BS EN 61967-8:2011
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Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method |
PD IEC/TR 61967-4-1:2005
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Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. 1 Ohm/150 Ohm direct coupling method. Application guidance to IEC 61967-4 |
EN 61000-4-20:2010
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ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
EN 62132-2:2011
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Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method |
EN 61967-5:2003
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method |
06/30152634 DC : DRAFT JULY 2006
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BS EN 61000-4-20:2003
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Electromagnetic Compatibility (EMC) Testing and measurement techniques. Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
CEI EN 61967-1 : 2002
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 1: GENERAL CONDITIONS AND DEFINITIONS |
I.S. EN 61967-8:2011
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD (IEC 61967-8:2011 (EQV)) |
CEI EN 61000-4-20 : 2013
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ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
EN IEC 62969-1:2018
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Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
CEI EN 61967-8 : 2012
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD |
BS ISO 18257:2016
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Space systems. Semiconductor integrated circuits for space applications. Design requirements |
09/30191126 DC : DRAFT FEB 2009
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BS EN 62132-8 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 8: MEASUREMENT OF RADIATED IMMUNITY - IC STRIP LINE METHOD |
BS EN 62132-2:2011
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Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. TEM cell and wideband TEM cell method |
I.S. EN 61967-5:2003
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 5: MEASUREMENT OF CONDUCTED EMISSIONS - WORKBENCH FARADAY CAGE METHOD |
IEC 62969-1:2017
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Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors |
NF EN 62132-2 : 2011
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 2: MEASUREMENT OF RADIATED IMMUNITY - TEM CELL AND WIDEBAND TEM CELL METHOD |
BS EN 61967-5:2003
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Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Workbench Faraday Cage method |
I.S. EN 62132-2:2011
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 2: MEASUREMENT OF RADIATED IMMUNITY - TEM CELL AND WIDEBAND TEM CELL METHOD |
ISO 18257:2016
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Space systems — Semiconductor integrated circuits for space applications — Design requirements |
I.S. EN 61000-4-20:2010
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ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES |
UNE-EN 61000-4-20:2011
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Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in Transverse Electromagnetic (TEM) waveguides - Basic EMC publication |
IEC 61000-4-20:2010
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Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides |
IEC 61967-1:2002
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions |
IEC 62132-2:2010
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Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method |
EN 61967-8 : 2011
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD |
16/30336986 DC : 0
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BS EN 62969-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS |
CEI EN 62132-2 : 2012
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INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY PART 2: MEASUREMENT OF RADIATED IMMUNITY - TEM CELL AND WIDEBAND TEM CELL METHOD |
06/30151320 DC : DRAFT JUN 2006
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BS IEC 62132-2 - INTEGRATED CIRCUITS, MEASUREMENT OF ELECTRO MAGNETIC IMMUNITY, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED 1 MM UNITY TEM-CELL AND WIDEBAND TEM-CELLMETHOD |
IEC TR 61967-4-1:2005
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Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4 |
IEC 61967-8:2011
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Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method |