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  • SAE J 1879 : 2014

    Current The latest, up-to-date edition.

    HANDBOOK FOR ROBUSTNESS VALIDATION OF SEMICONDUCTOR DEVICES IN AUTOMOTIVE APPLICATIONS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  21-02-2014

    Publisher:  SAE International

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    Table of Contents - (Show below) - (Hide below)

    1. INTRODUCTION
    2. SCOPE
    3. TERMS, DEFINITIONS AND ABBREVIATIONS
    4. ROBUSTNESS VALIDATION BASICS
    5. MISSION PROFILE/VEHICLE REQUIREMENTS
    6. TECHNOLOGY DEVELOPMENT
    7. PRODUCT DEVELOPMENT
    8. POTENTIAL RISKS AND FAILURE MECHANISMS
    9. CREATION OF THE QUALIFICATION PLAN
    10. STRESS AND CHARACTERIZATION
    11. ROBUSTNESS ASSESSMENT
    12. IMPROVEMENT
    13. MONITORING
    14. REPORTING AND KNOWLEDGE EXCHANGE
    15. EXAMPLES
    16. ANNEX KNOWLEDGE MATRIX
    17. ANNEX REPORTING TEMPLATE
    18. REFERENCES AND ADDITIONAL READING
    19. NOTES

    Abstract - (Show below) - (Hide below)

    Specifies intrinsic reliability of electronic components for use in automotive electronics.

    General Product Information - (Show below) - (Hide below)

    Document Type Revision
    Publisher SAE International
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    SAE J 1850 : 2015 CLASS B DATA COMMUNICATIONS NETWORK INTERFACE
    SAE J 1211 : 2012 HANDBOOK FOR ROBUSTNESS VALIDATION OF AUTOMOTIVE ELECTRICAL/ELECTRONIC MODULES
    IEC TS 62686-1:2015 Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
    PD ISO/PAS 19451-2:2016 Application of ISO 26262:2011-2012 to semiconductors Application of hardware qualification
    SAE J 1938 : 2015 PRODUCT DEVELOPMENT PROCESS AND CHECKLIST FOR VEHICLE ELECTRONIC SYSTEMS
    ISO/PAS 19451-2:2016 Application of ISO 26262:2011-2012 to semiconductors Part 2: Application of hardware qualification
    PD IEC/TS 62686-1:2015 Process management for avionics. Electronic components for aerospace, defence and high performance (ADHP) applications General requirements for high reliability integrated circuits and discrete semiconductors

    Standards Referencing This Book - (Show below) - (Hide below)

    ESD STM5.2 : 2012 ELECTROSTATIC DISCHARGE SENSITIVITY TESTING - MACHINE MODEL (MM) - COMPONENT LEVEL
    ESD STM5.1 : 2007 ELECTROSTATIC DISCHARGE SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) - COMPONENT LEVEL
    ASTM F 617 : 2000 Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)
    SAE J 1211 : 2012 HANDBOOK FOR ROBUSTNESS VALIDATION OF AUTOMOTIVE ELECTRICAL/ELECTRONIC MODULES
    ESD STM5.3.1 : 1999 CHARGED DEVICE MODEL (CDM) - COMPONENT LEVEL
    ISO 9001:2015 Quality management systems — Requirements
    ASTM F 1096 : 1987 Method for Measuring Mosfet Saturated Threshold Voltage (Withdrawn 1992)
    ASTM F 1260M : 1996 Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
    EIA 557 : 2006 STATISTICAL PROCESS CONTROL SYSTEMS
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