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  • MIL-PRF-55310 Revision E:2006

    Current The latest, up-to-date edition.

    OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR

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    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. APPLICABLE DOCUMENTS
    3. REQUIREMENTS
    4. VERIFICATION
    5. PACKAGING
    6. NOTES
    APPENDIX A - CLASS 2 OSCILLATOR QPL SYSTEM
                 REQUIREMENTS
    APPENDIX B - COMPONENT EVALUATION SYSTEM
    APPENDIX C - PROCEDURE FOR QUALIFICATION
                 INSPECTION
    INDEX

    Abstract - (Show below) - (Hide below)

    Specifies the general requirements for quartz crystal oscillators used in electronic equipment.

    General Product Information - (Show below) - (Hide below)

    Committee FSC 5955
    Development Note Supersedes MIL O 55310 (C). (04/2006)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-PRF-55310-37 Revision C:2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
    DSCC 13018 : A OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 32.768 KHZ TO 160 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
    MIL STD 11991 : A GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES
    BS IEC 61671-2:2016 Standard for automatic test markup language (ATML) instrument description
    MIL-PRF-55310-40 Revision C:2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
    I.S. EN 60679-1:2017 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    IEC 61671-2:2016 Standard for automatic test markup language (ATML) instrument description
    MIL-PRF-55310-33 Revision D:2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
    MIL-PRF-55310-38 Revision C:2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
    MIL-PRF-55310-13 Revision J:2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 300 HZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS
    MIL-PRF-55310-29 Revision C:2011 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.2 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, HCMOS
    MIL-PRF-55310-35 Revision C:2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
    MIL-PRF-55310-32 Revision C:2017 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.544 MHZ THROUGH 125 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
    MIL-PRF-55310-18 Revision F:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 HZ THROUGH 15.0 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS
    MIL-PRF-55310-8 Revision J:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 HZ THROUGH 50 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL
    MIL-PRF-55310-39 Revision C:2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
    MIL-PRF-55310-14 Revision H:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.1 HZ THROUGH 25 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL
    MIL-PRF-55310-21 Revision G:2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
    MIL-PRF-55310-12 Revision H:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.05 MHZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS
    MIL-PRF-55310-25 Revision D:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 25 MHZ THROUGH 175 MHZ, HERMETIC SEAL, SQUARE WAVE, EMITTER COUPLED LOGIC
    IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    NASA MSFC STD 3012 : 2012 ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE
    MIL-PRF-55310-9 Revision J:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 400 KHZ THROUGH 60 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL
    MIL-PRF-55310-28 Revision D:2017 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL
    MIL-PRF-55310-15 Revision G:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 HZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS
    MIL-PRF-55310-20 Revision F:2012 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 40.0 KHZ THROUGH 60.0 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL
    MIL-PRF-55310-10 Revision J:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 KHZ THROUGH 60 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL
    DSCC 05014 : B OSCILLATOR, CRYSTAL CONTROLLED, 5 VOLT, ENABLE/TRI-STATE, 312 KHZ TO 120 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
    MIL-PRF-55310-11 Revision G:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.05 MHZ THROUGH 10 MHZ, HERMETIC SEAL, SQUARE WAVE, CMOS
    MIL-PRF-55310-17 Revision F:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), GATED, 250 KHZ THROUGH 50 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL
    IEEE 1871.1-2014 IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
    MIL-PRF-55310-26 Revision D:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 10 KHZ THROUGH 65 MHZ, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS
    MIL-PRF-55310-27 Revision E:2017 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 85 MHZ, HERMETIC SEAL, SQUARE WAVE, HIGH SPEED CMOS
    MIL-PRF-55310-16 Revision K:2017 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.1 HZ THROUGH 80 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL
    BS EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
    MIL-PRF-55310-30 Revision E:2017 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 450 KHZ THROUGH 100 MHZ, HERMETIC SEAL, LOW VOLTAGE CMOS
    MIL-PRF-55310-31 Revision A:2010 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHZ THROUGH 200 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
    EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    IEEE 1671.2-2012 IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
    DSCC 05013 : B OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 312 KHZ TO 170 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
    MIL-PRF-55310-34 Revision D:2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
    MIL-PRF-55310-19 Revision E:2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHZ THROUGH 60.0 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL
    MIL-PRF-55310-36 Revision C:2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS

    Standards Referencing This Book - (Show below) - (Hide below)

    IPC D 275 : 91 AMD 1 96 DESIGN STANDARD FOR RIGID PRINTED BOARDS AND RIGID PRINTED BOARD ASSEMBLIES
    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    MIL-PRF-3098 Revision L:2017 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
    MIL-STD-810 Revision G:2008 ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS
    MIL-PRF-55110 Revision H:2014 Printed Wiring Board, Rigid, General Specification for
    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    MIL-PRF-38534 Revision J:2015 HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    MIL-PRF-31032 Revision C:2016 Printed Circuit Board/Printed Wiring Board, General Specification for
    MIL-STD-790 Revision G:2011 ESTABLISHED RELIABILITY AND HIGH RELIABILITY QUALIFIED PRODUCTS LIST (QPL) SYSTEMS FOR ELECTRICAL, ELECTRONIC, AND FIBER OPTIC PARTS SPECIFICATIONS
    MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for
    MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
    MIL-STD-1285 Revision D:2004 MARKING OF ELECTRICAL AND ELECTRONIC PARTS
    EIA 557 : 2006 STATISTICAL PROCESS CONTROL SYSTEMS
    ASTM A 698/A698M : 2015 : REDLINE Standard Test Method for Magnetic Shield Efficiency in Attenuating Alternating Magnetic Fields
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