• IEC 60748-21:1997

    Current The latest, up-to-date edition.

    Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  10-04-1997

    Publisher:  International Electrotechnical Committee

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    CONTENTS
    FOREWORD
    Clause
    1. Scope and object
    2. General, preferred characteristics, ratings
         and severities for environmental tests
         2.1 Normative references
         2.2 Preferred ratings and characteristics
         2.3 Information to be given in a detail
              specification
    3. Qualification approval procedures
         3.1 Structural similarity
         3.2 Qualification approval
         3.3 Assessment levels
         3.4 Resubmission of rejected lots (for lot-by-lot
              inspection)
         3.5 Manufacturing stages in a factory of an approved
              manufacturer in a non-IEC member country
    4. Test and measurement procedures
    5. Tables of method B
    Tables
    1. Test schedule for qualification approval for method A
    2. Assessment levels and acceptance criteria for
         qualification approval for method A
    3. Assessment levels and acceptance criteria for quality
         conformance inspection for method A
    4. Screening
    5. Test schedule for qualification approval for method B
    6. Assessment levels and acceptance criteria for
         qualification approval for method B
    7. Assessment levels and acceptance criteria for quality
         conformance inspection for method B

    Abstract - (Show below) - (Hide below)

    Applies to film and hybrid film integrated circuits, manufactured as catalogue or as custom-built products whose quality is assessed on the basis of Qualification Approval. Presents preferred values for rating and characteristics, selects from the generic specification the appropriate tests and measuring methods and gives general performance requirements to be used in detail specifications for film and hybrid film integrated circuits.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47A
    Development Note Also numbered as BS QC760100(1997). (09/2003) Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS QC 760101:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
    BS QC 760200:1997 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
    IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60063:2015 Preferred number series for resistors and capacitors
    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective