ISO 19830:2015
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Surface chemical analysis Electron spectroscopies Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy |
BS ISO 18516:2006
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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution |
BS ISO 15471:2004
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Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters |
ISO 20903:2011
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Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results |
ASTM E 1016 : 2007 : R2012 : EDT 1
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Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers |
ISO 18516:2006
|
Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Determination of lateral resolution |
BS ISO 10810:2010
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Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis |
PD ISO/TR 18196:2016
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Nanotechnologies. Measurement technique matrix for the characterization of nano-objects |
ISO 10810:2010
|
Surface chemical analysis X-ray photoelectron spectroscopy Guidelines for analysis |
ISO 13424:2013
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Surface chemical analysis X-ray photoelectron spectroscopy Reporting of results of thin-film analysis |
ASTM E 2735 : 2014 : REDLINE
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Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments |
ASTM E 902 : 2005
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Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers (Withdrawn 2011) |
05/30124112 DC : DRAFT JULY 2005
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ISO 20903 - SURFACE CHEMICAL ANALYSIS - AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY - METHODS USED TO DETERMINE PEAK INTENSITIES AND INFORMATION REQUIRED WHEN REPORTING RESULTS |
BS ISO 18118:2015
|
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials |
BS ISO 13424:2013
|
Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis |
11/30230635 DC : 0
|
BS ISO 16129 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - PROCEDURES FOR ASSESSING THE DAY-TO-DAY PERFORMANCE OF AN X-RAY PHOTOELECTRON SPECTROMETER |
BS ISO 19830:2015
|
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy |
ISO 15471:2016
|
Surface chemical analysis Auger electron spectroscopy Description of selected instrumental performance parameters |
PD ISO/TS 14101:2012
|
Surface characterization of gold nanoparticles for nanomaterial specific toxicity screening: FT-IR method |
18/30368969 DC : 0
|
BS ISO 16129 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - PROCEDURES FOR ASSESSING THE DAY-TO-DAY PERFORMANCE OF AN X-RAY PHOTOELECTRON SPECTROMETER |
09/30191895 DC : 0
|
BS ISO 10810 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - GUIDELINES FOR ANALYSIS |
ISO/TS 14101:2012
|
Surface characterization of gold nanoparticles for nanomaterial specific toxicity screening: FT-IR method |
ISO/TR 18196:2016
|
Nanotechnologies — Measurement technique matrix for the characterization of nano-objects |
ASTM E 1016 : 2007
|
Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers |
BS ISO 16129:2012
|
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer |
BS ISO 20903:2011
|
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results |
ISO 16129:2012
|
Surface chemical analysis X-ray photoelectron spectroscopy Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer |
ISO 18118:2015
|
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials |