• IEC TS 62607-2-1:2012

    Current The latest, up-to-date edition.

    Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English

    Published date:  29-05-2012

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Terms, definitions, acronyms and
      abbreviations
    3 Sample preparation methods
    4 Measurement of sheet resistance of
      SWCNT or MWCNT films
    5 Data analysis/Interpretation of results
    Annex A (informative) - Case study
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC/TS 62607-2-1:2012(E) which is a technical specification, provides a standardized method for categorizing a grade of commercial carbon nanotubes in terms of their electrical properties to enable a user to select a carbon nanotube material suitable for his application. The method is intended to assess whether the delivered materials from different production batches of the same production process are comparable regarding electrical properties of the final product which are related to electrical conductivity. The correlation between the measured parameters by the proposed method and a relevant product performance parameter has to be established for every application. This specification includes:
    - definitions of terminology used in this document,
    - recommendations for sample preparation,
    - outlines of the experimental procedures to measure sheet resistance of carbon nanotubes in thin films,
    - methods of interpretation of results and discussion of data analysis,
    - case studies and,
    - references.

    General Product Information - (Show below) - (Hide below)

    Document Type Technical Specification
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    PD IEC/TR 62834:2013 IEC nanoelectronics standardization roadmap
    IEC TS 62844:2016 Guidelines for quality and risk assessment for nano-enabled electrotechnical products
    17/30355474 DC : 0 BS IEC 62899-202-3 ED.1.0 - PRINTED ELECTRONICS - PART 202-3: MATERIALS - CONDUCTIVE INK - MEASUREMENT OF SHEET RESISTANCE OF CONDUCTIVE FILMS (CONTACTLESS METHOD)
    IEC TR 62834:2013 IEC nanoelectronics standardization roadmap

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO/TS 80004-3:2010 Nanotechnologies Vocabulary Part 3: Carbon nano-objects
    IEC 62624:2009 Test methods for measurement of electrical properties of carbon nanotubes
    SEMI MF374 :2012(R2018) TEST METHOD FOR SHEET RESISTANCE OF SILICON EPITAXIAL, DIFFUSED, POLYSILICON, AND ION-IMPLANTED LAYERS USING AN IN-LINE FOUR-POINT PROBE WITH THE SINGLE-CONFIGURATION PROCEDURE
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