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  • BS CECC 64000:1990

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    Harmonized system of quality assessment for electronic components: generic specification: film resistor networks

    Available format(s):  Hardcopy, PDF

    Withdrawn date:  15-11-1997

    Language(s):  English

    Published date:  30-04-1990

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    Preface
    Section 1
    1.1 Scope
    1.2 Technological classification of Film Resistor
           Networks
    Section 2 - General
    2.1 Order of precedence
    2.2 Related documents
    2.3 Units, symbols and terminology
    2.4 Preferred values
    2.5 Marking
    2.6 Coding
    Section 3 - Quality assessment procedures
    3.1 Primary stage of manufacture
    3.2 Manufacturing stages and sub-contracting
    3.3 Manufacturer approval
    3.4 Approval of fixed resistor networks
    3.5 Qualification approval
    3.6 Capability approval
    3.7 Certified test records
    3.8 Delayed deliveries
    3.9 Delivery of networks subjected to destructive
           or non destructive tests
    3.10 Supplementary procedure for delivery
    3.11 Supplementary information
    Section 4 - Test and measurements procedures
    4.1 General
    4.2 Standard conditions for testing
    4.3 Visual examination and check of dimensions
    4.4 Electrical measurement procedures
    4.5 Environmental testing procedure

    Abstract - (Show below) - (Hide below)

    Defines the terms, inspection procedures and methods of test for use in sectional and detailed specifications for qualification and capability approval of fixed resistors.

    General Product Information - (Show below) - (Hide below)

    Committee W/-
    Development Note Being replaced by the BS EN 165000 series.
    Document Type Standard
    Publisher British Standards Institution
    Status Withdrawn

    Standards Referencing This Book - (Show below) - (Hide below)

    CECC 00107(PT3) : 80 AMD 1 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR CAPABILITY APPROVAL
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
    IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
    IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
    CECC 00100 : 1988 BASIC RULES - TO BE USED IN CONNECTION WITH THE INTERNAL REGULATIONS OF THE FEN e.V
    IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
    CECC 00107(PT1) : 1982 CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE
    IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
    IEC TR 60440:1973 Method of measurement of non-linearity in resistors
    IEC 60062:2016 Marking codes for resistors and capacitors
    IEC 60063:2015 Preferred number series for resistors and capacitors
    IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
    CECC 00007 : 1978 BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES
    IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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