14/30296894 DC : 0
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BS EN 62830-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR DEVICES FOR ENERGY HARVESTING AND GENERATION - PART 1: VIBRATION BASED PIEZOELECTRIC ENERGY HARVESTING |
17/30355772 DC : 0
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BS EN 62047-33 ED.1.0 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 33: MEMS PIEZORESISTIVE PRESSURE-SENSITIVE DEVICE |
BS EN 62149-2:2014
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Fibre optic active components and devices. Performance standards 850 nm discrete vertical cavity surface emitting laser devices |
13/30277888 DC : 0
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BS EN 62149-2 ED 2.0 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 2: 850 NM DISCRETE VERTICAL CAVITY SURFACE EMITTING LASER DEVICES |
CEI EN 60747-15 : 2012
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
I.S. EN 60749-37:2008
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER |
EN 60747-15:2012
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Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |
EN 62149-8:2014
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Fibre optic active components and devices - Performance standards - Part 8: Seeded reflective semiconductor optical amplifier devices |
BS EN 62149-8:2014
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Fibre optic active components and devices. Performance standards Seeded reflective semiconductor optical amplifier devices |
IEC 62830-3:2017
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Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting |
17/30336994 DC : 0
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BS IEC 62969-3 ED.1.0 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 3: SHOCK DRIVEN PIEZOELECTRIC ENERGY HARVESTING FOR AUTOMOTIVE VEHICLE SENSORS |
14/30301992 DC : 0
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BS EN 62830-3 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR DEVICES FOR ENERGY HARVESTING AND GENERATION - PART 3: VIBRATION BASED ELECTROMAGNETIC ENERGY HARVESTING |
BS IEC 62830-3 : 2017
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SEMICONDUCTOR DEVICES - SEMICONDUCTOR DEVICES FOR ENERGY HARVESTING AND GENERATION - PART 3: VIBRATION BASED ELECTROMAGNETIC ENERGY HARVESTING |
I.S. EN 60747-15:2012
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SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES (IEC 60747-15:2010 (EQV)) |
I.S. EN 62572-3:2016
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FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS - PART 3: LASER MODULES USED FOR TELECOMMUNICATION |
IEC TS 62686-1:2015
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Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors |
IEC 62830-1:2017
|
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting |
IEC 62047-5:2011
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Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches |
09/30190356 DC : 0
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BS EN 60749-40 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 40: BOARD LEVEL DROP TEST METHOD USING A STRAIN GAUGE |
EN IEC 62969-1:2018
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Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
07/30162213 DC : 0
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BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
13/30264591 DC : 0
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BS EN 60747-14-6 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-6: SEMICONDUCTOR SENSORS - HUMIDITY SENSOR |
BS IEC 60747-14-4:2011
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Semiconductor devices. Discrete devices Semiconductor accelerometers |
NF EN 60749-37 : 2008
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER |
15/30323391 DC : 0
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BS EN 62572-3 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS PART 3: LASER MODULES USED FOR TELECOMMUNICATION |
13/30277892 DC : 0
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BS EN 62572-3 ED 2.0 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS - PART 3: LASER MODULES USED FOR TELECOMMUNICATION |
05/30135664 DC : DRAFT JUN 2005
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IEC 60749-37 ED. 1 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD FOR HANDHELD ELECTRONIC PRODUCTS |
BS EN 60747-15:2012
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Semiconductor devices. Discrete devices Isolated power semiconductor devices |
CEI EN 60749-37 : 2008
|
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER |
IEC 60747-14-4:2011
|
Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers |
IEC 62969-1:2017
|
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
13/30277845 DC : 0
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BS EN 62149-8 ED 1.0 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARD - PART 8: SEEDED REFLECTIVE SEMICONDUCTOR OPTICAL AMPLIFIER DEVICES |
BS EN 62047-5:2011
|
Semiconductor devices. Micro-electromechanical devices RF MEMS switches |
BS EN 62572-3:2016
|
Fibre optic active components and devices. Reliability standards Laser modules used for telecommunication |
I.S. EN 62047-5:2011
|
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 5: RF MEMS SWITCHES |
IEC 62572-3:2016
|
Fibre optic active components and devices - Reliability standards - Part 3: Laser modules used for telecommunication |
IEC 62149-2:2014
|
Fibre optic active components and devices - Performance standards - Part 2: 850 nm discrete vertical cavity surface emitting laser devices |
IEC 60749-37:2008
|
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer |
PD IEC/TS 62686-1:2015
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Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications General requirements for high reliability integrated circuits and discrete semiconductors |
13/30264596 DC : 0
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BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER |
I.S. EN 62149-2:2014
|
FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 2: 850 NM DISCRETE VERTICAL CAVITY SURFACE EMITTING LASER DEVICES |
BS EN 60749-37:2008
|
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer |
13/30264600 DC : 0
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BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID |
16/30336986 DC : 0
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BS EN 62969-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS |
I.S. EN 62149-8:2014
|
FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 8: SEEDED REFLECTIVE SEMICONDUCTOR OPTICAL AMPLIFIER DEVICES |
IEC 60747-5-6:2016
|
Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes |
IEC 62149-8:2014
|
Fibre optic active components and devices - Performance standards - Part 8: Seeded reflective semiconductor optical amplifier devices |
IEC 60747-15:2010
|
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices |
EN 60749-37:2008
|
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer |
EN 62572-3:2016
|
Fibre optic active components and devices - Reliability standards - Part 3: Laser modules used for telecommunication |
EN 62047-5:2011
|
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches |
EN 62149-2:2014
|
Fibre optic active components and devices - Performance standards - Part 2: 850 nm discrete vertical cavity surface emitting laser devices |
OVE/ONORM EN 60749-37 : 2008
|
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER |