• IEC 62416:2010

    Current The latest, up-to-date edition.

    Semiconductor devices - Hot carrier test on MOS transistors

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  26-04-2010

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Abbreviations and letter symbols
    3 Test structures
    4 Stress time
    5 Stress conditions
    6 Sample size
    7 Temperature
    8 Failure criteria
    9 Lifetime estimation method
    10 Lifetime requirements
    11 Reporting
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47
    Development Note Stability Date: 2020. (12/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEC TS 62686-1:2015 Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
    PD IEC/TS 62686-1:2015 Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications General requirements for high reliability integrated circuits and discrete semiconductors
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