NF EN 1300 : 2014 SECURE STORAGE UNITS - CLASSIFICATION FOR HIGH SECURITY LOCKS ACCORDING TO THEIR RESISTANCE TO UNAUTHORIZED OPENING
    16/30353588 DC : 0 BS EN 61020-1 ED 3.0 - ELECTROMECHANICAL SWITCHES FOR USE IN ELECTRICAL AND ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    NF EN 62146-1 : 2014 AMD 1 2016 GRADING CAPACITORS FOR HIGH-VOLTAGE ALTERNATING CURRENT CIRCUIT-BREAKERS - PART 1: GENERAL
    BS EN 60393-1:2009 Potentiometers for use in electronic equipment Generic specification
    CEI EN 138000 : 1996 GENERIC SPECIFICATION: FIXED INDUCTORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION (INDUCTORS FOR WHICH SAFETY TESTS ARE REQUIRED)
    CEI EN 60384-14 : 2014 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 14: SECTIONAL SPECIFICATION - FIXED CAPACITORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION AND CONNECTION TO THE SUPPLY MAINS
    BS EN 61020-1:2009 Electromechanical switches for use in electrical and electronic equipment Generic specification
    13/30264596 DC : 0 BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER
    BS 2011-2.2N:1977 Environmental testing. Guidance Test N. Guidance on change of temperature tests
    BS EN 62246-1:2015 Reed switches Generic specification
    03/108067 DC : 0 IEC 60044-2 ED. 2.0 - INSTRUMENT TRANSFORMERS - PART 2: INDUCTIVE VOLTAGE TRANSFORMERS
    BS CECC 22000:1980 Harmonized system of quality assessment for electronic components: generic specification: radio frequency coaxial connectors
    DD CLC/TS 50466:2006 Long duration storage of electronic components. Specification for implementation
    BS QC 750000(1986) : 1986 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION
    10/30240248 DC : 0 BS EN 60862-1 - SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    NF EN 61881-3 : 2013 AMD 1 2014 RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITORS FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITORS
    04/30112476 DC : DRAFT APR 2004
    XP PREN 2349 : 1995 XP AEROSPACE SERIES - REQUIREMENTS AND TEST PROCEDURES FOR SWITCHING DEVICES
    CEI EN 60539-1 : 2009 DIRECTLY HEATED NEGATIVE TEMPERATURE COEFFICIENT THERMISTORS - PART 1: GENERIC SPECIFICATION
    NF EN 60939-2 : 2005 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 2: SECTIONAL SPECIFICATION: PASSIVE FILTER UNITS FOR WHICH SAFETY TESTS ARE APPROPRIATE - TEST METHODS AND GENERAL REQUIREMENTS
    PREN 2349-412 : 200P1 AEROSPACE SERIES - REQUIREMENTS AND TEST PROCEDURES FOR RELAYS AND CONTACTORS - PART 412: SEAL
    I.S. EN 61300-2-23:2011 FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-23: TESTS - SEALING FOR NON-PRESSURIZED CLOSURES OF FIBRE OPTIC DEVICES
    OIML R 144-1 : 2013 INSTRUMENTS FOR CONTINUOUS MEASUREMENT OF CO, NO[X] IN STATIONARY SOURCE EMISSIONS - PART 1: METROLOGICAL AND TECHNICAL REQUIREMENTS
    CEI EN 61869-1 : 2010 INSTRUMENT TRANSFORMERS - PART 1: GENERAL REQUIREMENTS
    I.S. EN 60939-3:2015 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 3: PASSIVE FILTER UNITS FOR WHICH SAFETY TESTS ARE APPROPRIATE
    I.S. EN 61811-54:2002 ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 54: BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING TELECOM RELAYS OF ASSESSED QUALITY - TWO CHANGE-OVER CONTACTS, 15 MM X 7,5 MM BASE
    I.S. EN 61811-53:2002 ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 53: BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING TELECOM RELAYS OF ASSESSED QUALITY - TWO CHANGE-OVER CONTACTS, 14 MM X 9 MM BASE
    I.S. EN 61881-2:2012 RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITORS FOR POWER ELECTRONICS - PART 2: ALUMINIUM ELECTROLYTIC CAPACITORS WITH NON SOLID ELECTROLYTE (IEC 61881-2:2012 (EQV))
    I.S. EN 60099-9:2014 SURGE ARRESTERS - PART 9: METAL-OXIDE SURGE ARRESTERS WITHOUT GAPS FOR HVDC CONVERTER STATIONS
    CEI EN 60099-9 : 2015 SURGE ARRESTERS - PART 9: METAL-OXIDE SURGE ARRESTERS WITHOUT GAPS FOR HVDC CONVERTER STATIONS
    I.S. EN 60122-1:2002 AMD 1 2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 60862-1:2015 SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 45502-2-3:2010 ACTIVE IMPLANTABLE MEDICAL DEVICES - PART 2-3: PARTICULAR REQUIREMENTS FOR COCHLEAR AND AUDITORY BRAINSTEM IMPLANT SYSTEMS
    I.S. EN 181000:1994 FIBRE OPTIC BRANCHING DEVICES (GENERIC SPECIFICATION)
    BS EN 60099-4:2014 Surge arresters Metal-oxide surge arresters without gaps for a.c. systems
    IEEE C37.09-1999 IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis
    I.S. EN 61811-1:2015 ELECTROMECHANICAL TELECOM ELEMENTARY RELAYS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION AND BLANK DETAIL SPECIFICATION
    GOST R IEC 60384-14 : 2004 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 14 - SECTIONAL SPECIFICATION ON FIXED CAPACITORS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION AND CONNECTION TO THE SUPPLY MAINS
    CEI EN 60137 : 2009 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
    CEI EN 60939-1 : 2011 PASSIVE FILTER UNITS FOR ELECTROMAGNETIC INTERFERENCE SUPPRESSION - PART 1: GENERIC SPECIFICATION
    I.S. EN 60068-2-14:2009 ENVIRONMENTAL TESTING - PART 2-14: TESTS - TEST N: CHANGE OF TEMPERATURE
    NF EN 60747-5-5 : 2012 AMD 1 2015 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS
    I.S. EN 61811-52:2002 ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 52: BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING TELECOM RELAYS OF ASSESSED QUALITY - TWO CHANGE-OVER CONTACTS, 20 MM X 10 MM BASE
    I.S. EN 61811-55:2002 ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 55: BLANK DETAIL SPECIFICATION - ELECTROMECHANICAL ALL-OR-NOTHING TELECOM RELAYS OF ASSESSED QUALITY - TWO CHANGE-OVER CONTACTS, 11 MM X 7,5 MM (MAX.) BASE
    IEC 60748-23-1:2002 Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification
    IEC 60300-3-5:2001 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles
    IEC 61869-1:2007 Instrument transformers - Part 1: General requirements
    IEC 61019-1-2:1993 Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions
    I.S. CECC 86000:1993 CONNECTOR SETS FOR OPTICAL FIBRES AND CABLES - PART 1: REQUIREMENTS, TEST METHODS AND QUALIFICATION APPROVAL PROCEDURES (GENERIC SPECIFICATION)
    I.S. EN 116000-3:1998 GENERIC SPECIFICATION: ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 3: TEST AND MEASUREMENT PROCEDURES
    IEC 60384-1 REDLINE : 5ED 2016 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - PART 1: GENERIC SPECIFICATION
    IEC 60137 REDLINE : 7ED 2017 INSULATED BUSHINGS FOR ALTERNATING VOLTAGES ABOVE 1000 V
    EN 60747-5-5:2011/A1:2015 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS (IEC 60747-5-5:2007/A1:2013)
    IEC 61810-7:2006 Electromechanical elementary relays - Part 7: Test and measurement procedures
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    IEC 60749-8:2002 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
    EN 61300-2-23:2011 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-23: Tests - Sealing for non-pressurized closures of fibre optic devices
    EN 61811-55:2002 Electromechanical all-or-nothing relays - Part 55: Blank detail specification - Electromechanical all-or-nothing telecom relays of assessed quality - Two change-over contacts, 11 mm x 7,5 mm (max.) base
    EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    EN 61811-53:2002 Electromechanical all-or-nothing relays - Part 53: Blank detail specification - Electromechanical all-or-nothing telecom relays of assessed quality - Two change-over contacts, 14 mm x 9 mm base
    EN 62146-1:2014/A1:2016 GRADING CAPACITORS FOR HIGH-VOLTAGE ALTERNATING CURRENT CIRCUIT-BREAKERS - PART 1: GENERAL (IEC 62146-1:2013/A1:2016)
    EN 61869-1:2009 Instrument transformers - Part 1: General requirements
    EN 119000 : 1996 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: DRY AND MERCURY WETTED REED CONTACT UNITS
    EN 61248-1 : 1997 Transformers and inductors for use in electronic and telecommunication equipment - Part 1: Generic specification
    EN 60122-1:2002/A1:2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017)
    EN 60368-1:2000/A1:2004 PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    EN 62246-1-1:2013 Reed switches - Part 1-1: Generic specification - Quality assessment
    EN 60099-9:2014 Surge arresters - Part 9: Metal-oxide surge arresters without gaps for HVDC converter stations
    EN 60939-2:2005 Passive filter units for electromagnetic interference suppression - Part 2: Sectional specification: Passive filter units for which safety tests are appropriate - Test methods and general requirements
    EN 61810-7:2006 Electromechanical elementary relays - Part 7: Test and measurement procedures
    EN 62575-1:2016 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
    EN 165000-1:1996 Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure
    EN 116000-3 : 1996 GENERIC SPECIFICATION: ELECTROMECHANICAL ALL-OR-NOTHING RELAYS - PART 3: TEST AND MEASUREMENT PROCEDURES
    EN 50526-1:2012 Railway applications - Fixed installations - D.C. surge arresters and voltage limiting devices - Part 1: Surge arresters
    EN 137000:1995 Generic Specification: Fixed aluminium electrolytic a.c. capacitors with non-solid electrolyte for use with motors
    EN 60044-8:2002 Instrument transformers - Part 8: Electronic current transformers
    EN 61881-3:2012/A1:2013 RAILWAY APPLICATIONS - ROLLING STOCK EQUIPMENT - CAPACITORS FOR POWER ELECTRONICS - PART 3: ELECTRIC DOUBLE-LAYER CAPACITORS (IEC 61881-3:2012/A1:2013)
    EN 62435-2:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
    CEN ISO/TS 14907-1:2015 Electronic fee collection - Test procedures for user and fixed equipment - Part 1: Description of test procedures (ISO/TS 14907-1:2015)
    EN 60393-1:2009 Potentiometers for use in electronic equipment - Part 1: Generic specification
    EN 61020-1:2009 Electromechanical switches for use in electrical and electronic equipment - Part 1: Generic specification
    EN 60749 : 99 AMD 2 2001 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    BS CECC 30000:1992 Harmonized system of quality assessment for electronic components. Generic specification: fixed capacitors
    BS CECC 30000:1984 Harmonized system of quality assessment for electronic components: generic specification: fixed capacitors
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