• IEC PAS 60679-6:2008

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  14-03-2011

    Language(s):  English

    Published date:  27-02-2008

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions, glossary and general terms
    4 Measurement method
      4.1 Frequency range and the measurement method
      4.2 Method of using the phase noise measurement value
      4.3 Measurement method for the use of the specially
          designed measurement equipment
      4.4 Block diagram of the measurement
      4.5 Input and output impedance of the measurement system
      4.6 Measurement equipment
      4.7 Test fixture
      4.8 Cable, tools and instruments, etc.
    5 Measurement and the measurement environment
      5.1 Set-up before taking measurements
      5.2 Points to be considered and noted at the time of
          measurement
      5.3 Treatment after the measurement
    6 Measurement
      6.1 Reference temperature
      6.2 Measurement of temperature characteristics
      6.3 Measurement under vibration
      6.4 Measurement at the time of impact
      6.5 Measurement in accelerated ageing
    7 Other points to be noted
    8 Miscellaneous
    Annex A (normative) - Calculation method for the amount
            of phase jitter
      A.0 Introduction
      A.1 Explanation
      A.2 Relations between phase noise and phase jitter
      A.3 Commentary
          A.3.1 History of establishment and points to note
          A.3.2 Theoretical positioning of phase jitter
      A.4 Description
          A.4.1 RMS jitter
          A.4.2 Peak-to-peak jitter
          A.4.3 Random jitter
          A.4.4 Deterministic jitter
          A.4.5 Period (periodic) jitter
          A.4.6 Data-dependent jitter
          A.4.7 Total jitter
      A.5 Points to be considered for measurement
          A.5.1 Measurement equipment
          A.5.2 Factors of measurement errors
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.

    General Product Information - (Show below) - (Hide below)

    Document Type Miscellaneous Product
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
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