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  • IEC 62215-3:2013

    Current The latest, up-to-date edition.

    Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  17-07-2013

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47A
    Development Note Stability date: 2021. (11/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 62228-2:2017 Integrated circuits. EMC evaluation of transceivers LIN transceivers
    CEI EN 62228-2 : 1ED 2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    I.S. EN 62228-2:2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    17/30350017 DC : 0 BS EN 62228-1 - INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 1: GENERAL CONDITIONS AND DEFINITIONS
    14/30310470 DC : 0 BS EN 62228-2 - INTEGRATED CIRCUITS - EMC EVALUATION OF LIN TRANSCEIVERS
    BS ISO 18257:2016 Space systems. Semiconductor integrated circuits for space applications. Design requirements
    ISO 18257:2016 Space systems — Semiconductor integrated circuits for space applications — Design requirements
    IEEE 802.3-2012 IEEE Standard for Ethernet
    IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
    ISO/IEC/IEEE 8802-3:2017 Information technology Telecommunications and information exchange between systems Local and metropolitan area networks Specific requirements Part 3: Standard for Ethernet
    IEC 62228-2:2016 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
    EN 62228-2:2017 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61000-4-4 : 3.0EN+(REDLINE+VERSION) ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-4: TESTING AND MEASUREMENT TECHNIQUES - ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST
    IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
    ISO 7637-2:2011 Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only
    IEC 61000-4-4:2012 RLV Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
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