• IEC 62258-5:2006

    Current The latest, up-to-date edition.

    Semiconductor die products - Part 5: Requirements for information concerning electrical simulation

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English, English - French

    Published date:  29-08-2006

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 General
    5 Requirements for information on electrical simulation
      models
      5.1 Information on the electrical simulation model
      5.2 Information on device connectivity
      5.3 Information on the timing simulation model
      5.4 Information on connection redistribution
      5.5 Information on package terminals
    Annex A (informative) Supporting information
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC 62258-5:2006 has been developed to facilitate the production, supply and use of semiconductor die products, including:
    - wafers;
    - singulated bare die;
    - die and wafers with attached connection structures;
    - minimally or partially encapsulated die and wafers.
    This part of IEC 62258 specifies the information required to facilitate the use of electrical data and models for simulation of the electrical behaviour and verification of the correct functionality of electronic systems that include bare semiconductor die, with or without connection structures, and/or minimally packaged semiconductor die. It is intended to assist all those involved in the supply chain for die devices to comply with the requirements of IEC 62258-1 and IEC 62258-2.

    This publication is to be read in conjunction with IEC 62258-1:2009 and IEC 62258-2:2011.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47
    Development Note To be read in conjunction with IEC 62258-1 and IEC 62258-2. (08/2006) A Bilingual edition has been published. (07/2012) Stability Date: 2020. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    CEI CLC/TR 62258-7 : 2009 SEMICONDUCTOR DIE PRODUCTS - PART 7: XML SCHEMA FOR DATA EXCHANGE
    IEC TR 62258-7:2007 Semiconductor die products - Part 7: XML schema for data exchange
    CLC/TR 62258-7:2007 Semiconductor die products - Part 7: XML schema for data exchange
    I.S. EN 62258-1:2010 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
    EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
    S.R. TR 62258-7:2007 SEMICONDUCTOR DIE PRODUCTS - PART 7: XML SCHEMA FOR DATA EXCHANGE
    CEI CLC/TR 62258-8 : 2009 SEMICONDUCTOR DIE PRODUCTS - PART 8: EXPRESS MODEL SCHEMA FOR DATA EXCHANGE
    PD IEC/TR 62258-7:2007 Semiconductor die products XML schema for data exchange
    IEC TR 62258-8:2008 Semiconductor die products - Part 8: EXPRESS model schema for data exchange
    PD IEC/TR 62258-8:2008 Semiconductor die products EXPRESS model schema for data exchange
    BS EN 62258-1:2010 Semiconductor die products Procurement and use
    CLC/TR 62258-8:2008 Semiconductor die products - Part 8: EXPRESS model schema for data exchange
    S.R. CLC/TR 62258-8:2008 SEMICONDUCTOR DIE PRODUCTS - PART 8: EXPRESS MODEL SCHEMA FOR DATA EXCHANGE
    IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
    CEI EN 62258-1 : 2011 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61691-1-1:2011 Behavioural languages - Part 1-1: VHDL Language Reference Manual
    IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
    IEC 62014-1:2001 Electronic design automation libraries - Part 1: Input/output buffer information specifications (IBIS version 3.2)
    IEEE 1364-2005 IEEE Standard for Verilog Hardware Description Language
    IEEE 1076-2008 REDLINE IEEE Standard VHDL Language Reference Manual
    IEC 62258-2:2011 Semiconductor die products - Part 2: Exchange data formats
    IEC 61691-2:2001 Behavioural languages - Part 2: VHDL multilogic system for model interoperability
    IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture
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