• IPC J STD 012 : 0

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    IMPLEMENTATION OF FLIP CHIP AND CHIP SCALE TECHNOLOGY

    Available format(s):  Hardcopy

    Superseded date:  01-10-2013

    Language(s):  English

    Published date: 

    Publisher:  Institute of Printed Circuits

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    Table of Contents - (Show below) - (Hide below)

    1 SCOPE
       1.1 Purpose
       1.2 Categorization
    2 TECHNOLOGY OVERVIEW
       2.1 History of Flip Chip
       2.2 Introduction to Chip Scale Packaging
    3 APPLICATIONS OF FLIP CHIP AND CHIP SCALE
    4 DESIGN CONSIDERATIONS
       4.1 Chip Scale Standardization
       4.2 General Considerations for Flip Chips
       4.3 General Considerations for Chip Scale
       4.4 Substrate Structure Standard Grid Evolution
       4.5 Design Output Requirements
       4.6 Electrical Design
       4.7 Thermal Design
    5 MATERIAL PROPERTIES AND PROCESSES
       5.1 Solder Bumping
       5.2 Conductive Adhesives
       5.3 Solder Bump Evaluation
       5.4 Other Bumping Techniques and Materials
       5.5 Chip Materials
       5.6 Other Bumping Process Considerations
       5.7 Handling, Shipping and Storage
    6 MOUNTING AND INTERCONNECTION STRUCTURES
       6.1 Background
       6.2 Mounting Structures General Considerations
       6.3 Interconnection Substrate Material Choices
       6.4 Surface Finish Properties
       6.5 Substrate Constructions
       6.6 Thermal Requirements
    7 ASSEMBLY PROCESSES
       7.1 Substrate Preparation
       7.2 Chip and Chip Scale Placement
       7.3 Attachment Processes
       7.4 Cleaning
       7.5 Attachment Inspection
       7.6 Underfill (Flip Chip Encapsulation)
       7.7 Electrical Test
       7.8 Rework
    8 FLIP CHIP TEST AND BURN-IN METHODOLOGY
       8.1 Known Good Die
       8.2 KGD Techniques for Flip Chip
       8.3 Known-Good Mounting and Interconnection Structure
       8.4 Product Verification
    9 REQUIREMENTS FOR RELIABILITY
       9.1 Robustness of Product to Use
       9.2 Reliability of Factors
       9.3 Reliability Testing
       9.4 Design for Reliability (DfR)
    10 STANDARDIZATION
       10.1 Standards for Development
       10.2 Flip Chip Development and Performance Standards
       10.3 Standard on Mounting of Substrate Design and
            Performance
       10.4 Flip Chip/Substrate Assembly Design and Performance
            Standards
       10.5 Standards for Material Performance
    11 FUTURE NEEDS
       11.1 Critical Factor: Manufacturing Infrastructure
       11.2 Critical Factor: Bump Attachment and Bonding
       11.3 Critical Factor: Testing Scenarios
       11.4 Total Quality Management and Manufacturing (TQMM)
    Figures
    Tables

    Abstract - (Show below) - (Hide below)

    Outlines the implementation of flip chip and related chip scale semiconductor packaging technologies. The areas discussed include: design considerations, assembly processes technology choices, application and reliability data. Chip packaging variations include: flip chip, HDI, Micro BGA, Micro SMT and SLICC. This is intended to provide general information on implementing flip chip and chip scale technologies for creating multichip modules, I/C cards, memory cards and very dense surface mount assemblies.

    General Product Information - (Show below) - (Hide below)

    Development Note Included in IPC C 103 & IPC C 1000. (08/2008)
    Document Type Standard
    Publisher Institute of Printed Circuits
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 62258-1:2010 Semiconductor die products Procurement and use
    I.S. EN 62258-1:2010 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
    EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
    IPC CM 770 : E COMPONENT MOUNTING GUIDELINES FOR PRINTED BOARDS
    IPC AJ 820 : A ASSEMBLY AND JOINING HANDBOOK
    IPC SM 784 : 0 GUIDELINES FOR CHIP-ON-BOARD TECHNOLOGY IMPLEMENTATION
    IPC J STD 013 : 0 IMPLEMENTATION OF BALL GRID ARRAY AND OTHER HIGH DENSITY TECHNOLOGY
    IPC J STD 027 : 0 MECHANICAL OUTLINE STANDARD FOR FLIP CHIP AND CHIP SIZE CONFIGURATIONS
    IPC J STD 026 : 0 SEMICONDUCTOR DESIGN STANDARD FOR FLIP CHIP APPLICATIONS
    IPC J STD 028 : 0 PERFORMANCE STANDARD FOR CONSTRUCTION OF FLIP CHIP AND CHIP SCALE BUMPS
    IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
    CEI EN 62258-1 : 2011 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE

    Standards Referencing This Book - (Show below) - (Hide below)

    IPC SM 784 : 0 GUIDELINES FOR CHIP-ON-BOARD TECHNOLOGY IMPLEMENTATION
    IPC J STD 026 : 0 SEMICONDUCTOR DESIGN STANDARD FOR FLIP CHIP APPLICATIONS
    IEC PAS 62085:1998 Implementation of ball grid array and other high density technology
    IPC J STD 013 : 0 IMPLEMENTATION OF BALL GRID ARRAY AND OTHER HIGH DENSITY TECHNOLOGY
    IPC J STD 028 : 0 PERFORMANCE STANDARD FOR CONSTRUCTION OF FLIP CHIP AND CHIP SCALE BUMPS
    IPC WP 003 : 1993 CHIP MOUNTING TECHNOLOGY (CMT)
    IPC M 103 : LATEST STANDARDS FOR SURFACE MOUNT ASSEMBLIES MANUAL
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