• IEEE 1057-2007 REDLINE

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    IEEE Standard for Digitizing Waveform Recorders

    Available format(s):  PDF

    Superseded date:  02-03-2022

    Language(s):  English

    Published date:  18-04-2008

    Publisher:  Institute of Electrical & Electronics Engineers

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    Table of Contents - (Show below) - (Hide below)

    1 Overview
    2 Normative references
    3 Definitions
    4 Test parameters and methods
    5 Input impedance
    6 Static gain and offset
    7 Linearity
    8 Noise
    9 Step response parameters
    10 Frequency response parameters
    11 Interchannel parameters
    12 Time base parameters
    13 Out-of-range recovery
    14 Word error rate
    15 Differential input specifications
    16 Cycle time
    17 Triggering
    Annex A (informative) - Sine fitting algorithms
    Annex B (informative) - Phase noise
    Annex C (informative) - Comment on errors associated with
            word-error-rate measurement
    Annex D (informative) - Measurement of randaom noise below
            the quantization level
    Annex E (informative) - Software consideration
    Annex F (informative) - Excitation with precision source with ramp
            verneir: determination of the test parameters
    Annex G (informative) - Presentation of sine wave data
    Annex H (informative) - Bibliography

    Abstract - (Show below) - (Hide below)

    This standard defines specifications and describes test methods for measuring the performance of electronic digitizing waveform recorders, waveform analyzers, and digitizing oscilloscopes with digital outputs.

    General Product Information - (Show below) - (Hide below)

    Committee TC10 - Waveform Generation Measurement and An
    Development Note Supersedes IEEE DRAFT 1057. (09/2008)
    Document Type Standard
    Publisher Institute of Electrical & Electronics Engineers
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    ANSI INCITS TR 35 : 2004 : R2009 INFORMATION TECHNOLOGY - FIBRE CHANNEL - METHODOLOGIES FOR JITTER AND SIGNAL QUALITY SPECIFICATION (FC-MJSQ)
    CEI EN 62008 : 2006 PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE
    IEEE DRAFT 1241 : D1.1 2001 DRAFT STANDARD FOR TERMINOLOGY AND TEST METHODS FOR ANALOG-TO-DIGITAL CONVERTERS
    DKD-R 3-1-1 : 2010 KALIBRIERUNG VON BESCHLEUNIGUNGSMESSGERAETEN NACH DEM VERGLEICHSVERFAHREN - BLATT 1: GRUNDLAGEN
    EN 62008:2005 Performance characteristics and calibration methods for digital data acquisition systems and relevant software
    IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
    BS IEC 61671-2:2016 Standard for automatic test markup language (ATML) instrument description
    IEEE 1139-2008 IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities
    ANSI INCITS TR 35 : 2004 INFORMATION TECHNOLOGY - FIBRE CHANNEL - METHODOLOGIES FOR JITTER AND SIGNAL QUALITY SPECIFICATION (FC-MJSQ)
    BS EN 62008:2005 Performance characteristics and caliberation for digital data acquisition systems and relevant software
    CAN/CSA-ISO/IEC TR 14165-117-08 (R2018) Information technology - Fibre channel - Part 117: Methodologies for jitter and signal quality (MJSQ) (Adopted ISO/IEC TR 14165-117:2007, edition 1.0, 2007-09)
    ANSI INCITS TR 35 : 2004 : R2014 INFORMATION TECHNOLOGY - FIBRE CHANNEL - METHODOLOGIES FOR JITTER AND SIGNAL QUALITY SPECIFICATION (FC-MJSQ)
    I.S. EN 62008:2005 PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE
    IEEE 1658-2011 IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
    DKD-R 3-1-3 : 2003 KALIBRIERUNG VON BESCHLEUNIGUNGSMESSGERAETEN NACH DEM VERGLEICHSVERFAHREN - TEIL 3: SINUS- UND MULTISINUS-ANREGUNG
    BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
    IEC 62754:2017 Computation of waveform parameter uncertainties
    03/100280 DC : DRAFT FEB 2003 IEC 62008 ED.1 - PERFORMANCE CHARACTERISTICS AND CALIBRATION METHODS FOR DIGITAL DATA ACQUISITION SYSTEMS AND RELEVANT SOFTWARE
    EN 62754:2017 Computation of waveform Parameter uncertainties
    IEEE 1871.1-2014 IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
    13/30261629 DC : 0 BS EN 62792 - ELECTROSHOCK WEAPON MEASUREMENT METHOD
    IEEE 1671.2-2012 IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
    IEEE 1696-2013 IEEE Standard for Terminology and Test Methods for Circuit Probes
    CSA ISO/IEC TR 14165-117 : 2008 : R2013 INFORMATION TECHNOLOGY - FIBRE CHANNEL - PART 117: METHODOLOGIES FOR JITTER AND SIGNAL QUALITY (MJSQ)
    IEC 62008:2005 Performance characteristics and calibration methods for digital data acquisition systems and relevant software
    BS EN 62754:2017 Computation of waveform parameter uncertainties
    IEC 61671-2:2016 Standard for automatic test markup language (ATML) instrument description
    ISO/IEC TR 14165-117:2007 Information technology Fibre Channel Part 117: Methodologies for jitter and signal quality (MJSQ)
    I.S. EN 62754:2017 COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES
    IEC 62792:2015 Measurement method for the output of electroshock weapons

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 181-2003 IEEE Standard on Transitions, Pulses, and Related Waveforms
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