• IEC 62528:2007

    Current The latest, up-to-date edition.

    Standard Testability Method for Embedded Core-based Integrated Circuits

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English

    Published date:  07-11-2007

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.

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    Development Note Also numbered as IEEE 1500. (11/2007) Stability Date: 2018. (12/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    I.S. EN 61069-1:2016 INDUSTRIAL-PROCESS MEASUREMENT, CONTROL AND AUTOMATION - EVALUATION OF SYSTEM PROPERTIES FOR THE PURPOSE OF SYSTEM ASSESSMENT - PART 1: TERMINOLOGY AND BASIC CONCEPTS
    IEC 61069-1:2016 Industrial-process measurement, control and automation - Evaluation of system properties for the purpose of system assessment - Part 1: Terminology and basic concepts
    EN 61069-1:2016 Industrial-process measurement, control and automation - Evaluation of system properties for the purpose of system assessment - Part 1: Terminology and basic concepts

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 1149.1-2013 REDLINE IEEE Standard for Test Access Port and Boundary-Scan Architecture
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