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  • BS EN ISO 18452:2016

    Current The latest, up-to-date edition.

    Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  30-04-2016

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Principle of measurement
    5 Test environment
    6 Apparatus
    7 Test pieces
    8 Procedure
    9 Calculation
    10 Limits to step height
    11 Test report
    Annex A (informative) - Effect of amplification factor
            and levelling error on measured layer thickness

    Abstract - (Show below) - (Hide below)

    Describes a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer.

    Scope - (Show below) - (Hide below)

    This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

    NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.

    General Product Information - (Show below) - (Hide below)

    Committee RPI/13
    Development Note Supersedes BS EN 1071-1. (05/2016)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 3274:1996 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
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