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Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
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Available format(s): Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users
Language(s): English
Published date: 27-05-2020
Publisher: International Electrotechnical Committee
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
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