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  • PD IEC/PAS 62276:2002

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    Single crystal wafers applied for surface acoustic wave device. Specification and measuring method

    Available format(s):  Hardcopy, PDF

    Superseded date:  14-02-2006

    Language(s):  English

    Published date:  05-02-2002

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Introduction
    Section 1: Specification for single crystal wafer
    1 Scope
    2 Reference documents
    3 Terms and definitions
    4 Symbols and abbreviated terms
    5 Requirements
    6 Sampling
    7 Test methods
    8 Identification, labeling, packaging, delivery condition
    Section 2: Measuring method
    1 Measuring method of Curie Temperature
    2 Measurement of lattice constant (Bond method)
    3 Measurement of face angle by X-ray
    4 Appearance inspections
    Annex A (Normative) Expression using Eulerian angle for
            piezoelectric Single crystal
    Annex B (Informative) Crystal growth method
    Annex C (Informative) Manufacturing lot
    Annex D (Informative) Explanation of TTV, LTV and Sori
    Annex E (Informative) Standard mechanical wafer process
            flow chart
    Annex F (Informative) Reference

    Abstract - (Show below) - (Hide below)

    Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators.

    Scope - (Show below) - (Hide below)

    Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and measuring methods.

    General Product Information - (Show below) - (Hide below)

    Committee W/-
    Development Note Also numbered as IEC PAS 62276. (02/2002)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61019-1-2:1993 Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
    IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
    IEC 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
    IEC 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
    IEC 61019-3:1991 Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
    IEC 61019-1-1:1990 Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values
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