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  • IEC 60747-15:2010

    Current The latest, up-to-date edition.

    Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English, English - French

    Published date:  16-12-2010

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    IEC 60747-15:2010 gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits. These requirements are additional to those given in other parts of IEC 60747 for the corresponding non-isolated power devices. The main changes with respect to previous edition are listed below.
    a) Clause 3, 4 and 5 were re-edited and some of them were combined to other sub clauses.
    b) Clause 6, 7 were re-edited as a part of "Measuring methods" with amendment of suitable addition and deletion.
    c) Clause 8 was amended by suitable addition and deletion.
    d) Annex C, D and Bibliography were deleted.


    This publication is to be read in conjunction with IEC 60747-1:2006.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47E
    Development Note To be read in conjunction with IEC 60747-1. (12/2010) Stability Date: 2018. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 61287-1:2014 Railway applications. Power converters installed on board rolling stock Characteristics and test methods
    UNE-EN 61287-1:2015 Railway applications - Power converters installed on board rolling stock - Part 1: Characteristics and test methods
    04/30114936 DC : DRAFT JUN 2004 EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES
    I.S. EN 61287-1:2014 RAILWAY APPLICATIONS - POWER CONVERTERS INSTALLED ON BOARD ROLLING STOCK - PART 1: CHARACTERISTICS AND TEST METHODS
    IEC 61287-1:2014 Railway applications - Power converters installed on board rolling stock - Part 1: Characteristics and test methods
    EN 61287-1:2014/AC:2014 RAILWAY APPLICATIONS - POWER CONVERTERS INSTALLED ON BOARD ROLLING STOCK - PART 1: CHARACTERISTICS AND TEST METHODS (IEC 61287-1:2014)

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60112:2003+AMD1:2009 CSV Method for the determination of the proof and the comparative tracking indices of solid insulating materials
    IEC 60270:2000+AMD1:2015 CSV High-voltage test techniques - Partial discharge measurements
    IEC 60747-7:2010 Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
    IEC 61287-1:2014 Railway applications - Power converters installed on board rolling stock - Part 1: Characteristics and test methods
    IEC 60749-21:2011 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
    IEC 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
    IEC 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
    IEC 60747-9:2007 Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
    IEC 60747-8:2010 Semiconductor devices - Discrete devices - Part 8: Field-effect transistors
    IEC 60749-15:2010 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
    IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
    IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations
    IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
    IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
    IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
    IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
    IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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