Development Note
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New child NOT 1 2022 is added |
Document Type
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Standard |
ISBN
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Pages
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Product Note
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New child NOT 1 2022 is added |
Published
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Publisher
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US Military Specs/Standards/Handbooks
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Status
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Current |
Supersedes
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MIL-STD-750 Revision F:2011
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TEST METHODS FOR SEMICONDUCTOR DEVICES |
MIL-PRF-39016-36 Revision C:2006
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Relays, Electromagnetic, Established Reliability, Hermetically Sealed, 4PDT, Low Level to 2 Amperes (.150-Inch Terminal Spacing), Latching, with Internal Diodes for Coil Transient Suppression and Reverse Polarity Protection |
MIL-PRF-39016 Revision H:2017
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Relays, Electromagnetic, Established Reliability, General Specification for |
MIL-STD-1285 Revision D:2004
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MARKING OF ELECTRICAL AND ELECTRONIC PARTS |
MIL-STD-202-214 Base Document:2015
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METHOD 214, RANDOM VIBRATION |
MIL-STD-202-204 Base Document:2015
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METHOD 204, VIBRATION, HIGH FREQUENCY |
MIL-STD-202-213 Base Document:2015
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METHOD 213, SHOCK (SPECIFIED PULSE) |
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