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  • ISO 24236:2005

    Current The latest, up-to-date edition.

    Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English, French

    Published date:  19-04-2005

    Publisher:  International Organization for Standardization

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    Abstract - (Show below) - (Hide below)

    ISO 24236:2005 specifies a method for evaluating the constancy and repeatability of the intensity scale of Auger electron spectrometers, for general analytical purposes, using an electron gun with a beam energy of 2 keV or greater. It is only applicable to instruments that incorporate an ion gun for sputter cleaning. It is not intended to be a calibration of the intensity/energy response function. That calibration may be made by the instrument manufacturer or other organization. The present procedure provides data to evaluate and confirm the accuracy with which the intensity/energy response function remains constant with instrument usage. Guidance is given on some of the instrumental settings that may affect this constancy.

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    Development Note Supersedes ISO/DIS 24236 (04/2005)
    Document Type Standard
    Publisher International Organization for Standardization
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    ISO/TR 10993-22:2017 Biological evaluation of medical devices — Part 22: Guidance on nanomaterials
    BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
    ISO 20903:2011 Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results
    ASTM E 1016 : 2007 : R2012 : EDT 1 Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
    ISO 23830:2008 Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
    05/30124112 DC : DRAFT JULY 2005 ISO 20903 - SURFACE CHEMICAL ANALYSIS - AUGER ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON SPECTROSCOPY - METHODS USED TO DETERMINE PEAK INTENSITIES AND INFORMATION REQUIRED WHEN REPORTING RESULTS
    ISO 15471:2016 Surface chemical analysis Auger electron spectroscopy Description of selected instrumental performance parameters
    ASTM E 1016 : 2007 Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
    PD ISO/TR 10993-22:2017 Biological evaluation of medical devices Guidance on nanomaterials
    BS ISO 23830:2008 Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
    BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 18118:2015 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
    ISO 7873:1993 Control charts for arithmetic average with warning limits
    ISO 15472:2010 Surface chemical analysis X-ray photoelectron spectrometers Calibration of energy scales
    ISO 17973:2016 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
    ISO 7870:1993 Control charts General guide and introduction
    ISO 17974:2002 Surface chemical analysis High-resolution Auger electron spectrometers Calibration of energy scales for elemental and chemical-state analysis
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