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  • IEC 61671-2:2016

    Current The latest, up-to-date edition.

    Standard for automatic test markup language (ATML) instrument description

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English

    Published date:  08-04-2016

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    1 Overview
    2 Normative references
    3 Definitions, abbreviations, and acronyms
    4 InstrumentDescription schema
    5 InstrumentDescription instance schema
    6 ATML InstrumentDescription XML schema
      names and locations
    7 ATML XML schema extensibility
    8 Conformance
    Annex A (informative) - IEEE download Web site material
            associated with this document
    Annex B (informative) - Users information and examples
    Annex C (informative) - Glossary
    Annex D (informative) - Bibliography
    Annex E (informative) - IEEE List of Participants

    Abstract - (Show below) - (Hide below)

    IEC 61671-2:2016(E) defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.

    General Product Information - (Show below) - (Hide below)

    Development Note Also numbered as IEEE 1671.2. Stability date: 2021. (04/2016)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 1057-2007 REDLINE IEEE Standard for Digitizing Waveform Recorders
    IEEE 1155 : 1992 VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS
    TIA 232 : F1997(R2012) INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE
    IEEE 802.3-2012 IEEE Standard for Ethernet
    IEEE 1671.6-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
    IEEE 260.1 : 2004 LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS)
    MIL-PRF-55310 Revision E:2006 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
    MIL-STD-1309 Revision D:1992 DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT
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