• FED-STD-209 Revision E:1992

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    AIRBORNE PARTICULATE CLEANLINESS CLASSES IN CLEANROOMS AND CLEAN ZONES

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    Superseded date:  29-11-2001

    Language(s): 

    Published date: 

    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    1 Scope and limitations
    1.1 Scope
    1.2 Limitations
    2 Referenced documents
    3 Definitions
    3.1 Airborne particulate cleanliness class
    3.2 Anisokinetic sampling
    3.3 Calibration
    3.4 Clean zone
    3.5 Cleanroom
    3.5.1 As-built cleanroom (facility)
    3.5.2 At-rest cleanroom (facility)
    3.5.3 Operational cleanroom (facility)
    3.6 Condensation nucleus counter (CNC)
    3.7 Discrete-particle counter (DPC)
    3.8 Entrance plane
    3.9 Isoaxial
    3.10 Isokinetic sampling
    3.11 Monitoring
    3.12 Nonunidirectional airflow
    3.13 Particle
    3.14 Particle concentration
    3.15 Particle size
    3.16 Student's t statistic
    3.17 U descriptor
    3.18 Ultrafine particles
    3.19 Unidirectional airflow
    3.20 Upper confidence limit (UCL)
    3.21 Verification
    4 Airborne particulate cleanliness classes and
               U descriptors
    4.1 Class listed in Table I
    4.1.1 Measurement at particle sizes listed in Table
               I
    4.1.2 Measurement at alternative particle sizes
    4.2 Provision for defining alternative airborne
               particulate cleanliness classes
               Table I. Airborne particulate cleanliness
               classes
    4.3 Provision for describing ultrafine particle
               concentrations (U descriptors)
    4.4 Nomenclature for airborne particle
               concentrations
    4.4.1 Format for airborne particulate cleanliness
               classes
    4.4.2 Format for U descriptors
    5 Verification and monitoring of airborne
               particulate cleanliness
    5.1 Verification of airborne particulate
               cleanliness
    5.1.1 Frequency
    5.1.2 Environmental test conditions
    5.1.2.1 State of cleanroom or clean zone during
               verification
    5.1.2.2 Environmental factors
    5.1.3 Particle counting
    5.1.3.1 Sample locations and number: unidirectional
               airflow
    5.1.3.2 Sample locations and number:
               nonunidirectional airflow
    5.1.3.3 Restrictions on sample locations
    5.1.3.4 Sample volume and sampling time
    5.1.3.4.1 Single sampling plan for classes in Table I
    5.1.3.4.2 Single sampling plan for alternative classes
               or particle sizes
    5.1.3.4.3 Single sampling plan for U descriptors
    5.1.3.4.4 Sequential sampling plan
    5.1.4 Interpretation of the data
    5.2 Monitoring of airborne particulate
               cleanliness
    5.2.1 Monitoring plan
    5.2.2 Particle counting for monitoring
    5.3 Methods and equipment for measuring airborne
               particle concentrations
    5.3.1 Counting particles 5 micrometers and larger
    5.3.2 Counting particles smaller than 5 micrometers
    5.3.3 Counting ultrafine particles
    5.3.4 Limitations of particle counting methods
    5.3.5 Calibration of particle counting
               instrumentation
    5.4 Statistical analysis
    5.4.1 Acceptance criteria for verification
    5.4.2 Calculations to determine acceptance
    5.4.2.1 Average particle concentration at a location
    5.4.2.2 Mean of the averages
    5.4.2.3 Standard deviation of the averages
    5.4.2.4 Standard error of the mean of the averages
    5.4.2.5 Upper confidence limit (UCL)
               Table II. UCL factor for 95% upper confidence
               limit
    5.4.2.6 Sample calculation
    6 Recommendation for changes
    7 Conflict with referenced documents
    8 Federal agency interests
    Appendix A - Counting and sizing airborne particles
                 using optical microscopy
    A10 Scope
    A20 Summary of the method
    A30 Equipment
    A40 Preparation of equipment
    A50 Sampling the air
    A60 Calibration of the microscope
    A70 Counting and sizing particles by optical
               microscopy
    A80 Reporting
    A90 Factors affecting precision and accuracy
    Appendix B - Operation of a discrete-particle counter
    B10 Scope and limitations
    B20 References
    B30 Summary of method
    B40 Apparatus and related documentation
    B50 Preparation for sampling
    B60 Sampling
    B70 Reporting
    Appendix C - Isokinetic and anisokinetic sampling
    C10 Scope
    C20 Reference
    C30 Background
    C40 Methods
               Figure C.1. Probe inlet diameters (metric
               units) for isokinetic sampling, v = vo
               Figure C.2. probe inlet diameters (English
               units) for isokinetic sampling, v = vo
               Figure C.3. Contours of sampling bias,
               c/co = 0.95, 1.05
    C50 Example
    Appendix D - Method for measuring the concentration of
                 ultrafine particles
    D10 Scope
    D20 References
    D30 Apparatus
               Figure D.1. Envelope of acceptability for the
               counting efficiency of a DPC used to verify
               the U descriptor
    D40 Determining the concentration of ultrafine
               particles
    Appendix E - Rationale for the statistical rules used in
                 FED-STD-209E
    E10 Scope
    E20 The statistical rules
    E30 Sequential sampling
    E40 Sample calculation to determine statistical
               validity of a verification
    Appendix F - Sequential sampling: an optional method for
                 verifying the compliance of air to the
                 limits of airborne particulate cleanliness
                 classes M 2.5 and cleaner
    F10 Scope
    F20 References
    F30 Background
    F40 Method
               Figure F.1. Observed count, C, vs. expected
               count, E, for sequential sampling
               Table F.1. Upper and lower limits for time at
               which C counts should arrive
    F50 Examples
    F60 Reporting
    Appendix G - Sources of supplemental information
    G10 Scope
    G20 Sources of supplemental information

    Abstract - (Show below) - (Hide below)

    Gives classes of air cleanliness for airborne particulate levels in cleanrooms and zones. Gives methods for class verification and monitoring of air cleanliness. Coverage includes: airborne particulate cleanliness classes and U descriptions; verification and monitoring of airborne particulate cleanliness. Also contains detailed definitions and appendices.

    General Product Information - (Show below) - (Hide below)

    Committee FSC 3694
    Development Note E Notice 1 - Notice of Cancellation/Superseded by ISO 14644-1 and ISO 14644-2 (03/2002)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-G-23081 Revision C:1972 GYROSCOPE INDICATOR SYSTEM VERTICAL.
    ANSI INCITS 200 : 1992 INFORMATION SYSTEMS - UNRECORDED OPTICAL MEDIA UNIT FOR DIGITAL INFORMATION INTERCHANGE - 356 MM WORM OPTICAL DISK CARTRIDGE - PARTS 1 AND 2
    MIL-A-83577 Revision B:1988 ASSEMBLIES, MOVING MECHANICAL, FOR SPACE AND LAUNCH VEHICLES, GENERAL SPECIFICATION FOR
    MIL-HDBK-337 Base Document:1982 ADHESIVE BONDED AEROSPACE STRUCTURE REPAIR
    MIL-STD-1330 Revision D:1996 STANDARD PRACTICE FOR PRECISION CLEANING AND TESTING OF SHIPBOARD OXYGEN, HELIUM, HELIUM-OXYGEN, NITROGEN AND HYDROGEN SYSTEMS
    MIL H 38534 : B (1) HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR
    MIL P 197 : H PACKAGING OF BEARINGS, ANTIFRICTION, ASSOCIATED PARTS AND SUBASSEMBLIES
    MIL H 26385 : E HOSE, OXYGEN AND PRESSURIZATION, OZONE RESISTANT
    MIL-STD-1246 Revision C:1994 PRODUCT CLEANLINESS LEVELS AND CONTAMINATION CONTROL PROGRAM
    MIL H 26626 : D HOSE ASSEMBLY, TETRAFLUOROETHYLENE, OXYGEN
    BS EN 62258-1:2010 Semiconductor die products Procurement and use
    01/206130 DC : DRAFT AUG 2001 IEC 62258 - SEMICONDUCTOR DIE PRODUCTS - MINIMUM REQUIREMENTS FOR PROCUREMENT AND USE - PART 1: GENERAL REQUIREMENTS - MECHANICAL, MATERIAL AND CONNECTIVITY
    ASTM F 979 : 1986 : R1998 : EDT 1 Standard Test Method for Hermeticity of Hybrid Microcircuit Packages Prior to Lidding
    ANSI INCITS 199 : 1991 : R2007 INFORMATION SYSTEMS - 356 MM OPTICAL DISK CARTRIDGE (WRITE-ONCE) - TEST METHODS FOR MEDIA CHARACTERISTICS
    ASTM E 2311 : 2004 : R2016 Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space
    MIL M 9950 : A NOTICE 1 MISSILE COMPONENTS, LIQUID OXYGEN, LIQUID NITROGEN, GASEOUS OXYGEN, GASEOUS NITROGEN, INSTRUMENT AIR, HELIUM AND FUEL HANDLING SYSTEMS, CLEANING AND PACKAGING FOR DELIVERY
    MIL-T-24747 Base Document:1991 TECHNICAL REPAIR STANDARDS (TRS) MANUAL; PREPARATION OF
    MIL-STD-206 Revision B:1988 FRICTION TORQUE TESTING FOR INSTRUMENT BALL BEARINGS PARTS 1 AND 2
    I.S. EN 62258-1:2010 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
    ANSI INCITS 213 : 1994 INFORMATION TECHNOLOGY - 90-MM (3.54-IN) OPTICAL DISK CARTRIDGE REWRITABLE AND READ ONLY USING DISCRETE BLOCK FORMAT (DBF) METHOD FOR DIGITAL INFORMATION INTERCHANGE
    ASTM E 1549/E1549M : 2013 Standard Specification for ESD Controlled Garments Required in Cleanrooms and Controlled Environments for Spacecraft for Non-Hazardous and Hazardous Operations
    ASTM E 2311 : 2004 : R2009 Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space
    ASTM F 1394 : 1992 : R2005 Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves
    ASTM E 2088 : 2006 Standard Practice for Selecting, Preparing, Exposing, and Analyzing Witness Surfaces for Measuring Particle Deposition in Cleanrooms and Associated Controlled Environments
    ASTM E 2217 : 2012 : REDLINE Standard Practice for Design and Construction of Aerospace Cleanrooms and Contamination Controlled Areas
    ASTM F 612 : 1988 Practice for Cleaning Surfaces of Polished Silicon Slices (Withdrawn 1993)
    ASTM F 584 : 2006 : EDT 1 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire (Withdrawn 2015)
    ASTM E 2088 : 2006 : R2011 Standard Practice for Selecting, Preparing, Exposing, and Analyzing Witness Surfaces for Measuring Particle Deposition in Cleanrooms and Associated Controlled Environments
    ASTM F 584 : 2006 Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire
    ASTM F 816 : 1983 : R2003 Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages (Withdrawn 2009)
    BS EN 13091:2000 Biotechnology. Performance criteria for filter elements and filtration assemblies
    DIN EN 14736:2004-09 SPACE PRODUCT ASSURANCE - QUALITY ASSURANCE FOR TEST CENTRES
    EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
    ASTM F 1708 : 2002 Standard Practice for Evaluation of Granular Polysilicon by Meter-Zoner Spectroscopies (Withdrawn 2003)
    MIL-STD-976 Revision B:1988 CERTIFICATION REQUIREMENTS FOR JAN MICROCIRCUITS
    ASTM E 2311 : 2004 Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space
    MIL-STD-1695 Base Document:1977 ENVIRONMENTS, WORKING, MINIMUM STANDARDS FOR
    DOD-STD-347 Base Document:1985 PRODUCT ASSURANCE PROGRAM REQUIREMENTS FOR FIBER OPTIC COMPONENTS
    MIL-F-48382 Revision A:1985 FUZE, M934E6, IMPACT SWITCH FOR
    BS PD ES 59008-5.1 : 2001 DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 5-1: PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE
    ASTM E 2090 : 2012 : REDLINE Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
    BS PD ES 59008-4.2 : 2001 DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 4-2: SPECIFIC REQUIREMENTS AND RECOMMENDATIONS - HANDLING AND STORAGE
    ASTM E 874 : 2011 : REDLINE PRACTICE FOR ADHESIVE BONDING OF ALUMINUM FACINGS TO NONMETALLIC HONEYCOMB CORE FOR SHELTER PANELS
    ASTM F 816 : 1983 : R1998 : EDT 1 Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages
    ANSI INCITS 191 : 1991 INFORMATION SYSTEMS - RECORDED OPTICAL MEDIA UNIT FOR DIGITAL INFORMATION INTERCHANGE - 130 MM WRITE-ONCE SAMPLED-SERVO RZ SELECTABLE-PITCH OPTICAL DISK CARTRIDGE
    ANSI INCITS 246 : 1994 INFORMATION PROCESSING SYSTEMS - TEST METHODS FOR MEDIA CHARACTERISTICS OF 90 MM READ ONLY AND REWRITABLE M.O. OPTICAL DISK DATA STORAGE CARTRIDGE WITH DISCRETE BLOCK FORMAT (DBF)
    ASTM F 1394 : 1992 : R2012 Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves
    ASTM F 1394 : 1992 : R1999 Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves
    ASTM E 2352 : 2019 Standard Practice for Aerospace Cleanrooms and Associated Controlled Environments—Cleanroom Operations
    ASTM E 2042 : 2004 Standard Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms
    ASTM E 2352 : 2004 Standard Practice for Aerospace Cleanrooms and Associated Controlled Environments-Cleanroom Operations
    ASTM E 1548 : 2009 : R2017 Standard Practice for Preparation of Aerospace Contamination Control Plans
    ASTM E 1548 : 2009 Standard Practice for Preparation of Aerospace Contamination Control Plans
    ASTM E 2042/E2042M : 2009 Standard Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms
    ASTM A 380 : 2006 Standard Practice for Cleaning, Descaling, and Passivation of Stainless Steel Parts, Equipment, and Systems
    ASTM F 50 : 2012 : R2015 Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles
    ASME B89.6.2 : 1973 : R2017 TEMPERATURE AND HUMIDITY ENVIRONMENT FOR DIMENSIONAL MEASUREMENT
    ASME B89.6.2 : 1973 : R2003 TEMPERATURE AND HUMIDITY ENVIRONMENT FOR DIMENSIONAL MEASUREMENT
    ASME B89.6.2 : 1973 : R2012 TEMPERATURE AND HUMIDITY ENVIRONMENT FOR DIMENSIONAL MEASUREMENT
    MIL-STD-1774 Base Document:1982 PROCESS FOR CLEANING HYDRAZINE SYSTEMS AND COMPONENTS
    ES 59008-5-2 : 2001 DATA REQUIREMENTS FOR SEMI-CONDUCTOR DIE - PART 5-2: PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE WITH ADDED CONNECTION STRUCTURES
    MIL-F-48863 Revision C:1985 FUZE, GUIDED MISSILE, M934E6 PARTS ASSEMBLY, LOADING & PACKING FOR
    I.S. EN 14736:2004 SPACE PRODUCT ASSURANCE - QUALITY ASSURANCE FOR TEST CENTRES
    ASTM F 804 : 1983 : R1990 : EDT 1 Practice for Producing Spin Coating Resist Thickness Curves (Withdrawn 1997)
    MIL V 87223 : 0 VALVE, PRESSURE, ANTI-G SUIT, MXU-804/A AND MXU-805/A
    MIL-I-81454 Base Document:1967 INDICATOR, GYROSCOPE, VERTICAL REFERENCE ID-1481 (*)/A
    MIL-STD-1547 Revision B:1992 ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES
    MIL-G-81937 Revision A:1984 GREASE, INSTRUMENT, ULTRA CLEAN, METRIC
    MIL-HDBK-349 Base Document:1994 MANUFACTURE AND INSPECTION OF ADHESIVE BONDED, ALUMINUM HONEYCOMB SANDWICH ASSEMBLIES FOR AIRCRAFT
    MIL-STD-1359 Revision B:1987 CLEANING METHODS AND PROCEDURES FOR BREATHING OXYGEN EQUIPMENT
    MIL-C-85300 Base Document:1982 COOLER, CRYOGENIC DETECTOR
    MIL R 28750 : C SUPP 1 RELAYS, SOLID STATE, SEALED, OPTICALLY ISOLATED, ZERO VOLTAGE TURN ON, 25 AMPERES, 250 VOLTS MAXIMUM, 45-440 HZ, POWER SWITCHING
    ASTM F 979 : 1986 : R2003 Standard Test Method for Hermeticity of Hybrid Microcircuit Packages Prior to Lidding (Withdrawn 2009)
    ES 59008-4-2 : 2000 DATA REQUIREMENTS FOR SEMICONDUCTOR DIE : SPECIFIC REQUIREMENTS AND RECOMMENDATIONS HANDLING AND STORAGE
    MIL-B-913 Base Document:1993 BEARINGS, BALL, ANNULAR, FOR INSTRUMENTS AND PRECISION ROTATING COMPONENTS (METRIC) GENERAL SPECIFICATION FOR
    SAE AS 13591 : 2001 CLEANING METHODS &PROCEDURES FOR BREATHING OXYGEN EQUIPMENT
    PD ES 59008-2:1999 Data requirements for semiconductor die Vocabulary
    ASTM E 2088 : 2006 : R2015 Standard Practice for Selecting, Preparing, Exposing, and Analyzing Witness Surfaces for Measuring Particle Deposition in Cleanrooms and Associated Controlled Environments
    ASTM E 1549/E1549M : 2013 : R2016 Standard Specification for ESD Controlled Garments Required in Cleanrooms and Controlled Environments for Spacecraft for Non-Hazardous and Hazardous Operations
    SAE ARP 599 : 2013 AEROSPACE - DYNAMIC TEST METHOD FOR DETERMINING THE RELATIVE DEGREE OF CLEANLINESS OF THE DOWNSTREAM SIDE OF FILTER ELEMENTS
    NASA KSC STD Z 0010 : 1983 DESIGN OF ENVIRONMENTAL CONTROL SYSTEMS, GROUND COOLANT SYSTEMS, COOLANT SERVICING SYSTEMS, AND GROUND SUPPORT EQUIPMENT, STANDARD FOR
    MIL-S-85333 Base Document:1979 SAFETY ARMING DEVICE MARK 33 MOD 1
    ASTM F 691 : 1980 : R1991 : EDT 1 Practice for Preparing Photoplates for Measuring Flatness Deviation (Withdrawn 1996)
    CEI EN 62258-1 : 2011 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
    ASTM F 863 : 1984 : R1992 : EDT 1 Practice for Detection of Defects in Spin-Coated Resist (Withdrawn 1996)
    ASTM F 864 : 1984 : R1992 Practice for Inspection of Hardsurface Glass Photoplates (Withdrawn 1996)
    ASTM F 890 : 1984 : R1992 Practice for Determining Pinhole Density in Photoresist Films Used in Microelectronic Device Processing (Withdrawn 1996)
    MIL B 197 : F INT AMD 2 BEARINGS, ANTIFRICTION, ASSOCIATED PARTS AND SUBASSEMBLIES, PREPARATION FOR DELIVERY OF
    BS PD ES 59008-5.2 : 2001 DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 5-2: PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE WITH ADDED CONNECTION STRUCTURES
    MIL-F-48388 Revision A:1985 FUZE, M934E6, LAUNCH SENSING SWITCH FOR
    MIL-B-81793 Revision D:1993 BEARING, BALL, PRECISION, FOR INSTRUMENTS AND ROTATING COMPONENTS
    ASTM F 849 : 1983 : R1988 Method for Identification and Test of Structures and Contaminants Seen on Polished Gadolinium Gallium Surfaces (Withdrawn 1992)
    MIL V 87255 : 0 VALVE, PRESSURE, ANTI-G SUIT, HIGH FLOW
    ASTM E 1731M : 1995 Standard Test Method for Gravimetric Determination of Nonvolatile Residue from Cleanroom Gloves [Metric] (Withdrawn 2000)
    ANSI INCITS 199 : 1991 : R2002 INFORMATION SYSTEMS - 356 MM OPTICAL DISK CARTRIDGE (WRITE-ONCE) - TEST METHODS FOR MEDIA CHARACTERISTICS
    ANSI INCITS 234 : 1993 INFORMATION SYSTEMS - TEST METHODS FOR MEDIA CHARACTERISTICS - 130 MM REWRITABLE OPTICAL DISK DATA STORAGE CARTRIDGES WITH CONTINUOUS COMPOSITE SERVO (CCS)
    ASTM E 2042/E2042M : 2009 : R2016 Standard Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms
    ASTM E 2900 : 2012 Standard Practice for Spacecraft Hardware Thermal Vacuum Bakeout
    ASTM E 1235 : 2012 : REDLINE Standard Test Method for Gravimetric Determination of Nonvolatile Residue (NVR) in Environmentally Controlled Areas for Spacecraft
    ASTM E 1235M : 1995 Test Method for Gravimetric Determination of Nonvolatile Residue (NVR) in Environmentally Controlled Areas for Spacecraft [Metric] (Withdrawn 2000)
    EN 14736:2004 Space product assurance - Quality assurance for test centres
    MIL-G-23083 Revision C:1972 GYROSCOPE, RATE SWITCHING MS 17399
    ASTM F 416 : 1994 Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)
    NASA KSC SO S 9 : 1993 RETEST AND REFURBISHMENT OF COMPRESSED GAS TRAILERS AND MOVABLE STORAGE UNITS, STANDARD FOR
    DEFSTAN 18-1/2(1990) : 1990 GUIDELINES AND STANDARDS FOR THE PROCUREMENT OF MILITARY SPACECRAFT SYSTEMS
    MIL R 39023 : A RESISTOR, VARIABLE, NON WIRE WOUND, PRECISION GENERAL SPECIFICATION FOR
    MIL-STD-977 Base Document:1982 TEST METHODS AND PROCEDURES FOR MICROCIRCUIT LINE CERTIFICATION
    SAE AIR 4728 : 2013 REFERENCES, SPACECRAFT AND SPACECRAFT SERVICING, FLUID SYSTEM COMPONENTS (ABBREVIATIONS, ACRONYMS, DEFINITIONS, APPLICABLE DOCUMENTS AND ENVIRONMENTAL CONDITIONS)
    ES 59008-5-1 : 2001 DATA REQUIREMENTS FOR SEMI-CONDUCTOR DIE - PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE
    MIL-STD-2111 Base Document:1979 TECHNICAL REPAIR STANDARDS, ELECTRONIC (2Z/4G/7Z/7G REPAIRABLES), PREPARATION OF
    ASTM E 1234 : 2012 : REDLINE Standard Practice for Handling, Transporting, and Installing Nonvolatile Residue (NVR) Sample Plates Used in Environmentally Controlled Areas for Spacecraft
    ASTM F 50 : 2012 Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles
    ASTM E 2352 : 2004 : R2010 Standard Practice for Aerospace Cleanrooms and Associated Controlled Environments-Cleanroom Operations
    IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
    BS EN 14736:2004 Space product assurance. Quality assurance for test centres

    Standards Referencing This Book - (Show below) - (Hide below)

    FED-STD-376 Revision B:1993 PREFERRED METRIC UNITS FOR GENERAL USE BY THE FEDERAL GOVERNMENT
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