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  • IEC 60747-14-2:2000

    Current The latest, up-to-date edition.

    Semiconductor devices - Part 14-2: Semiconductor sensors - Hall elements

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English

    Published date:  09-11-2000

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 General
          1.1 Scope
          1.2 Normative references
          1.3 Definitions
          1.4 Symbols
    2 Essential ratings and characteristics
          2.1 General
          2.2 Ratings (limiting values)
          2.3 Characteristics
    3 Measuring methods
          3.1 General
          3.2 Output Hall voltage (VH)
          3.3 Offset voltage (Vo)
          3.4 Input resistance (Rin)
          3.5 Output resistance (Rout)
          3.6 Temperature coefficient of output Hall voltage
                 (aVH)
          3.7 Temperature coefficient of input resistance
                 (aRin)

    Abstract - (Show below) - (Hide below)

    Provides standards for packaged semiconductor Hall elements which utilize the Hall effect.

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    Committee TC 47/SC 47E
    Development Note Stability Date: 2017. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
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