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  • IEC TR 62878-2-2:2015

    Current The latest, up-to-date edition.

    Device embedded substrate - Part 2-2: Guidelines - Electrical testing

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  04-12-2015

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Electrical tests
    3 Electrical test procedure for
      device embedded substrate
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

    General Product Information - (Show below) - (Hide below)

    Development Note Stability date: 2020. (12/2015)
    Document Type Technical Report
    Publisher International Electrotechnical Committee
    Status Current
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