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Semiconductor devices - Constant current electromigration test
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Available format(s): Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users
Language(s): English - French
Published date: 19-05-2010
Publisher: International Electrotechnical Committee
FOREWORD1 Scope2 Symbols, terms and definitions3 Background4 Sample size5 Test structures6 Test conditions7 Failure criteria8 Data analysisBibliography
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
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