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  • IEC 60122-1:2002

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Quartz crystal units of assessed quality - Part 1: Generic specification

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  09-12-2019

    Language(s):  English - French

    Published date:  09-08-2002

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    Specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.

    General Product Information - (Show below) - (Hide below)

    Committee TC 49
    Document Type Standard
    Product Note NEW CHILD AMD 1 2017 IS NOW ADDED.
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEC 63041-2:2017 Piezoelectric sensors - Part 2: Chemical and biochemical sensors
    BS EN 168200:1996 Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval)
    BS EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality Generic specification
    12/30258507 DC : 0 BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    BS EN 62575-1:2016 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
    13/30280840 DC : 0 BS EN 60758 - SYNTHETIC QUART CRYSTAL - SPECIFICATIONS AND GUIDELINES FOR THE USE
    03/108947 DC : DRAFT MAY 2003 IEC 60758 ED.3 - SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDE TO THE USE
    15/30325282 DC : 0 BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
    10/30240248 DC : 0 BS EN 60862-1 - SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    17/30358131 DC : 0 BS IEC 60122-4 ED.1.0 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 4: CRYSTAL UNITS WITH THERMISTORS
    BS EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
    NF EN 60444-11 : 2011 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
    I.S. EN 168000:1994 QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION)
    I.S. EN 60689:2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
    CEI EN 60689 : 2009 MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES
    I.S. EN 60444-8:2017 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
    I.S. EN IEC 63041-1:2018 PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS
    EN IEC 63041-1:2018 Piezoelectric sensors - Part 1: Generic specifications
    I.S. EN 62575-1:2016 RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    EN 61019-1 : 2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
    EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    EN 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
    EN 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    EN 60027-2:2007 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
    OVE/ONORM EN 60027-2 : 2007 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
    MIL-PRF-3098 Revision L:2017 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
    BS EN 60027-2:2007 Letter symbols to be used in electrical technology Telecommunications and electronics
    14/30282293 DC : 0 BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 62604-1:2015 SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 61019-1:2005 SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION
    EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    I.S. EN 60027-2:2007 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
    I.S. EN 60122-3:2010 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS
    IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
    IEC TS 61994-1:2007 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
    BS EN 60122-3:2010 Quartz crystal units of assessed quality Standard outlines and lead connections
    BS EN 61019-1:2005 Surface acoustic wave (SAW) resonators Generic specification
    BS EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
    07/30161553 DC : 0 BS EN 60758 - SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDE TO THE USE
    BIS IS/IEC 60862-1 : 2003 SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    BS EN 168000:1996 Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units
    I.S. EN 60679-1:2017 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN IEC 63041-2:2018 PIEZOELECTRIC SENSORS - PART 2: CHEMICAL AND BIOCHEMICAL SENSORS
    IEC 63041-1:2017 Piezoelectric sensors - Part 1: Generic specifications
    I.S. EN 62884-1:2017 MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
    IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    IEC 60027-2:2005 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
    IEC 62575-1:2015 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
    EN 60444-11:2010 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    CEI EN 60758 : 2010 SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDELINES FOR USE
    BS EN 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
    BS EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    08/30180527 DC : DRAFT JULY 2008 BS EN 60444-11 - MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
    12/30252220 DC : DRAFT MAR 2012 BS EN 62604-1 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 1: GENERIC SPECIFICATION
    BS EN 60758:2016 Synthetic quartz crystal. Specifications and guidelines for use
    BS EN 60444-11:2010 Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    BS EN 60444-8:2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
    CEI EN 60444-11 : 2011 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
    13/30283831 DC : 0 BS EN 60444-8:2003+A1 - MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
    NF EN 60027-2 : 2007 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS
    EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
    ISO 17859:2015 Fine ceramics (advanced ceramics, advanced technical ceramics) Measurement method of piezoelectric strain at high electric field
    EN IEC 63041-2:2018 Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors
    IEC 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    IEC 60689:2008 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
    IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    IEC 61019-1:2004 Surface acoustic wave (SAW) resonators - Part 1: Generic specification
    EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    09/30200785 DC : 0 BS EN 60122-3 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES AND LEAD CONNECTIONS
    I.S. EN 60758:2016 SYNTHETIC QUARTZ CRYSTAL - SPECIFICATIONS AND GUIDELINES FOR USE
    11/30243576 DC : DRAFT FEB 2011 BS EN 62643-1 - ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    BS ISO 17859:2015 Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method of piezoelectric strain at high electric field
    DD IEC/TS 61994-1:2007 Piezoelectric and dielectric devices for frequency control and selection. Glossary Piezoelectric and dielectric resonators
    I.S. EN 60862-1:2015 SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
    IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
    I.S. EN 60444-11:2010 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
    IEC 60444-11:2010 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
    EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
    EN 62575-1:2016 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
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