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  • IEC TS 62668-2:2016

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Process management for avionics - Counterfeit prevention - Part 2: Managing electronic components from non-franchised sources

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  31-12-2021

    Language(s):  English

    Published date:  09-08-2016

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions and abbreviated terms
    4 Technical requirements
    Annex A (informative) - Flowchart of IEC TS 62668-1
            requirements
    Annex B (informative) - Example of detailed tests
            list, linked with procurement risks levels
    Annex C (informative) - iNEMI assessment methodology
            and metric development
    Annex D (informative) - Summary of SAE AS6171
            proposed test methods under consideration by
            SAE International
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC TS 62668-2:2016(E) defines requirements for avoiding the use of counterfeit, recycled and fraudulent components when these components are not purchased from the original component manufacturer (OCM) or are purchased from outside of franchised distributor networks for use in the aerospace, defence and high performance (ADHP) industries. This practice is used, as derogation, only when there are no reasonable or practical alternatives. Although developed for the ADHP industry, this document may be used by other high-performance and high-reliability industries, at their discretion.

    General Product Information - (Show below) - (Hide below)

    Development Note To be read in conjunction with IEC TS 62239-1 and IEC TS 62688-1. (07/2014) Stability Date: 2019. (08/2016)
    Document Type Technical Specification
    Publisher International Electrotechnical Committee
    Status Superseded
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    PD IEC/TS 62668-1:2016 Process management for avionics. Counterfeit prevention Avoiding the use of counterfeit, fraudulent and recycled electronic components
    EN 62435-1:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
    IEC 62435-4:2018 Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage
    SAE ARP 6328 : 2016 GUIDELINE FOR DEVELOPMENT OF COUNTERFEIT ELECTRONIC PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION SYSTEMS
    IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
    I.S. EN 62435-1:2017 ELECTRONIC COMPONENTS - LONG-TERM STORAGE OF ELECTRONIC SEMICONDUCTOR DEVICES - PART 1: GENERAL
    BS EN 62435-1:2017 Electronic components. Long-term storage of electronic semiconductor devices General
    PD IEC/TS 62239-1:2015 Process management for avionics. Management plan Preparation and maintenance of an electronic components management plan
    IEC TS 62668-1:2016 Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components

    Standards Referencing This Book - (Show below) - (Hide below)

    EN 9100:2009 Quality Management Systems - Requirements for Aviation, Space and Defense Organizations
    SAE AS 5553B : 2016 COUNTERFEIT ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION
    ISO 16678:2014 Guidelines for interoperable object identification and related authentication systems to deter counterfeiting and illicit trade
    SAE AS 6174 : 2014 COUNTERFEIT MATERIEL - ASSURING ACQUISITION OF AUTHENTIC AND CONFORMING MATERIEL
    SAE AS 6171/1 : 2016 SUSPECT/COUNTERFEIT TEST EVALUATION METHOD
    SAE AS 6171 : 2016 TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    SAE AS 6171/6 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ACOUSTIC MICROSCOPY (AM) TEST METHODS
    IEC PAS 62435:2005 Electronic components - Long-duration storage of electronic components - Guidance for implementation
    MIL-PRF-55681 Revision G:2016 CAPACITOR, CHIP, MULTIPLE LAYER, FIXED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    SAE AS 6171/11 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS
    SAE AS 6171/7 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ELECTRICAL TEST METHODS
    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    ISO 31000:2009 Risk management Principles and guidelines
    IEC TS 62668-1:2016 Process management for avionics - Counterfeit prevention - Part 1: Avoiding the use of counterfeit, fraudulent and recycled electronic components
    SEMI T20.2 : 2009(R2016) GUIDE FOR QUALIFICATIONS OF AUTHENTICATION SERVICE BODIES FOR DETECTING AND PREVENTING COUNTERFEITING OF SEMICONDUCTORS AND RELATED PRODUCTS
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    MIL-STD-202-107 Base Document:2015 METHOD 107, THERMAL SHOCK
    MIL-STD-202-106 Base Document:2015 METHOD 106, MOISTURE RESISTANCE
    MIL-PRF-39014 Revision J:2016 Capacitor, Fixed, Ceramic Dielectric (General Purpose), Established Reliability and Non-Established Reliability, General Specification for
    IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
    SAE AS 6171/8 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RAMAN SPECTROSCOPY TEST METHODS
    SAE AS 6171/3 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY X-RAY FLUORESCENCE TEST METHODS
    IPC J STD 002 : D SOLDERABILITY TESTS FOR COMPONENT LEADS, TERMINATIONS, LUGS, TERMINALS AND WIRES
    SAE AS 6171/4 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS
    SEMI T20.1 : 2009(R2016) SPECIFICATION FOR OBJECT LABELING TO AUTHENTICATE SEMICONDUCTORS AND RELATED PRODUCTS IN AN OPEN MARKET
    GEIA STD 0016 : 2012 PREPARING A DMSMS MANAGEMENT PLAN
    ISO 14001:2015 Environmental management systems — Requirements with guidance for use
    IEC TS 62686-1:2015 Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
    SAE ARP 6178 : 2011 FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS - TOOL FOR RISK ASSESSMENT OF DISTRIBUTORS
    SAE AS 6171/9 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY FOURIER TRANSFORM INFRARED SPECTROSCOPY (FTIR) TEST METHODS
    MIL-PRF-39003 Revision N:2016 Capacitor, Fixed, Electrolytic (Solid Electrolyte), Tantalum, Established Reliability, General Specification for
    ISO 9001:2015 Quality management systems — Requirements
    MIL-STD-202-108 Base Document:2015 METHOD 108, LIFE (AT ELEVATED AMBIENT TEMPERATURE)
    SAE AS 6171/5 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS
    MIL-STD-1580 Revision B:2003 DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60115-8:2009 Fixed resistors for use in electronic equipment - Part 8: Sectional specification - Fixed surface mount resistors
    IPC J STD 003 : C SOLDERABILITY TESTS FOR PRINTED BOARDS
    SEMI T20 : 2010(R2016) SPECIFICATION FOR AUTHENTICATION OF SEMICONDUCTORS AND RELATED PRODUCTS
    EN 9120:2010 Quality Management Systems - Requirements for Aviation, Space and Defence Distributors
    SAE AS 6171/10 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY THERMOGRAVIMETRIC ANALYSIS (TGA) TEST METHODS
    ISO Guide 73:2009 Risk management — Vocabulary
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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