FOREWORD
Clause
1 Scope and object
2 Normative references
3 General requirements
4 Resolution measurements
4.1 Energy resolution
4.2 Time resolution
4.3 Position, resolution and linearity of a
position-sensitive detector
5 Noise measurement
5.1 Noise measurement by pulse-height distribution
(preferred method)
5.2 Noise measurement by oscilloscope and true
root-mean-square voltmeter
5.3 Measurement of electronic noise with the detector
removed
5.4 Determination of detector contribution to noise and
resolution
5.5 Noise linewidth (FWHM) as a function of amplifier
shaping time index
6 Sensitivity to ambient conditions
6.1 Atmospheric sensitivity
6.2 Vacuum thermal cycle test
6.3 Mechanical and environmental tests
6.4 Light sensitivity
6.5 Radiation damage measurements
7 Other measurements
7.1 Current-voltage characteristics
7.2 Dead layer energy loss
7.3 Sensitive area
7.4 Detector thickness (transmission detectors)
7.5 Capacitance-voltage characteristics
Annexes
A Symbols and glossary
B General information concerning semiconductor
charged-particle detectors
C Bibliography