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  • BS QC 720104:1997

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems

    Available format(s):  Hardcopy, PDF

    Withdrawn date:  25-04-2012

    Language(s):  English

    Published date:  15-09-1997

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    INTRODUCTION
    4 Limiting values (absolute maximum rating system)
    5 Electrical and optical characteristics
    6 Marking
    7 Ordering information
    8 Test conditions and inspection requirements
    9 Group D - Qualification approval tests
    10 Additional information
    11 Reference documents
    Tables
    Required information for identification
    Limiting values
    Electrical and optical characteristics
    Group A - Lot-by-lot tests
    Group B - Lot-by-lot tests
    Group C - Periodic tests
        

    Abstract - (Show below) - (Hide below)

    SHOULD BE READ IN CONJUNCTION WITH BS QC700000 AND BS QC720100.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Also numbered as IEC 60747-12-4 Supersedes 95/210321 DC (08/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Withdrawn
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60747-12:1991 Semiconductor devices - Part 12: Sectional specification foroptoelectronic devices
    IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
    IEC 60747-5:1992 Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
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