• BS QC 760000:1990

    Current The latest, up-to-date edition.

    HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FILM AND HYBRID FILM INTEGRATED CIRCUITS - GENERIC SPECIFICATION

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-1990

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    National foreword
    Committees responsible
    Clause
    SECTION 1 - SCOPE, OBJECT AND CLASSIFICATION
    1.1 Scope
    1.2 Object
    1.3 Technological classification of F and HFICs
    SECTION 2 - GENERAL
    2.1 Order of precedence
    2.2 Related documents
    2.3 Units and symbols
    2.4 Terminology
    2.5 Standard and preferred values
    2.6 Marking
    SECTION 3 - QUALITY ASSESSMENT PROCEDURES
    3.1 Primary stage of manufacture
    3.2 Manufacturing stages and sub-contracting
    3.3 Manufacturer approval
    3.4 Approval of film integrated circuits and hybrid
          film integrated circuits
    3.5 Qualification approval
    3.6 Capability approval
    3.7 Certified records of released lots
    3.8 Delayed deliveries
    3.9 Delivery of F and HFICs subjected to destructive
          or non-destructive tests
    3.10 Supplementary procedure for deliveries
    3.11 Supplementary information
    SECTION 4 - TEST AND MEASUREMENT PROCEDURES
    4.1 General
    4.2 Standard conditions for testing
    4.3 Visual examination
    4.4 Electrical measurement procedures
    4.5 Environmental testing procedures

    Abstract - (Show below) - (Hide below)

    Applies to film integrated circuits and hybrid film integrated circuits (F and HFICs), passive and active. Does not include printed circuit boards, unless included in F and HFICs, when it may be applicable. Applicable also to partly-completed F and HFICs for processing by customers.

    General Product Information - (Show below) - (Hide below)

    Committee ECL/24
    Development Note Also numbered as IEC 60748-20 Supersedes 85/22458 DC and 95/205099 DC (08/2005)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS QC 760101:1997 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR FILM INTEGRATED CIRCUITS AND HYBRID FILM INTEGRATED CIRCUITS ON THE BASIS OF QUALIFICATION APPROVAL PROCEDURES
    BS QC 760200:1997 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - SECTIONAL SPECIFICATION FOR FILM INTEGRATED CIRCUITS AND HYBRID FILM INTEGRATED CIRCUITS ON THE BASIS OF THE CAPABILITY APPROVAL PROCEDURES
    BS QC 760201:1997 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR FILM INTEGRATED CIRCUITS AND HYBRID FILM INTEGRATED CIRCUITS ON THE BASIS OF THE CAPABILITY APPROVAL PROCEDURES

    Standards Referencing This Book - (Show below) - (Hide below)

    BS 2011-2.1B(1977) : 1977 ENVIRONMENTAL TESTING - TESTS - TEST B. DRY HEAT
    BS 6458-2.2(1984) : 1984 FIRE HAZARD TESTING FOR ELECTROTECHNICAL PRODUCTS - METHODS OF TEST - NEEDLE FLAME TEST
    BS 6493-1.1:1984 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - GENERAL
    BS 6001-1:1991 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT-BY-LOT INSPECTION
    BS 6493-2.1:1985 SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - GENERAL
    BS 2011-2.1XA(1981) : 1981 AMD 7553 ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS
    BS 2011-2.1N:1985 ENVIRONMENTAL TESTING - TESTS - TEST N: CHANGE OF TEMPERATURE
    BS 2011-2.1Ca:1977 ENVIRONMENTAL TESTING - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    BS 6493-3:1985 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    BS 2011-2.1Ka:1982 Environmental testing. Tests Test Ka.Salt mist
    BS 3934(1965) : 1965 SPECIFICATION FOR DIMENSIONS OF SEMICONDUCTOR DEVICES AND INTEGRATED ELECTRONIC CIRCUITS
    BS 2011-3A & B:1977 ENVIRONMENTAL TESTING - BACKGROUND INFORMATION - TESTS A (COLD) AND TESTS B (DRY HEAT)
    BS 2011-2.1T:1981 ENVIRONMENTAL TESTING - TESTS - TEST T - SOLDERING
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