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Semiconductor devices - Hot carrier test on MOS transistors
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Available format(s): Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users
Language(s): English - French
Published date: 26-04-2010
Publisher: International Electrotechnical Committee
FOREWORD1 Scope2 Abbreviations and letter symbols3 Test structures4 Stress time5 Stress conditions6 Sample size7 Temperature8 Failure criteria9 Lifetime estimation method10 Lifetime requirements11 ReportingBibliography
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
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