• BS 6493-2.1:1985

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Semiconductor devices. Integrated circuits General

    Available format(s):  Hardcopy, PDF

    Superseded date:  30-07-2002

    Language(s):  English

    Published date:  06-08-2002

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    National foreword
    Committees responsible
    Chapter I: Scope and presentation of IEC Publication 748
    1 Scope
    2 Presentation
    Chapter II: Purpose & presentation of Publication 748-1
    1 General
    2 Purpose
    3 Presentation
    Chapter III: Purpose, presentation and requirements on
    the contents of publications 748-2, 748-3, etc. (under
    consideration)
    Chapter IV: Terminology, general
    1 General terms
    2 Types of devices
    3 Clamping characteristics of integrated circuits
    4 Technological concepts
    5 Concepts for particular device types of film
       integrated circuits and hybrid film integrated
       circuits
    Chapter V: Letter symbols, general
    1 Basic letters
    2 Subscripts for digital integrated circuits
       2.1 Voltages and currents
       2.2 Switching times
    3 Subscripts for analogue integrated circuits
    Chapter VI: Essential ratings and characteristics,
    general
    1 Introduction
    2 Standard format for the presentation of published
       data and method for describing essential ratings
       and characteristics and function specification of
       integrated circuits
       2.1 Standard format for the presentation of published
            data
       2.2 Method for describing essential ratings and
            characteristics and function specification of
            integrated circuits
    3 Basic "rating" definitions
    4 Definitions of cooling conditions
    5 List of preferred temperatures
    6 List of preferred voltages
       6.1 List of preferred nominal voltages for recommended
            operating conditions
       6.2 Tolerances on voltages
    7 Mechanical ratings, characteristics and other data
    8 Production spread and compliance
    9 Printed wiring and printed circuits
    Chapter VII: Measuring methods, general
    1 Basic requirements
       1.1 Introduction
       1.2 General precautions
    2 Specific requirements on the measuring methods
    3 Numbering system for measuring methods
       3.1 Numbering principle
       3.2 Numbering list of measuring methods for integrated
            circuits
       3.3 Application matrices
       3.4 Updating
    Chapter VIII: Acceptance and reliability of integrated
    circuits
    Section One - General
    Section Two - General principles
    (under consideration)
    Section Three - Electrical endurance tests
    1 Purpose and presentation
    2 General requirements
       2.1 Conditions for electrical tests
       2.2 Duration of test
       2.3 Failure-defining characteristics and measurements
       2.4 Failure criteria
       2.5 Precautions
    3 Specific requirements. General
       3.1 List of endurance tests
       3.2 Conditions for endurance tests
       3.3 Failure-defining characteristics and failure
            criteria for acceptance after endurance tests
       3.4 Failure-defining characteristics and failure
            criteria for reliability (under consideration)
       3.5 Procedure in case of a testing error
    Chapter IX: Electrostatic sensitive devices
    (see Publication 747-1, Chapter IX)

    Abstract - (Show below) - (Hide below)

    General recommendations for integrated circuits.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Also numbered as IEC 60748-1 Supersedes BS 3363(1980), BS 3363:SUPP1(1981), BS 3363:SUPP2(1981), 87/23034 DC and 87/32332 DC (08/2002)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS 6493-2.2(1986) : 1986 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
    BS CECC 90000:1991 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
    BS IEC 60747-10:1991 Semiconductor devices Generic specification for discrete devices and integrated circuits
    BS QC 790303:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
    BS EN 117000:1997 Harmonized system of quality assessment for electronic components. Generic specification. Solid state all-or-nothing relays. Generic data and methods of test
    BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
    BS 6493-3:1985 Semiconductor devices Mechanical and climatic test methods
    BS CECC 90200:1988 Harmonized system of quality assessment for electronic components: sectional specification: analogue monolithic integrated circuits
    BS CECC 90300:1988 Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits
    BS QC 790202:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers
    BS 6493-2.3:1987 Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits
    BS QC700000(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
    BS QC 790304:1994 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC)
    BS QC 760000:1990 Harmonized system of quality assessment for electronic components. Film and hybrid film integrated circuits. Generic specification
    BS 6493-2.4(1989) : 1989 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS
    BS CECC 90115:1994 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits
    BS EN 190000:1996 Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
    EN 190000:1995 Generic Specification: Monolithic integrated circuits

    Standards Referencing This Book - (Show below) - (Hide below)

    BS 6493-1.1:1984 Semiconductor devices. Discrete devices General
    BS 3939-12:1985 Guide for graphical symbols for electrical power, telecommunications and electronics diagrams Binary logic elements
    BS 6493-2.4(1989) : 1989 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS INTERFACE INTEGRATED CIRCUITS
    BS 6493-2.2(1986) : 1986 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    BS 4200-3:1979 Guide on the reliability of electronic equipment and parts used therein Presentation of reliability data on electronic components (or parts)
    BS 6493-2.3:1987 Semiconductor devices. Integrated circuits Recommendations for analogue integrated circuits
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