• BS QC760200(1997) : 1997

    Current The latest, up-to-date edition.

    HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - SECTIONAL SPECIFICATION FOR FILM INTEGRATED CIRCUITS AND HYBRID FILM INTEGRATED CIRCUITS ON THE BASIS OF THE CAPABILITY APPROVAL PROCEDURES

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-1997

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    1 Scope and object
    2 General, preferred characteristics, ratings and
        severities for environmental tests
        2.1 Normative references
        2.2 Preferred ratings and characteristics
        2.3 Information to be given in a detail specification
    3 Capability approval procedures
        3.1 Selection of capability qualifying circuits (CQCs)
        3.2 Structural similarity
        3.3 Capability approval
        3.4 Resubmission of rejected lots (lot-by-lot
              inspection)
        3.5 Manufacturing stages in a factory of an approved
              manufacturer in a non-IEC member country
    4 Test and measurement procedures
    5 Tables for method B
    Annexes
    A Structural similarity rules for capability approval
    B Minimum contents of a manufacturer's capability
        manual for thick film circuits
    C Minimum contents of a manufacturer's capability manual
        for thin film circuits
    Tables
    1 Test schedule for capability approval for method A
    2 Assessment levels and acceptance criteria for capability
        approval for method A
    3 Assessment levels and acceptance criteria for quality
        conformance inspection for method A
    4 Screening
    5 Test schedule for capability approval for method B
    6 Assessment levels and acceptance criteria for
        capability approval for method B
    7 Assessment levels and acceptance criteria for quality
        conformance inspection for method B

    Abstract - (Show below) - (Hide below)

    Applicable to film integrated circuits and hybrid film integrated circuits manufactured as catalogue circuits when quality is assessed on a basis of capability approval.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47/1
    Development Note Supersedes BS QC760200(1992) and 95/200682 DC. To be read in conjunction with BS QC 760000(1990) Also numbered as IEC 60748-22. (09/2003)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    BS QC760000(1990) : 1990 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FILM AND HYBRID FILM INTEGRATED CIRCUITS - GENERIC SPECIFICATION
    IEC TR 60440:1973 Method of measurement of non-linearity in resistors
    IEC 60063:2015 Preferred number series for resistors and capacitors
    IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
    IEC 60748-20-1:1994 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
    IEC 60748-21:1997 Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
    IEC 60748-22-1:1997 Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
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