I.S. EN 62506:2013
|
METHODS FOR PRODUCT ACCELERATED TESTING (IEC 62506:2013 (EQV)) |
IEC 60300-3-7:1999
|
Dependability management - Part 3-7: Application guide - Reliability stress screening of electronic hardware |
EN 62506 : 2013
|
METHODS FOR PRODUCT ACCELERATED TESTING (IEC 62506:2013) |
EN 62429:2008
|
Reliability growth - Stress testing for early failures in unique complex systems |
BS EN 61709:2017
|
Electric components. Reliability. Reference conditions for failure rates and stress models for conversion |
BS EN 62506:2013
|
Methods for product accelerated testing |
PD IEC/TR 62721:2012
|
Reliability of devices used in fibre optic systems. General and guidance |
BS EN 60300-2:2004
|
Dependability management Guidelines for dependability management |
NF EN 62429 : 2008
|
RELIABILITY GROWTH - STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS |
09/30184127 DC : 0
|
BS EN 61709 - ELECTRONIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION |
BS IEC 60300-3.7 : 1999
|
DEPENDABILITY MANAGEMENT - APPLICATION GUIDE - RELIABILITY STRESS SCREENING OF ELECTRONIC HARDWARE |
15/30310531 DC : 0
|
BS EN 61709 ED 3.0 - ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION |
EN 61709:2017
|
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
IEC TR 62721:2012
|
Reliability of devices used in fibre optic systems - General and guidance |
I.S. EN 60300-2:2004
|
DEPENDABILITY MANAGEMENT - PART 2: GUIDELINES FOR DEPENDABILITY MANAGEMENT |
CEI EN 62429 : 2008
|
RELIABILITY GROWTH - STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS |
BS EN 62429:2008
|
Reliability growth. Stress testing for early failures in unique complex systems |
IEC 61709:2017 RLV
|
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |
IEC 61709 : 3.0
|
ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION |
IEC 62506:2013
|
Methods for product accelerated testing |
CEI EN 62506 : 2014
|
METHODS FOR PRODUCT ACCELERATED TESTING |
CEI EN 60300-3-4 : 2010
|
DEPENDABILITY MANAGEMENT - PART 3-4: APPLICATION GUIDE - GUIDE TO THE SPECIFICATION OF DEPENDABILITY REQUIREMENTS |
CSA ISO/TR 10017 : 2003 : R2013
|
GUIDANCE ON STATISTICAL TECHNIQUES FOR ISO 9001:2000 |
I.S. EN 61709:2017
|
ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION |
S.R. ISO/TR 10017:2003
|
GUIDANCE ON STATISTICAL TECHNIQUES FOR ISO 9001:2000 |
UNE-EN 62429:2012
|
Reliability growth - Stress testing for early failures in unique complex systems |
IEC 60300-2:2004
|
Dependability management - Part 2: Guidelines for dependability management |
CSA ISO/TR 10017:2003
|
GUIDANCE ON STATISTICAL TECHNIQUES FOR ISO 9001:2000 |
PD ISO/TR 10017:2003
|
Guidance on statistical techniques for ISO 9001:2000 |
I.S. EN 62429:2008
|
RELIABILITY GROWTH - STRESS TESTING FOR EARLY FAILURES IN UNIQUE COMPLEX SYSTEMS |
ISO/TR 10017:2003
|
Guidance on statistical techniques for ISO 9001:2000 |
CEI 56-44 : 2000
|
DEPENDABILITY MANAGEMENT - PART 3-7: APPLICATION GUIDE - RELIABILITY STRESS SCREENING OF ELECTRONIC HARDWARE |
IEC 62429:2007
|
Reliability growth - Stress testing for early failures in unique complex systems |
EN 60300-2:2004
|
Dependability management - Part 2: Guidelines for dependability management |
IEC 61709:2017
|
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion |