• PD IEC/TS 62622:2012

    Current The latest, up-to-date edition.

    Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  28-02-2013

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Symbols and abbreviated terms
    5 Grating calibration and quality characterization methods
    6 Reporting of grating characterization results
    Annex A (informative) - Background information and examples
    Annex B (informative) - Bravais lattices
    Bibliography

    Abstract - (Show below) - (Hide below)

    Defines the generic terminology for the global and local quality parameters of artificial gratings, interpreted in terms of deviations from nominal positions of grating features, and provides guidance on the categorization of measurement and evaluation methods for their determination.

    Scope - (Show below) - (Hide below)

    This technical specification specifies the generic terminology for the global and local quality parameters of artificial gratings, interpreted in terms of deviations from nominal positions of grating features, and provides guidance on the categorization of measurement and evaluation methods for their determination.

    This specification is intended to facilitate communication among manufacturers, users and calibration laboratories dealing with the characterization of the dimensional quality parameters of artificial gratings used in nanotechnology.

    This specification supports quality assurance in the production and use of artificial gratings in different areas of application in nanotechnology. Whilst the definitions and described methods are universal to a large variety of different gratings, the focus is on one-dimensional (1D) and two-dimensional (2D) gratings.

    General Product Information - (Show below) - (Hide below)

    Committee NTI/1
    Document Type Standard
    Publisher British Standards Institution
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 16700:2016 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
    ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
    ISO 15902:2004 Optics and photonics Diffractive optics Vocabulary
    ISO 29301:2010 Microbeam analysis Analytical transmission electron microscopy Methods for calibrating image magnification by using reference materials having periodic structures
    GOST R 8-631 : 2007 AMD 1 2011 STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS - SCANNING ELECTRON MEASURING MICROSCOPES - METHODS FOR VERIFICATION
    GOST R 8-630 : 2007 AMD 1 2011 STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS - ATOMIC-FORCE SCANNING PROBE MEASURING MICROSCOPES - METHODS FOR VERIFICATION
    GOST R 8-635 : 2007 STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS - ATOMIC-FORCE SCANNING PROBE MICROSCOPES - METHOD FOR CALIBRATION
    ISO/TS 80004-1:2015 Nanotechnologies — Vocabulary — Part 1: Core terms
    OIML R 98 : 1991 HIGH-PRECISION LINE MEASURES OF LENGTH
    ISO/TS 16610-1:2006 Geometrical product specifications (GPS) Filtration Part 1: Overview and basic concepts
    ISO 14660-1:1999 Geometrical Product Specifications (GPS) Geometrical features Part 1: General terms and definitions
    SEMI P35 : 2006(R2013) TERMINOLOGY FOR MICROLITHOGRAPHY METROLOGY
    GOST R 8-628 : 2007 AMD 1 2011 STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS - SINGLE-CRYSTAL SILICON NANOMETER RANGE RELIEF MEASURES - REQUIREMENTS FOR GEOMETRICAL SHAPES, LINEAR SIZES AND MANUFACTURING MATERIAL SELECTION
    GOST R 8-644 : 2008 STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS - NANOMETER RANGE RELIEF MEASURES WITH TRAPEZOIDAL PROFILE OF ELEMENTS - METHODS FOR CALIBRATION
    GOST R 8-629 : 2007 AMD 1 2011 STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS - NANOMETER RANGE RELIEF MEASURES WITH TRAPEZOIDAL PROFILE OF ELEMENTS - METHODS FOR VERIFICATION
    GOST R 8-636 : 2007 STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS - SCANNING ELECTRON MICROSCOPES - METHODS FOR CALIBRATION
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