MIL-STD-704 Revision F:2004
|
AIRCRAFT ELECTRIC POWER CHARACTERISTICS |
MIL-STD-883 Revision K:2016
|
TEST METHOD STANDARD - MICROCIRCUITS |
MIL-STD-810 Revision G:2008
|
ENVIRONMENTAL ENGINEERING CONSIDERATIONS AND LABORATORY TESTS |
MIL-STD-1130 Revision C:2012
|
Connections, Electrical, Solderless Wrapped |
MIL-STD-1686 Revision C:1995
|
ELECTROSTATIC DISCHARGE CONTROL PROGRAM FOR PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS, ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES) |
MIL M 7793 : F
|
METER, TIME TOTALIZING |
MIL E 5400 : T
|
ELECTRONIC EQUIPMENT, AEROSPACE, GENERAL SPECIFICATION FOR |
MIL-C-6781 Revision B:1960
|
CONTROL PANEL, AIRCRAFT EQUIPMENT, RACK OR CONSOLE MOUNTED |
MIL-T-43435 Revision B:1974
|
TAPE, LACING, AND TYING |
MIL-STD-1562 Revision W:1991
|
LISTS OF STANDARD MICROCIRCUITS |
MIL-L-85762 Revision A:1988
|
LIGHTING, AIRCRAFT, INTERIOR, NIGHT VISION |
MIL F 14072 : D
|
FINISHES FOR GROUND BASED ELECTRONIC EQUIPMENT |
MIL-STD-461 Revision G:2015
|
REQUIREMENTS FOR THE CONTROL OF ELECTROMAGNETIC INTERFERENCE CHARACTERISTICS OF SUBSYSTEMS AND EQUIPMENT |
MIL-STD-252 Revision B:1970
|
CLASSIFICATION OF VISUAL AND MECHANICAL DEFECTS FOR EQUIPMENT, ELECTRONIC, WIRED, AND OTHER DEVICES |
MIL-STD-1472 Revision G:2012
|
HUMAN ENGINEERING |
MIL-STD-462 Revision D:1993
|
MEASUREMENT OF ELECTROMAGNETIC INTERFERENCE CHARACTERISTICS |
MIL T 713 : E
|
TWINE, FIBROUS, IMPREGNATED, LACING AND TYING |
MIL-C-172 Revision C:1958
|
CASES: BASES, MOUNTING & MOUNTS, VIBRATION (FOR USE WITH ELECTRONIC EQUIPMENT) |
MIL P 55110 : LATEST
|
PRINTED WIRING BOARD, RIGID GENERAL SPECIFICATION FOR |
MIL-B-5087 Revision B:1964
|
BONDING, ELECTRICAL AND LIGHTING PROTECTION, FOR AEROSPACE SYSTEMS |
MIL-STD-105 Revision E:1989
|
SAMPLING PROCEDURES AND TABLES FOR INSPECTION BY ATTRIBUTES |
MIL-STD-781 Revision D:1986
|
RELIABILITY TESTING FOR ENGINEERING DEVELOPMENT, QUALIFICATION AND PRODUCTION |
MIL-M-13231 Revision C:1988
|
MARKING OF ELECTRONIC ITEMS |
MIL-P-11268 Revision L:1983
|
PART, MATERIALS, AND PROCESSES USED IN ELECTRONIC EQUIPMENT |