SAE AS 9003 : 2012
|
INSPECTION AND TEST QUALITY SYSTEMS, REQUIREMENTS FOR AVIATION, SPACE, AND DEFENSE ORGANIZATIONS |
ESD STM3.1 : 2015
|
IONIZATION |
ISO/IEC 17025:2005
|
General requirements for the competence of testing and calibration laboratories |
SAE AS 5553B : 2016
|
COUNTERFEIT ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION |
SAE AS 6171/1 : 2016
|
SUSPECT/COUNTERFEIT TEST EVALUATION METHOD |
MIL-STD-883 Revision K:2016
|
TEST METHOD STANDARD - MICROCIRCUITS |
SAE AS 6171/6 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ACOUSTIC MICROSCOPY (AM) TEST METHODS |
SAE AS 6081 : 2012
|
FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS: AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION - DISTRIBUTORS |
SAE AS 6171/11 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS |
SAE AS 6171/7 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ELECTRICAL TEST METHODS |
MIL-PRF-19500 Revision P:2010
|
SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
MIL-PRF-38534 Revision J:2015
|
HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
MIL-STD-750 Revision F:2011
|
TEST METHODS FOR SEMICONDUCTOR DEVICES |
SAE ARP 9009 : 2006
|
AEROSPACE CONTRACT CLAUSES |
SAE AS 9100D : 2016
|
QUALITY MANAGEMENT SYSTEMS - REQUIREMENTS FOR AVIATION, SPACE AND DEFENSE ORGANIZATIONS |
IPC J STD 033C-1:2014
|
HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES |
ASTM E 2339 : 2015 : REDLINE
|
Standard Practice for Digital Imaging and Communication in Nondestructive Evaluation (DICONDE) |
SAE AS 6171/8 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RAMAN SPECTROSCOPY TEST METHODS |
SAE AS 6171/3 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY X-RAY FLUORESCENCE TEST METHODS |
ESD S20.20 : 2014
|
PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS, ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES) |
SAE AS 6171/4 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS |
SAE AS 6171/9 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY FOURIER TRANSFORM INFRARED SPECTROSCOPY (FTIR) TEST METHODS |
ISO 9001:2015
|
Quality management systems — Requirements |
SAE AS 6171/5 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS |
ANSI/ISO/ASQ Q9001:2008
|
Quality Management Systems - Requirements |
MIL-STD-1580 Revision B:2003
|
DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS |
ISO 9000:2015
|
Quality management systems — Fundamentals and vocabulary |
SAE AS 9120 : 2016
|
QUALITY MANAGEMENT SYSTEMS - REQUIREMENTS FOR AVIATION, SPACE AND DEFENSE DISTRIBUTORS |
MIL-PRF-38535 Revision K:2013
|
Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
MIL-STD-202 Revision H:2015
|
ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
MIL-STD-1629 Revision A:1980
|
PROCEDURES FOR PERFORMING A FAILURE MODE, EFFECTS AND CRITICALITY ANALYSIS |
SAE AS 9110 : 2016
|
QUALITY MANAGEMENT SYSTEMS - REQUIREMENTS FOR AVIATION MAINTENANCE ORGANIZATIONS |
SAE AS 6171/10 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY THERMOGRAVIMETRIC ANALYSIS (TGA) TEST METHODS |