• NEN EN IEC 61189-5-503 : 2017

    Current The latest, up-to-date edition.

    TEST METHODS FOR ELECTRICAL MATERIALS, PRINTED BOARD AND OTHER INTERCONNECTION STRUCTURES AND ASSEMBLIES - PART 5-503: GENERAL TEST METHOD FOR MATERIALS AND ASSEMBLIES - CONDUCTIVE ANODIC FILAMENTS (CAF) TESTING OF CIRCUIT BOARDS

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    Published date:  12-09-2017

    Publisher:  Netherlands Standards

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    Abstract - (Show below) - (Hide below)

    Describes the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperaturehumidity cyclic test and an unsaturated pressurized vapour test (HAST).

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    Document Type Standard
    Publisher Netherlands Standards
    Status Current
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