BS 9026:1970
|
Rules for the preparation of detail specifications for low noise signal amplifier tubes of assessed quality with integral permanent magnet focusing |
BS CECC 13000(1981) : 1981 AMD 7573
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - CAMERA TUBES |
BS EN 111000:1993
|
Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes |
BS EN 114000:1993
|
Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes |
BS CECC 12000(1981) : 1981 AMD 9605
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - IMAGE CONVERTER & IMAGE INTENSIFIER TUBES |
BS IEC 60748-2.11 : 1999
|
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR SINGLE SUPPLY INTEGRATED CIRCUIT, ELECTRICALLY ERASABLE, AND PROGRAMMABLE READ-ONLY MEMORY |
03/117620 DC : DRAFT NOV 2003
|
IEC 60747-1 ED.2 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES AND INTEGRATED CIRCUITS - PART 1: GENERAL |
BS EN 113000:1993
|
Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
BS QC 790105:1993
|
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories |
BS EN 165000-1:1996
|
Film and hybrid integrated circuits Generic specification. Capability approval procedure |
IEC 60747-1:2006+AMD1:2010 CSV
|
Semiconductor devices - Part 1: General |
BS IEC 60747-1 : 2006
|
SEMICONDUCTOR DEVICES - PART 1: GENERAL |
I.S. EN 136000:1994
|
MAGNETRONS (GENERIC SPECIFICATION) |
I.S. EN 114000:1994
|
GENERIC SPECIFICATION: PHOTOMULTIPLIER TUBES |
DEFSTAN 59-60(PT5)/2(1972) : 1972
|
VALVES, ELECTRONIC (ELECTRONIC TUBES) - PART 5: FORWARD TRAVELLING-WAVE AMPLIFIER TUBES |
BS CECC 11000(1980) : 1980 AMD 7600
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - CATHODE RAY TUBES |
EN 135000:1992
|
Generic Specification: Travelling wave amplifier tubes |
EN 114000:1991
|
Generic Specification: Photomultiplier tubes |
BS CECC 90000:1991
|
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
BS CECC 20000:1983
|
Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
BS CECC 90000:1985
|
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
EN 113000:1991
|
Generic Specification: Camera tubes |
BS IEC 60748-4:1997
|
Semiconductor devices. Integrated circuits Interface integrated circuits |
BS 9041:1978
|
Rules for the preparation of detail specifications for gas filled microwave switching tubes of assessed quality: tunable and broadband TR tubes and TR limiters. Full assessment level |
BS CECC14000(1984) : 1984 AMD 7575
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: PHOTOMULTIPLIER TUBES |
BS QC 790111:1993
|
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories |
BS PD IEC 62240 : 2001
|
USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURER'S SPECIFIED TEMPERATURE RANGES |
PD IEC/TR 62240:2005
|
Process management for avionics. Use of semiconductor devices outside manufacturers\' specified temperature range |
I.S. EN 135000:1994
|
TRAVELLING WAVE AMPLIFIER TUBES (GENERIC SPECIFICATION) |
BS CECC14001(1984) : 1984 AMD 7576
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: PHOTOMULTIPLIER TUBES |
BS 9054:1971
|
Rules for the preparation of detail specifications for radar display cathode ray tubes of assessed quality |
BS CECC 45000:1977
|
Specification for harmonized system of quality assessment for electronic components: generic specification: space-charge controlled tubes |
BS 6493-1.1:1984
|
Semiconductor devices. Discrete devices General |
IEC 60748-2-12:2001
|
Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs) |
BS CECC 63000:1990
|
Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
BS CECC 50000:1987
|
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
BS 9061:1971
|
Rules for the preparation of detail specifications for vidicon tubes of assessed quality electromagnetic focusing and scanning |
DEFSTAN 59-60(PT3)/2(1977) : 1977
|
VALVES, ELECTRONIC (ELECTRONIC TUBES) - PART 3: COUNTER, SELECTOR, AND INDICATOR TUBES |
BS CECC 13001(1981 : 1981 AMD 7574
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION - CAMERA TUBES |
BS EN 113001:1997
|
Harmonized system of quality assessment for electronic components. Blank detail specification: camera tubes |
BS IEC 60748-23-1:2002
|
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification |
NF EN 112000 : 2014
|
GENERIC SPECIFICATION: IMAGE CONVERTER AND IMAGE INTENSIFIER TUBES |
BS EN 120000:1996
|
Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices |
BS IEC 60748-2.12 : 2001
|
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR PROGRAMMABLE LOGIC DEVICES (PLDS) |
BS 9031:1971
|
Rules for the preparation of detail specifications for pulsed fixed-frequency magnetrons of assessed quality |
I.S. 604:1984
|
COLD CATHODE INDICATOR TUBES (GENERIC SPECIFICATION) |
BS 9018:1973
|
Rules for the preparation of detail specifications for pulse modulator hydrogen thyratrons of assessed quality |
BS 9027:1971
|
Rules for the preparation of detail specifications for forward travelling-wave power tubes of assessed quality |
BS 9064:1983
|
Sectional specification for circulators or isolators of assessed quality for capability approval |
BS 9300:1969
|
Specification for semiconductor devices of assessed quality: generic data and methods of test |
IEC TR 62240-1:2013
|
Process management for avionics - Electronic components capability in operation - Part 1: Temperature uprating |
IEC 60748-23-1:2002
|
Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification |
IEC TR 62240:2005
|
Process management for avionics - Use of semiconductor devices outside manufacturers' specified temperature range |
I.S. EN 113000:1994
|
GENERIC SPECIFICATION: CAMERA TUBES |
IEC 60748-4:1997
|
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
BS CECC36000(1978) : 1978 AMD 7581
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION: MAGNETRONS |
BS 9014:1974
|
Specification for pulse modulator hydrogen thyratron tubes of assessed quality: generic data and methods of test |
BS EN 112000:1997
|
Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes |
DIN IEC 60747-1:1987-03
|
SEMICONDUCTOR DEVICES; DISCRETE DEVICES AND INTEGRATED CIRCUITS; GENERAL |
BS EN 111001:1996
|
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: cathode ray tubes |
BS CECC35000(1978) : 1978 AMD 7881
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. GENERIC SPECIFICATION: TRAVELLING WAVE AMPLIFIER TUBES |
BS 9032:1975
|
Rules for the preparation of detail specifications for pulsed magnetrons (excluding frequency-agile magnetrons) of assessed quality. Basic assessment level |
GEIA 4900 : 2001
|
USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURERS' SPECIFIED TEMPERATURE RANGES |
BS CECC11001(1980) : 1980 AMD 9098
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: CATHODE RAY TUBES |
BS 9040:1978
|
Specification for gas-filled microwave switching tubes of assessed quality: generic data and methods of test |
BS EN 112001:1997
|
Harmonized system of quality assessment for electronic components. Blank detail specification: image converter and image intensifier tubes |
BS 9044:1971
|
Rules for the preparation of detail specifications for gas-filled microwave switching tubes of assessed quality: passive protection tubes |
DEFSTAN 59-60(PT5)SECE/1(1972) : 1972
|
VALVES, ELECTRONIC (ELECTRONIC TUBES) - PART 5: FORWARD TRAVELLING-WAVE AMPLIFIER TUBES - SECTION E: DETAIL SPECIFICATIONS |
I.S. EN 165000-1:1998
|
FILM AND HYBRID INTEGRATED CIRCUITS - PART 1: GENERIC SPECIFICATION CAPABILITY APPROVAL PROCEDURE |
I.S. EN 111000:1994
|
GENERIC SPECIFICATION: CATHODE RAY TUBES |
IEC PAS 62240:2001
|
Use of semiconductor devices outside manufacturers' specified temperature range |
EN 136000:1992
|
Generic Specification: Magnetrons |
BS CECC11101(1984) : 1984 AMD 9097
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: DISPLAY STORAGE TUBES |
BS 9052:1970
|
Rules for the preparation of detail specifications for general purpose professional instrument cathode ray tubes of assessed quality |
BS EN 111101:1996
|
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
PD IEC/TR 62240-1:2013
|
Process management for avionics. Electronic components capability in operation Temperature uprating |
BS 9043:1977
|
Rules for the preparation of detail specifications for gas filled microwave switching tubes of assessed quality: pre-TR tubes. Full assessment level |
BS EN 114001:1997
|
Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
DIN EN 190000:1996-05
|
GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS |
BS EN 190000:1996
|
Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
04/30122195 DC : DRAFT SEP 2004
|
IEC 60747-1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES AND INTEGRATED CIRCUITS - PART 1: GENERAL |
BS 9053:1973
|
Rules for the preparation of detail specifications for electrical charge storage display cathode ray tubes of assessed quality |
BS EN 136002:1996
|
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: CW magnetrons for RF heating or cooking applications |
BS CECC12001(1980) : 1980 AMD 7572
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: IMAGE CONVERTER AND IMAGE INTENSIFIER TUBES |
EN 111000:1991
|
Generic Specification: Cathode ray tubes |
EN 165000-1:1996
|
Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure |
EN 190000:1995
|
Generic Specification: Monolithic integrated circuits |
EN 112000:1992
|
Generic Specification: Image converter and image intensifier tubes |