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  • MIL PRF 55365 : 0012

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR

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    Withdrawn date:  03-08-2023

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    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. APPLICABLE DOCUMENTS
    3. REQUIREMENTS
    4. VERIFICATION
    5. PACKAGING
    6. NOTES
    APPENDIX A - PROCEDURES FOR QUALIFICATION INSPECTION

    Abstract - (Show below) - (Hide below)

    Specifies the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability (T level) tantalum dielectric, fixed, chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current (ac) component is small compared to the direct current (dc) rated voltage and where supplemental moisture protection is available.

    General Product Information - (Show below) - (Hide below)

    Committee FSC 5910
    Development Note SUPERSEDES MIL C 55365. (05/2001) Inactive for new design. (06/2003)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Withdrawn
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-STD-1580 Revision B:2003 DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
    DSCC 09009 : 0 CAPACITOR, FIXED, TANTALUM CHIP MODULE, LOW ESR
    MIL-PRF-39003 Revision N:2016 Capacitor, Fixed, Electrolytic (Solid Electrolyte), Tantalum, Established Reliability, General Specification for
    MIL STD 11991 : A GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES
    DSCC 11020 : A CAPACITOR, FIXED, TANTALUM CHIP, WEIBULL GRADED
    DSCC 95158 : F CAPACITOR, FIXED, TANTALUM CHIP, LOW ESR
    DSCC 02006 : B CAPACITORS, FIXED, TANTALUM, CHIP
    NASA MSFC STD 3012 : 2012 ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE
    DSCC 13008 : A CAPACITORS, FIXED, MULTIPLE ANODE TANTALUM, CHIP, CONFORMAL COATED CASE
    DSCC 14002 : B CAPACITOR, FIXED, TANTALUM, CHIP, CONFORMAL COATED CASE
    DSCC 04051 : B CAPACITOR, FIXED, POLYMER TANTALUM CHIP
    MIL-PRF-55365-12 Revision F:2012 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, STYLE CWR15
    DSCC 07016 : C CAPACITOR, FIXED, TANTALUM CHIP, WEIBULL GRADED, LOW ESR
    DSCC 04053 : E CAPACITOR, FIXED, FUSED TANTALUM CHIP, NON-WEIBULL GRADED AND WEIBULL GRADED
    MIL-HDBK-198 Revision B:2012 CAPACITORS, SELECTION AND USE OF
    DSCC 04052 : B CAPACITOR, FIXED, MULTIPLE ANODE POLYMER TANTALUM CHIP
    DSCC 02002 : B CAPACITORS, FIXED, TANTALUM, CHIP

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-PRF-55365-11 Revision D:2014 CAPACITOR, CHIP, FIXED, TANTALUM, POLARIZED, ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY AND HIGH RELIABILITY, STYLES CWR19 AND CWR29
    MIL-STD-202-210 Base Document:2015 METHOD 210, RESISTANCE TO SOLDERING HEAT
    MIL-STD-202-305 Base Document:2015 METHOD 305, CAPACITANCE
    MIL-STD-202-209 Base Document:2015 METHOD 209, RADIOGRAPHIC INSPECTION
    MIL-PRF-55365-8 Revision J:2014 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY AND HIGH RELIABILITY, STYLE CWR11 (METRIC)
    MIL-STD-202-107 Base Document:2015 METHOD 107, THERMAL SHOCK
    MIL-STD-202-106 Base Document:2015 METHOD 106, MOISTURE RESISTANCE
    MIL-PRF-55365-13 Revision B:2012 CAPACITOR, CHIP, FIXED, TANTALUM, POLARIZED, ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, STYLES CWR16 AND CWR26
    IPC J STD 002 : D SOLDERABILITY TESTS FOR COMPONENT LEADS, TERMINATIONS, LUGS, TERMINALS AND WIRES
    MIL-STD-202-215 Base Document:2015 METHOD 215, RESISTANCE TO SOLVENTS
    MIL-STD-790 Revision G:2011 ESTABLISHED RELIABILITY AND HIGH RELIABILITY QUALIFIED PRODUCTS LIST (QPL) SYSTEMS FOR ELECTRICAL, ELECTRONIC, AND FIBER OPTIC PARTS SPECIFICATIONS
    MIL-STD-202-108 Base Document:2015 METHOD 108, LIFE (AT ELEVATED AMBIENT TEMPERATURE)
    MIL-STD-1580 Revision B:2003 DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
    MIL-STD-202-208 Base Document:2015 METHOD 208, SOLDERABILITY
    MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
    MIL-STD-1285 Revision D:2004 MARKING OF ELECTRICAL AND ELECTRONIC PARTS
    MIL-PRF-55365-4 Revision J:2014 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY, NON-ESTABLISHED RELIABILITY, AND HIGH RELIABILITY STYLES CWR06 AND CWR09
    MIL-PRF-55365-12 Revision F:2012 CAPACITORS, CHIP, FIXED, TANTALUM, POLARIZED ESTABLISHED RELIABILITY AND NONESTABLISHED RELIABILITY, STYLE CWR15
    EIA 557 : 2006 STATISTICAL PROCESS CONTROL SYSTEMS
    MIL-STD-690 Revision D:2005 Failure Rate (FR) Sampling Plans and Procedures
    MIL-STD-202-204 Base Document:2015 METHOD 204, VIBRATION, HIGH FREQUENCY
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