• IEC 61788-16:2013

    Current The latest, up-to-date edition.

    Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  16-01-2013

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Requirements
    5 Apparatus
    6 Measurement procedure
    7 Uncertainty of the test method
    8 Test report
    Annex A (informative) - Additional information
            relating to Clauses 1 to 7
    Annex B (informative) - Uncertainty considerations
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC 61788-16:2013 involves describing the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method. The measuring item is the power dependence of Rs at the resonant frequency. This method is the applicable for a frequency in the range of 10 GHz, for an input microwave power lower than 37 dBm (5 W). The aim is to report the surface resistance data at the measured frequency and that scaled to 10 GHz. Keyword: superconductivity

    General Product Information - (Show below) - (Hide below)

    Committee TC 90
    Development Note Stability date: 2020. (01/2013)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61788-15:2011 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
    IEC 61788-7:2006 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
    ISO/IEC Guide 99:2007 International vocabulary of metrology Basic and general concepts and associated terms (VIM)
    ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)
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