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  • MIL-STD-750-1 Revision A:2015

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999

    Available format(s):  PDF

    Superseded date:  23-06-2020

    Language(s):  English

    Published date:  11-12-2015

    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    SUMMARY OF REVISION A MODIFICATIONS
    1. SCOPE
    2. APPLICABLE DOCUMENTS
    3. DEFINITIONS
    4. GENERAL REQUIREMENTS
    5. DETAILED REQUIREMENTS
    6. NOTES
    CONCLUDING MATERIAL

    Abstract - (Show below) - (Hide below)

    Determines uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations.

    Scope - (Show below) - (Hide below)

    Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term \"devices\" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

    General Product Information - (Show below) - (Hide below)

    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    MIL STD 750-2 : A MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES - PART 2: TEST METHODS 2001 THROUGH 2999
    MIL-PRF-28776 Revision H:2017 Relays, Hybrid, Established Reliability, General Specification for

    Standards Referencing This Book - (Show below) - (Hide below)

    ASTM E 720 : 2016 : REDLINE Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    ASTM D 1120 : 2017 : REDLINE Standard Test Method for Boiling Point of Engine Coolants
    MIL-STD-1686 Revision C:1995 ELECTROSTATIC DISCHARGE CONTROL PROGRAM FOR PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS, ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES)
    ASTM E 265 : 2015 : REDLINE Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
    MIL-HDBK-781 Revision A:1996 RELIABILITY TEST METHODS, PLANS, AND ENVIRONMENTS FOR ENGINEERING DEVELOPMENT, QUALIFICATION AND PRODUCTION
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    ISO/ASTM 51275:2013 Practice for use of a radiochromic film dosimetry system
    MIL-PRF-680 Revision C:2010 DEGREASING SOLVENT
    ASTM E 721 : 2016 : REDLINE Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
    IPC J STD 004 : B REQUIREMENTS FOR SOLDERING FLUXES
    ASTM E 722 : 2014 : REDLINE Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
    ASTM D 1331 : 2014 : REDLINE Standard Test Methods for Surface and Interfacial Tension of Solutions of Paints, Solvents, Solutions of Surface-Active Agents, and Related Materials
    ASTM E 668 : 2013 : REDLINE Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
    ASTM E 1249 : 2015 : REDLINE Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
    ASTM E 1250 : 2015 : REDLINE Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
    MIL STD 750-2 : A MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES - PART 2: TEST METHODS 2001 THROUGH 2999
    TT-I-735 Revision A:1963 ISOPROPYL ALCOHOL
    MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
    ASTM E 666 : 2014 : REDLINE Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
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