BS EN 61337-1:2004
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Filters using waveguide type dielectric resonators Generic specification |
BS EN 60689:2009
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Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
12/30258507 DC : 0
|
BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 62884-3:2018
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods |
BS EN 62575-1:2016
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Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification |
DD IEC/TS 61994-2:2011
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Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric filters |
04/30111604 DC : 0
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IEC 61994-4-4 ED.1 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION GLOSSARY - PART 4-4: MATERIALS FOR SAW DEVICES |
15/30325282 DC : 0
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BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
DD IEC/TS 61994-4-1:2007
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Piezoelectric and dielectric devices for frequency control and selection. Glossary Piezoelectric materials. Synthetic quartz crystal |
17/30358131 DC : 0
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BS IEC 60122-4 ED.1.0 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 4: CRYSTAL UNITS WITH THERMISTORS |
BS EN 62884-1:2017
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
05/30132097 DC : DRAFT JUNE 2005
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IEC 60679-1 ED 3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60689:2009
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MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
CEI EN 60689 : 2009
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MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
I.S. EN IEC 63041-1:2018
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PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS |
I.S. EN 60679-1:2017
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PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN IEC 63041-1:2018
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Piezoelectric sensors - Part 1: Generic specifications |
I.S. EN 62575-1:2016
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RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 61253-1:1993
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Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval |
NF EN 60122-1 : 2003
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QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 60139:2000
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Preparation of outline drawings for cathode-ray tubes, their components, connections and gauges |
EN 61337-1:2004
|
Filters using waveguide type dielectric resonators - Part 1: Generic specification |
EN 61019-1 : 2005
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Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
EN 60689:2009
|
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
EN 62604-1:2015
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Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
15/30300738 DC : DRAFT MAY 2015
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BS EN 60027-2 ED 4.0 - LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
BS EN 169000:1993
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Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
BS EN 61338-1:2005
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Waveguide type dielectric resonators Generic specification |
03/103741 DC : DRAFT FEB 2003
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IEC 61338-1 ED.1 - WAVEGUIDE TYPE DIELECTRIC RESONATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
14/30282293 DC : 0
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BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BS EN 60862-1:2015
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Surface acoustic wave (SAW) filters of assessed quality Generic specification |
I.S. EN 61337-1:2005
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FILTERS USING WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1: GENERIC SPECIFICATION |
EN 62884-2:2017
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method |
EN 62884-1:2017
|
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
CEI EN 60679-1 : 2009
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PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60368-1:2000
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PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC TS 61994-2:2011
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Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters |
IEC TS 61994-1:2007
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Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators |
IEC TS 61994-4-4:2010
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Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices |
IEC 63041-2:2017
|
Piezoelectric sensors - Part 2: Chemical and biochemical sensors |
17/30337173 DC : 0
|
BS EN 62884-4 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 4: SHORT-TERM FREQUENCY STABILITY TEST METHODS |
BS EN 62604-1:2015
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Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification |
12/30252220 DC : DRAFT MAR 2012
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BS EN 62604-1 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 1: GENERIC SPECIFICATION |
BS EN 61019-1:2005
|
Surface acoustic wave (SAW) resonators Generic specification |
BS EN 60679-1:2017
|
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
DD IEC/TS 61994-4-4:2010
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Piezoelectric and dielectric devices for frequency control and selection. Glossary Materials Materials for surface acoustic wave (SAW) devices |
CEI EN 60368-1 : 2006
|
PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BIS IS/IEC 60862-1 : 2003
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SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BS EN 168000:1996
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Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units |
BS EN 60368-1:2000
|
Piezoelectric filters Generic specification |
06/30140677 DC : DRAFT SEP 2006
|
IEC TS 61994-4-3 ED.1 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 4-3: MATERIALS FOR DIELECTRIC DEVICES |
BS EN 62884-2:2017
|
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method |
BS EN 167000:1993
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Harmonized system of quality assessment for electronic components. Generic specification: piezoelectric filters |
I.S. EN IEC 63041-2:2018
|
PIEZOELECTRIC SENSORS - PART 2: CHEMICAL AND BIOCHEMICAL SENSORS |
CEI EN 60122-1 : 2004
|
QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 61338-1:2005
|
WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1: GENERIC SPECIFICATION |
I.S. EN 61019-1:2005
|
SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION |
IEC 63041-1:2017
|
Piezoelectric sensors - Part 1: Generic specifications |
I.S. EN 62884-1:2017
|
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
IEC 62884-1:2017
|
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
IEC 60679-1:2017
|
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
NF EN 60679-1 : 2013
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QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 60368-1:2000+AMD1:2004 CSV
|
Piezoelectric filters of assessed quality - Part 1: Genericspecification |
IEC 61337-1:2004
|
Filters using waveguide type dielectric resonators - Part 1: Generic specification |
IEC 62575-1:2015
|
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification |
00/201812 DC : DRAFT APR 2000
|
IEC 61994-4-1 TS/ED. 1 - GLOSSARY FOR PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - PART 4-1: SYNTHETIC QUARTZ CRYSTAL |
03/103740 DC : DRAFT FEB 2003
|
IEC 61337-1 ED.1 - FILTERS USING WAVEGUIDE TYPE DIELECTRIC RESONATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 62884-2:2017
|
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 2: PHASE JITTER MEASUREMENT METHOD |
09/30200793 DC : 0
|
BS EN 61994-2 ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 2: PIEZOELECTRIC AND DIELECTRIC FILTERS |
BS EN 60122-1 : 2002
|
QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 60679-1:2017
|
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
EN IEC 63041-2:2018
|
Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors |
IEC TS 61994-3:2011
|
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators |
IEC 62604-1:2015
|
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
IEC 60689:2008
|
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
IEC 61747-1:1998+AMD1:2003 CSV
|
Liquid crystal and solid-state display devices - Part 1: Generic specification |
IEC 60862-1:2015
|
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
IEC 61019-1:2004
|
Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
IEC 61338-1:2004
|
Waveguide type dielectric resonators - Part 1: Generic specification |
EN 60862-1:2015
|
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
11/30243576 DC : DRAFT FEB 2011
|
BS EN 62643-1 - ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
02/203179 DC : DRAFT FEB 2002
|
IEC 61994-3 TS. ED.1 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 3: PIEZOELECTRIC OSCILLATORS |
DD IEC/TS 61994-1:2007
|
Piezoelectric and dielectric devices for frequency control and selection. Glossary Piezoelectric and dielectric resonators |
02/206181 DC : DRAFT MAY 2002
|
IEC 61019-1. ED.1 - SURFACE ACOUSTIC WAVE RESONATORS (SAW) OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
10/30240248 DC : 0
|
BS EN 60862-1 - SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
15/30299203 DC : 0
|
BS EN 60500 ED 2.0 - UNDERWATER ACOUSTICS - HYDROPHONES - PROPERTIES OF HYDROPHONES IN THE FREQUENCY RANGE 1 HZ TO 500 KHZ |
EN IEC 62884-3:2018
|
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods |
I.S. EN 62604-1:2015
|
SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
CEI EN 62884-1 : 1ED 2018
|
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
I.S. EN 60122-1:2002 AMD 1 2018
|
QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60862-1:2015
|
SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC TS 61994-4-1:2007
|
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal |
EN 60122-1:2002/A1:2018
|
QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
EN 60368-1:2000/A1:2004
|
PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 62575-1:2016
|
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification |
EN 60139:2001
|
Preparation of outline drawings for cathode-ray tubes, their components, connections and gauges |
EN 61338-1:2005
|
Waveguide type dielectric resonators - Part 1: Generic specification |