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  • MIL-STD-883 Revision K:2016

    View superseded by
    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    TEST METHOD STANDARD - MICROCIRCUITS

    Available format(s):  PDF

    Superseded date:  17-07-2021

    Language(s):  English

    Published date:  03-05-2018

    Publisher:  US Military Specs/Standards/Handbooks

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    Table of Contents - (Show below) - (Hide below)

    1. SCOPE
    2. APPLICABLE DOCUMENTS
    3. ABBREVIATIONS, SYMBOLS, AND DEFINITIONS
    4. GENERAL REQUIREMENTS
    5. DETAIL REQUIREMENTS
    6. NOTES

    Abstract - (Show below) - (Hide below)

    Sets up uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices.

    General Product Information - (Show below) - (Hide below)

    Committee FSC 5962
    Document Type Test Method
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    DOD-C-24529 Base Document:1976 CHARGERS, BATTERY, LIFT TRUCK AND PALLET TRANSPORTER BATTERY SERVICE (METRIC)
    I.S. EN IEC 60810:2018 LAMPS, LIGHT SOURCES AND LED PACKAGES FOR ROAD VEHICLES - PERFORMANCE REQUIREMENTS
    MIL-M-38510-763 Revision B:2005 MICROCIRCUITS, DIGITAL, ADVANCED CMOS, COUNTERS, MONOLITHIC SILICON, POSITIVE LOGIC
    MIL-M-38510-655 Revision A:2005 MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, BUS TRANSCEIVERS WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
    MIL-M-38510-345 Revision C:2004 Microcircuits, Digital, Bipolar Advanced Schottky TTL, Exclusive or Gates, Monolithic Silicon
    MIL C 83383 : C CIRCUIT BREAKER, REMOTE CONTROL THERMAL, TRIP FREE, GENERAL SPECIFICATION FOR
    AFGS-87213 Revision B:1993 DISPLAYS, AIRBORNE, ELECTRONICALLY/OPTICALLY GENERATED
    MIL-M-38510-203 Revision E:2007 MICROCIRCUITS, DIGITAL, 1024 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON
    IEC 62396-1:2016 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
    DD IEC TS 62396-1 : DRAFT JUL 2006 PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
    DSCC 10018 : A FILTER, EMI, HYBRID, 15 AMP
    MIL-PRF-32140 Base Document:2004 RELAYS, ELECTROMAGNETIC, RADIO FREQUENCY, ESTABLISHED RELIABILITY, - GENERAL SPECIFICATION FOR
    BS EN 16602-60-15:2014 Space product assurance. Radiation hardness assurance. EEE components
    MIL-M-38510-211 Base Document:1987 MICROCIRCUITS, DIGITAL, 32,768 BIT SCHOTTKY, BIPOLAR, PROGRAMMABLE READ-ONLY MEMORY (PROM), MONOLITHIC SILICON
    MIL-M-38510-289 Revision A:2006 MICROCIRCUITS, DIGITAL, CMOS 4096 BIT STATIC RANDOM ACCESS MEMORY (RAM) MONOLITHIC SILICON
    SAE AS 6294/1 : 2017 REQUIREMENTS FOR PLASTIC ENCAPSULATED MICROCIRCUITS IN SPACE APPLICATIONS
    I.S. EN 16602-60-13:2015 SPACE PRODUCT ASSURANCE - REQUIREMENTS FOR THE USE OF COTS COMPONENTS
    MIL-R-29583 Base Document:1992 RADIO SET
    MIL-M-38510-26 Revision B:2005 MICROCIRCUITS, DIGITAL, TTL, LOW POWER, EXCLUSIVE-OR GATES, MONOLITHIC SILICON
    ANSI/AAMI CI86:2017 COCHLEAR IMPLANT SYSTEMS: REQUIREMENTS FOR SAFETY, FUNCTIONAL VERIFICATION, LABELING AND RELIABILITY REPORTING
    MIL-STD-1580 Revision B:2003 DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
    18/30373170 DC : 0 BS EN 62668-2 - PROCESS MANAGEMENT FOR AVIONICS - COUNTERFEIT PREVENTION - PART 2: MANAGING ELECTRONIC COMPONENTS FROM NON-FRANCHISED SOURCES
    MIL-R-83726-24 Revision M:2016 RELAYS, SOLID STATE, TIME DELAY (ON OPERATE), TRACK MOUNTED, TYPE 1, CLASS C, SPST, 150 MILLIAMPERES, FIXED TIME, 50 MILLISECONDS TO 500 SECONDS
    MIL L 24554 : 0 LAMPS MK III INTERFACE SIGNAL SWITCHING SET
    DSCC 98026 : C FILTER, EMI, HYBRID
    15/30324422 DC : 0 BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT
    SAE AS 1145 : 2016 AIRCRAFT BRAKE TEMPERATURE MONITOR SYSTEMS (BTMS)
    DSCC 13010 : A FILTER, EMI, HYBRID, 28 V DC
    DSCC SMD 5962-89855 : 0 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ONE TIME PROGRAMMABLE, ASYNCHRONOUS REGISTERED PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
    MIL-PRF-32535 Revision A:2017 Capacitor, Chip, Fixed, Ceramic Dielectric (Temperature Stable and General Purpose), Extended Range, High Reliability and Standard Reliability, General Specification for
    DSCC SMD 5962-90993 : F MICROCIRCUIT, LINEAR, OPERATIONAL AMPLIFIER, HIGH SPEED, PROGRAMMABLE SUPPLY CURRENT, MONOLITHIC SILICON
    DOD-STD-2000-4 Revision A:1987 GENERAL PURPOSE SOLDERING REQUIREMENT FOR ELECTRICAL AND ELECTRONIC EQUIPMENT
    DSCC 85092 : G RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
    GEIA TA HB 0009 : 2013 RELIABILITY PROGRAM HANDBOOK
    MIL H 38534 : B (1) HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR
    MIL-M-38510-342 Revision A:2004 Microcircuits, Digital, Bipolar, Advanced Schottky TTL, 4-Bit Binary Full Adders with Fast Carry, Monolithic Silicon
    BS EN 16602-70-08:2015 Space product assurance. Manual soldering of high-reliability electrical connections
    CEI 56-44 : 2000 DEPENDABILITY MANAGEMENT - PART 3-7: APPLICATION GUIDE - RELIABILITY STRESS SCREENING OF ELECTRONIC HARDWARE
    MIL-A-24726 Base Document:1989 ATTENUATORS, FIBER OPTIC, SHIPBOARD GENERAL SPECIFICATION FOR
    DSCC 09027 : 0 CAPACITORS, FIXED, CERAMIC, CHIP, TIGHT TOLERANCE, THIN FILM, 1210
    MIL P 24765 : 0 POWER SUPPLY, UNINTERRUPTIBLE, STATIC
    SAE AS 6294/2 : 2018 REQUIREMENTS FOR PLASTIC ENCAPSULATED MICROCIRCUITS IN MILITARY AND AVIONICS APPLICATIONS
    MIL-A-85055 Base Document:1979 AVIONICS SYSTEM PERFORMANCE SPECIFICATION FOR A-4M/AV-8 BOMBING SET, ANGLE RATE AN/ASB-19(V)
    MIL P 49146 : B POWER SUPPLY 18 MILLIMETER, MICROCHANNEL WAFER
    DSCC 95004 : J FILTER, EMI, HYBRID
    MIL-M-38510-55 Revision G:2005 MICROCIRCUITS, DIGITAL, CMOS, BUFFER/CONVERTER, TRUE/COMPLIMENT BUFFER, MONOLITHIC SILICON
    MIL-M-38510-323 Revision D:2003 Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Quadruple Bus Buffer Gates with Three State Outputs, Monolithic Silicon
    BS EN 62258-1:2010 Semiconductor die products Procurement and use
    01/206130 DC : DRAFT AUG 2001 IEC 62258 - SEMICONDUCTOR DIE PRODUCTS - MINIMUM REQUIREMENTS FOR PROCUREMENT AND USE - PART 1: GENERAL REQUIREMENTS - MECHANICAL, MATERIAL AND CONNECTIVITY
    MIL-HDBK-11991 Base Document:1996 DESIGN OF ELECTRICAL, ELECTRONIC, AND ELECTRO-MECHANICAL EQUIPMENT, GUIDED MISSILE AND ASSOCIATED WEAPONS SYSTEMS
    MIL-PRF-83383 Revision F:2017 Circuit Breakers, Remote Control, Thermal, Trip Free General Specification For
    MIL-A-29420 Base Document:1985 AMPLIFIER-CONVERTER: AM-6879/URC
    MIL-M-63530 Base Document:1982 MICROCIRCUIT, DIGITAL, CMOS (LOGIC)
    MIL-M-38510-374 Revision A:2004 Microcircuits, Digital, Bipolar, Advanced Low Power Schottky TTL, and Gates, Monolithic Silicon
    ASTM D 2442 : 1975 : R2012 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
    DD IEC/TS 62239:2003 Process management for avionics. Preparation of an electronic components management plan
    MIL-F-24638 Base Document:1984 FREQUENCY CHANGER, SOLID STATE, AIR COOLED (NAVAL SHIPBOARD)
    17/30371228 DC : 0 BS EN 62149-3 ED.3.0 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 3: MODULATOR-INTEGRATED LASER DIODE TRANSMITTERS FOR 2;5-GBIT/S TO 40-GBIT/S FIBRE OPTIC TRANSMISSION SYSTEMS
    DSCC 95010 : D FILTER, EMI AND TRANSIENT SUPPRESSION, HYBRID
    MIL-C-87179 Base Document:1984 COATING, PROTECTIVE, SOLVENT REMOVABLE, FOR MICROCIRCUITS
    MIL M 38510/233 : A MICROCIRCUIT DIGITAL TTL 4096 BIT RANDOM ACCESS MEMORY (RAM) MONOLITHIC SILICON
    MIL-M-38510-172 Revision C:2004 Microcircuits, Digital, CMOS, and-or-Invert, Exclusive-or, Exclusive-nor Gates, Monolithic Silicon, Positive Logic
    MIL-DTL-62421 Revision A:2009 CONTROL, UNIT, ELECTRONIC, DIGITAL
    MIL-M-38510-291 Revision B:2006 MICROCIRCUITS, DIGITAL, CMOS 16,384 BIT STATIC RANDOM ACCESS MEMORY (RAM) MONOLITHIC SILICON
    MIL-M-38510-322 Revision C:2003 Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Hex Bus Drivers with 3 State Outputs, Monolithic Silicon
    MIL-M-38510-178 Revision A:1984 MICROCIRCUIT, DIGITAL, CMOS MULTIPLEXERS DEMULTIPLEXERS MONOLITHIC SILICON, POSITIVE LOGIC
    MIL M 38510/235 : C MICROCIRCUIT DIGITAL MOS 4096 BIT RANDOM ACCESS MEMORY (RAM) MONOLITHIC SILICON
    MIL C 0024621 : A COUPLERS, PASSIVE, FIBER OPTIC, GENERAL SPECIFICATION FOR
    ASTM E 2311 : 2004 : R2016 Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space
    MIL-M-38510-750 Revision B:2003 Microcircuits, Digital, Advanced CMOS, Nand Gates, Monolithic Silicon, Positive Logic
    MIL-M-38510-348 Revision C:2004 Microcircuits, Digital, Bipolar, Advanced Schottky TTL, Bus Transceivers with Three-State Outputs, Monolithic Silicon
    MIL-M-38510-110 Revision C:2003 Microcircuits, Linear, Quad Operational Amplifiers, Monolithic Silicon
    MIL-M-38510-73 Revision B:2005 MICROCIRCUITS, DIGITAL, BIPOLAR, SCHOTTKY TTL, MULTIPLE NOR GATES, MONOLITHIC SILICON
    MIL-M-38510-753 Revision B:2003 Microcircuits, Digital, Advanced CMOS, Flip-Flops, Monolithic Silicon, Positive Logic
    MIL-M-38510-176 Revision B:2004 MICROCIRCUIT, DIGITAL, CMOS, LATCHES, MONOLITHIC SILICON, POSITIVE LOGIC
    MIL-STD-1546 Revision B:1992 PARTS, MATERIALS, AND PROCESSES CONTROL PROGRAM FOR SPACE AND LAUNCH VEHICLES
    MIL M 38510/226 : A MICROCIRCUITS DIGITAL NMOS 16,384 BIT ELECTRICALLY PROGRAMMABLE READ ONLY MEMORY (EPROM) MONOLITHIC SILICON
    MIL-M-38510-503 Revision B:1987 MICROCIRCUITS, DIGITAL, BIPOLAR, PROGRAMMABLE LOGIC, MONOLITHIC SILICON
    CEI ES 59001 : 2000 APPROVAL SCHEME FOR AUTOMOTIVE ORIENTED APPLICATIONS WITHIN THE ELECTRONIC COMPONENTS INDUSTRY - SEMICONDUCTOR STRESS TEST QUALIFICATION
    DSCC 11018 : 0 INDUCTORS, SMD, CHIP, THIN FILM, TIGHT TOLERANCE, 0603
    MIL-M-38510-16 Revision A:2005 MICROCIRCUITS, DIGITAL, TTL, AND GATES, MONOLITHIC SILICON
    MIL-M-38510-423 Revision A:1983 MICROCIRCUITS, DIGITAL, SCHOTTKY TTL, SYSTEM CONTROLLER AND BUS DRIVER, MONOLITHIC SILICON
    DSCC 85145 : E RELAYS, SOLID STATE, OPTICALLY ISOLATED, HERMETICALLY SEALED, 240 MILLIAMPERES, +/-100 V DC BIDIRECTIONAL, ANALOG SIGNAL SWITCHING, SPST (N.O.), CMOS AND TTL CONTROL INPUTS
    MIL-E-63300 Revision A:1981 ELECTRONIC ASSEMBLY FOR MINE, ANTIPERSONNEL, HE, M74
    MIL-R-85669 Base Document:1988 REPEATER SET, RADIO, POD AN/ARQ-49
    MIL D 87213 : 0 DISPLAYS/OPTICALLY GENERATED REQUEST FOR ISSUE OTHER THAN DOD MUST BE SENT VIA; ASD/ENES, WRIGHT-PATTERSON AFB OH 45433-6503
    DSCC 90091 : G RELAY, SOLID STATE, HERMETICALLY SEALED, OPTICALLY ISOLATED, 1 OR 2 A, WITH OR WITHOUT CIRCUIT-BREAKER ACTION OR STATUS INDICATION, 6-PIN CERAMIC DUAL-IN-LINE PACKAGE
    MIL-M-38510-238 Revision B:2003 Microcircuits, Digital, MOS, 4096 Bit Static Random Access Memory (RAM), Monolithic Silicon
    MIL-M-38510-373 Revision A:2004 Microcircuits, Digital, Bipolar, Advanced Low Power Schottky TTL, Nor Gates, Monolithic Silicon
    MIL-M-38510-210 Revision F:2013 Microcircuit, Digital, 16,384 Bit Schottky, Bipolar, Programmable Read-Only Memory (PROM) Monolithic Silicon
    MIL-R-83726-22 Revision F:2008 Relays, Solid State, Repeat Cycle Timer, Type IV, Class C, SPST, 250 Milliamperes (No S/S Document)
    MIL-M-38510-13 Revision G:2005 MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, COUNTERS, MONOLITHIC SILICON
    MIL-N-63396 Base Document:1981 NETWORK, RESISTOR FIXED & ADJUSTABLE
    MIL-M-38510-663 Revision A:2006 MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, COUNTERS, MONOLITHIC SILICON
    MIL-M-38510-702 Revision A:2005 MICROCIRCUITS, LINEAR, REGULATING, PULSE WIDTH MODULATORS, MONOLITHIC SILICON
    MIL-M-38510-61 Revision C:2004 Microcircuits, Digital, ECL, Flip-Flops, Monolithic Silicon
    IEC TS 62239-2:2017 Process management for avionics - Management plan - Part 2: Preparation and maintenance of an electronic COTS assembly management plan
    MIL-M-38510-102 Revision C:2003 Microcircuits, Linear, Voltage Regulator, Monolithic Silicon
    I.S. EN 62572-3:2016 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS - PART 3: LASER MODULES USED FOR TELECOMMUNICATION
    ASTM F 458 : 2013 : R2018 Standard Practice for Nondestructive Pull Testing of Wire Bonds (Withdrawn 2023)
    ARINC 628P1-7 : 2015 CABIN EQUIPMENT INTERFACES - PART 1: CABIN MANAGEMENT AND ENTERTAINMENT SYSTEM - PERIPHERALS
    I.S. EN 16602-60:2015 SPACE PRODUCT ASSURANCE - ELECTRICAL, ELECTRONIC AND ELECTROMECHANICAL (EEE) COMPONENTS
    DSCC SMD 5962-87739 : H MICROCIRCUIT, LINEAR, QUAD, VOLTAGE COMPARATOR, RADIATION HARDENED, MONOLITHIC SILICON
    I.S. EN 62258-1:2010 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
    IEC 60300-3-7:1999 Dependability management - Part 3-7: Application guide - Reliability stress screening of electronic hardware
    ASTM E 2311 : 2004 : R2009 Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space
    DSCC 06023 : B FILTER, EMI, HYBRID, 28V DC
    ASTM F 97 : 1972 : R2002 : EDT 1 Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration (Withdrawn 2008)
    IEC 62149-3:2014 Fibre optic active components and devices - Performance standards - Part 3: Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems
    EN 62149-6:2003 Fibre optic active components and devices - Performance standards - Part 6: 650-nm 250-Mbit/s plastic optical fibre transceivers
    EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
    DSCC 01515L:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS,FIELD PROGRAMMABLE GATE ARRAY, 72,000 GATES, MONOLITHIC SILICON
    DSCC 93173B:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PARALLEL FIFO,MONOLITHIC SILICON
    DSCC 21203A:2023 MICROCIRCUIT, LINEAR, LOW DROPOUT, VOLTAGE REGULATOR, MONOLITHIC SILICON
    DSCC 84185G:2023 MICROCIRCUIT, LINEAR, TWO-STAGE DIFFERENTIAL VIDEO AMPLIFIER, MONOLITHIC SILICON
    DSCC 6209D:2023 MICROCIRCUIT, HYBRID, LINEAR, 3.3 VOLT, SINGLE CHANNEL, DC-DC CONVERTER
    DSCC V62/22612:2022 MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON
    DSCC V62/P22612A:2022 MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON
    DSCC 99514D:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1-MEG X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
    DSCC 89683F:2022 MICROCIRCUIT, HYBRID, LINEAR, 5-VOLT,SINGLE CHANNEL, DC/DC CONVERTER
    DSCC V62/23612:2023 MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON
    DSCC 84180H:2023 MICROCIRCUIT, LINEAR, PRECISION VOLTAGE REFERENCES, SHUNT REGULATORS, MONOLITHIC SILICON
    DSCC 87806F:2023 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, BCD-TO-7 SEGMENT LATCH/DECODER/DRIVER, MONOLITHIC SILICON
    DSCC 92042H:2022 MICROCIRCUIT, LINEAR, CMOS, MULTIPLEXER,MONOLITHIC SILICON
    DSCC 87578F:2023 MICROCIRCUIT, LINEAR, LOW-NOISE OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
    DSCC 14211D:2023 MICROCIRCUIT, HYBRID, DUAL CHANNEL,DC-DC CONVERTER
    DSCC 92069B:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X PARALLEL-TO-SERIAL FIFO, MONOLITHIC SILICON
    DSCC 88755D:2023 MICROCIRCUIT, DIGITAL, ADVANCED CMOS,QUAD 2-INPUT MULTIPLEXER, TTL COMPATIBLEINPUTS, MONOLITHIC SILICON
    DSCC 86054C:2023 MICROCIRCUIT, LINEAR, ELECTROLUMINESCENT ROW DRIVER, MONOLITHIC SILICON
    DSCC 89746D:2023 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS,8-INPUT NAND GATE, TTL COMPATIBLE INPUTS MONOLITHIC SILICON
    DSCC 89718F:2023 MICROCIRCUIT, HYBRID, LINEAR, DIGITALTO-ANALOG CONVERTER WITH INPUT REGISTER
    DSCC 01512C:2023 MICROCIRCUIT, LINEAR, DUAL, HIGH SPEED, FET DRIVER, MONOLITHIC SILICON
    DSCC 88562H:2022 MICROCIRCUIT, LINEAR, FAST ±150 mA, POWER BUFFER, MONOLITHIC SILICON
    DSCC 16210A:2023 MICROCIRCUIT, LINEAR, OCTAL DIODE ARRAY PAIRS WITH REDUNDANCY, MONOLITHIC SILICON
    DSCC 96801E:2023 MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, HEX SCHMITT TRIGGER INVERTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
    DSCC 14228C:2023 MICROCIRCUIT, LINEAR, SINK/SOURCE DDR TERMINATION VOLTAGE REGULATOR,MONOLITHIC SILICON
    DSCC 90765G:2023 MICROCIRCUIT, LINEAR, LINE DRIVER, QUAD DIFFERENTIAL, MONOLITHIC SILICON
    DSCC 97621D:2023 MICROCIRCUIT, LINEAR, HIGH SPEED DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON
    DSCC 87629J:2022 MICROCIRCUIT, DIGITAL, FAST CMOS,NONINVERTING OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
    DSCC 94521D:2022 MICROCIRCUIT, LINEAR, PICOAMPERE INPUT CURRENT, QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
    DSCC 87524E:2023 MICROCIRCUIT, LINEAR, LINE RECEIVER, DUAL,DIFFERENTIAL, MONOLITHIC SILICON
    DSCC 91618B:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 9 FIFO, MONOLITHIC SILICON
    DSCC V62/22609:2022 MICROCIRCUIT, LINEAR, SINGLE CHANNEL LOAD SWITCH, MONOLITHIC SILICON
    DSCC 88730D:2022 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, QUADRUPLE, 2-INPUT POSITIVE OR DRIVERS, MONOLITHIC SILICON
    DSCC 89680E:2023 MICROCIRCUIT, LINEAR, OCTAL GENERAL INTERFACE BUS TRANSCEIVER, MONOLITHIC SILICON
    DSCC 95729F:2023 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, RADIATION HARDENED, 4 TO 16 LINE DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
    DSCC 87616D:2023 MICROCIRCUIT, LINEAR, QUAD DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON
    DSCC V62/22609A:2023 MICROCIRCUIT, LINEAR, SINGLE CHANNEL LOAD SWITCH, MONOLITHIC SILICON
    DSCC 90557E:2023 MICROCIRCUIT, DIGITAL, CMOS, DUAL PRECISION MONOSTABLE MULTIVIBRATOR MONOLITHIC SILICON
    DSCC 17202B:2022 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990
    DSCC 92075D:2023 MICROCIRCUIT, DIGITAL, ECL, 68030/40 ECL/TTL CLOCK DRIVER,MONOLITHIC SILICON
    DSCC 86018F:2023 MICROCIRCUIT, LINEAR, AC PLASMA DISPLAY DRIVERS, MONOLITHIC SILICON
    DSCC 90748D:2023 MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUFFER INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICO
    DSCC 91549BG:2022 MICROCIRCUIT, MEMORY, DIGITAL, CMOSEE PROGRAMMABLE READ ONLY MEMORY 256 X 16, MONOLITHIC SILICON
    DSCC 84056H:2023 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL D-TYPE FLIP-FLOP WITH CLEAR AND PRESET, MONOLITHIC SILICON
    DSCC 99560H:2022 MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED DUAL NON-INVERTING MOSFET DRIVER, MONOLITHIC SILICON
    DSCC 89554D:2023 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, DUAL 4-INPUT POSITIVE-AND GATE, MONOLITHIC SILICON
    DSCC 95525B:2023 MICROCIRCUIT, DIGITAL, CMOS, QUAD ELECTRICALLY ERASABLE PROGRAMMABLE POTENTIOMETER, MONOLITHIC SILICON
    DSCC 89525E:2023 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, BUS INTERFACE FLIP-FLOP, MONOLITHIC SILICON
    DSCC 89702D:2023 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL J-K FLIP-FLOP WITH SET AND RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
    DSCC 92057B:2023 MICROCIRCUIT, MEMORY, DIGITAL, CMOS,1K X 18 PARALLEL FIFO, MONOLITHIC SILICON
    DSCC 11214F:2023 MICROCIRCUIT, HYBRID, LINEAR, DUAL CHANNEL, DC-DC CONVERTER
    DSCC 97603D:2023 MICROCIRCUIT, LINEAR, DUAL, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
    DSCC V62/18621:2022 MICROCIRCUIT, DIGITAL, MICROCONTROLLER,MONOLITHIC SILICON
    DSCC 91639E:2023 MICROCIRCUIT, LINEAR, CMOS QUAD DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON
    DSCC 87801E:2023 MICROCIRCUIT, LINEAR, MICROPROCESSOR COMPATIBLE, 12-BIT D/A CONVERTER, MONLITHIC SILICON
    DSCC 99549E:2023 MICROCIRCUIT, HYBRID, LINEAR, 12 VOLT, SINGLE CHANNEL, DC/DC CONVERTER
    DSCC 01517G:2022 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 3.3 V, 32K X 8-BIT PROM, MONOLITHIC SILICON
    DSCC 77049L:2023 MICROCIRCUIT, DIGITAL-LINEAR, TTL DUAL PERIPHERAL DRIVERS, MONOLITHIC SILICON
    DSCC 15236C:2022 MICROCIRCUIT, LINEAR, 30 V, LOW NOISE, RAIL TO RAIL INPUT/OUTPUT, LOW POWER QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
    DSCC 92218E:2023 MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL EDGE TRIGGERED D FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
    DSCC 89705D:2023 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, QUAD 2-INPUT MULTIPLEXER WITH THREE-STATE NONINVERTING OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
    DSCC 11224E:2023 MICROCIRCUIT, HYBRID, LINEAR, SINGLE CHANNEL, DC-DC CONVERTER
    DSCC 89802D:2023 MICROCIRCUIT, LINEAR, PRECISION, 10-VOLT VOLTAGE REFERENCE, MONOLITHIC SILICON
    DSCC 81023P:2023 MICROCIRCUIT, LINEAR, BI-FET OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON
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    IPC 5702 : 0 GUIDELINES FOR OEMS IN DETERMINING ACCEPTABLE LEVELS OF CLEANLINESS OF UNPOPULATED PRINTED BOARDS
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    MIL-R-81876 Revision B:1988 RECEIVER, TRANSMITTER RADIO SET AN/APX-100(V)
    MIL S 19500/474 : D SEMICONDUCTOR DEVICE, SILICON, MULTIPLE DIODE ARRAYS, TYPES 1N5768, 1N5772, 1N5774, 1N6100, 1N6101, IN6496, 1N6506, 1N6507, 1N6508, 1N6509, 1N6510, 1N6511, JAN, JANTX, JANTXV AND JANS
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    DSCC 09023 : 0 CAPACITORS, FIXED, CERAMIC, CHIP, TIGHT TOLERANCE, THIN FILM, 0201
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    DSCC 94010 : F FILTER, EMI, HYBRID
    MIL A 28875 : 0 AMPLIFIER, RADIO FREQUENCY AND MICROWAVE, SOLID STATE, GENERAL SPECIFICATION FOR
    MIL-STD-1389 Revision D:1989 DESIGN REQUIREMENTS FOR STANDARD ELECTRONIC MODULES
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    MIL-E-48630 Base Document:1986 ELECTRONIC ASSEMBLY, FOR MINES, M718A1/M741A1, SYSTEM
    DSCC 85141 : C DELAY LINE, THREE DELAY LINE UNITS, 14 PIN DIP COMPATIBLE, TTL INTERFACED
    MIL-F-48267 Base Document:1973 FUZE TIMER, MINE (INTEGRATED CIRCUIT)
    DSCC SMD 5962-06232 : 0 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, SPACEWIRE PHYSICAL LAYER TRANSCEIVER, MONOLITHIC SILICON
    MIL-I-48632 Base Document:1986 INTEGRATED CIRCUIT, DIGITAL CMOS CONTROL AND TIMING BASE, MONOLITHIC, SILICON
    11/30250232 DC : 0 BS EN 60749-26 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM)
    02/203838 DC : DRAFT MAR 2002
    MIL-P-24423 Base Document:1970 PROPULSION AND AUXILIARY CONTROL CONSOLES AND ASSOCIATED CONTROL AND INSTRUMENTATION EQUIPMENT, NAVAL SHIPBOARD USE, BASIC DESIGN REQUIREMENTS
    MIL-M-24791-2 Base Document:1995 MODULE, FIBER OPTIC, RECEIVER, DIGITAL, 160 MBD, ASSOCIATED DETAIL SPECIFICATION FOR
    MIL-M-38510-250 Base Document:1986 MICROCIRCUITS, DIGITAL, CMOS, 512 X 9 BIT, FIRST IN - FIRST OUT DUAL PORT MEMORY (FIFO), MONOLITHIC SILICON
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    MIL M 38510/220 : A MICROCIRCUIT DIGITAL 8192 BIT MOS ULTRAVIOLET ERASABLE PROGRAMMABLE READ ONLY MEMORY (EPROM) MONOLITHIC SILICON
    MIL-M-38510-249 Revision A:1990 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 1,048,576/1-BIT DYNAMIC RANDOM ACCESS (DRAM), MONOLITHIC SILICON
    MIL-STD-100 Revision G:1997 ENGINEERING DRAWINGS
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    MIL-E-63399 Revision B:1981 ELECTRONICS-MCD ASSEMBLY FOR MINE, ANTITANK: HE, M75
    MIL-STD-976 Revision B:1988 CERTIFICATION REQUIREMENTS FOR JAN MICROCIRCUITS
    ASTM E 2311 : 2004 Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space
    DSCC 91020 : F FILTER, EMI, HYBRID
    DOD-STD-35-37 Revision A:1978 AUTOMATED ENGINEERING DOCUMENT PREPARATION SYSTEM INDUCTORS
    MIL-I-85671 Base Document:1987 INDICATOR, FREQUENCY CHANNEL ID-2121A/ARC, ID-2229A/ARC AND ID-2303/ARC
    MIL-S-49433 Base Document:1984 SURFACE ACOUSTIC WAVE DEVICES, GENERAL SPECIFICATION FOR
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    MIL-S-19500-517 Base Document:1977 SEMICONDUCTOR DEVICE, SILICON, DIODE ARRAY, TYPE 1N6101 JAN, JANTX, AND JANTXV
    MIL-M-38510-472 Revision A:1983 MICROCIRCUIT, DIGITAL, CMOS, 512 WORD X 8 BIT STATIC READ ONLY MEMORY (ROM) MONOLITHIC SILICON
    MIL-M-38510-45 Revision B:1984 MICROCIRCUITS, DIGITAL, TTL, LOW POWER, BISTABLE LATCHES, MONOLITHIC SILICON
    MIL-M-38510-376 Base Document:1983 MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, SHIFT REGISTERS, CASCADABLE, MONOLITHIC SILICON
    MIL-M-38510-403 Revision A:1983 MICROCIRCUITS, DIGITAL, NMOS, 2048 WORD X 8 BIT STATIC READ ONLY MEMORY (ROM) MONOLITHIC SILICON.
    MIL-M-38510-485 Base Document:1989 MICROCIRCUITS, DIGITAL, CMOS, SILICON GATE, MONOLITHIC, 8-BIT MICROPROCESSOR
    MIL-M-38510-442 Revision A:1983 MICROCIRCUITS, DIGITAL, SCHOTTKY, TTL, D-TYPE REGISTER, WITH THREE-STATE OUTPUT, MONOLITHIC SILICON
    MIL-M-38510-244 Revision B:1984 MICROCIRCUITS, DIGITAL, NMOS, 65,536 BIT, DYNAMIC RANDOM ACCESS MEMORY (DRAM), MONOLITHIC SILICON
    MIL-M-38510-483 Revision A:1984 MICROCIRCUITS, DIGITAL, N-CHANNEL, SILICON GATE MONOLITHIC COUNTER/TIMER UNIT
    MIL-M-38510-481 Revision A:1984 MICROCIRCUIT, DIGITAL, N-CHANNEL, SILICON GATE MONOLITHIC DUAL SERIAL INPUT/OUTPUT CONTROLLER.
    MIL-M-38510-402 Revision A:1983 MICROCIRCUITS, DIGITAL, MOS, 1024 BITS STATIC RANDOM ACCESS MEMORY (RAM), MONOLITHIC SILICON
    MIL STD 1836 : NOTICE 1 STANDARDIZATION & CONTROL PROGRAM FOR PARTS, MATERIALS & PROCESSES USED IN INTERCONTINENTAL BALLISTIC MISSILE WEAPON SYSTEMS
    BS EN 45502-2-3:2010 Active implantable medical devices Particular requirements for cochlear and auditory brainstem implant systems
    MIL-D-60031 Revision A:1978 DETONATOR, ELECTRIC M69 LOADING, ASSEMBLING AND PACKING
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    MIL-M-38510-401 Revision A:1983 MICROCIRCUITS, DIGITAL, N-CHANNEL, SILICON-GATE, MONOLITHIC PERIPHERAL INTERFACE ADAPTER
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    MIL-STD-977 Base Document:1982 TEST METHODS AND PROCEDURES FOR MICROCIRCUIT LINE CERTIFICATION
    MIL-M-38510-309 Revision E:2003 MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, DATA SELECTOR/MULTIPLEXER WITH THREE-STATE OUTPUTS, CASCADABLE, MONOLITHIC SILICON
    MIL-M-38510-308 Revision B:2003 Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Arithmetic Logic Units/Function Generators, Monolithic Silicon
    MIL-DTL-28875 Revision C:2012 Amplifiers, Radio-Frequency and Microwave, Solid-State, General Specification for
    MIL-M-38510-246 Base Document:1987 MICROCIRCUITS, MEMORY, DIGITAL, NMOS, 246,144-BIT DYNAMIC RANDOM ACCESS MEMORY (DRAM), MONOLITHIC SILICON
    MIL-M-38510-654 Revision A:2006 MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, LATCHES, MONOLITHIC SILICON
    MIL-PRF-19500-548 Revision J:2015 COUPLER, OPTOELECTRONIC, SEMICONDUCTOR DEVICE, SOLID STATE, THROUGH HOLE AND SURFACE MOUNT, TYPES 4N47, 4N48, AND 4N49, QUALITY LEVELS: JAN, JANTX, JANTXV, AND JANS
    MIL-M-38510-56 Revision G:2005 MICROCIRCUITS, DIGITAL, CMOS, COUNTERS/DIVIDERS, MONOLITHIC SILICON
    MIL-PRF-32085 Base Document:2001 RELAYS, ELECTROMAGNETIC, 270 V DC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL-M-48647 Base Document:1986 MICROCIRCUIT, DIGITAL, DECODER, LOGIC ARRAY
    MIL-P-85576 Revision B:1987 POWER SUPPLY PP-2581C/A
    MIL-M-63320 Revision A:1981 MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
    MIL-STD-1331 Base Document:1969 PARAMETER TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS
    MIL-M-38510-333 Revision C:2003 Microcircuits, Digital, Bipolar Advanced Schottky TTL, Nor Gates, Monolithic Silicon
    MIL-M-38510-382 Revision B:2004 MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, D-TYPE LATCHES, CASCADABLE, MONOLITHIC SILICON
    MIL-PRF-27-370 Revision B:2013 INDUCTOR, POWER, HIGH CURRENT, SURFACE MOUNT
    MIL-M-38510-486 Base Document:1989 MICROCIRCUITS, DIGITAL, CMOS, SERIAL COMMUNICATIONS CONTROLLER, MONOLITHIC SILICON
    MIL-R-63322 Revision A:1981 RESISTOR NETWORK, FIXED, FILM (EXTERNALLY TRIMMABLE)
    MIL-M-38510-221 Revision A:1983 MICROCIRCUIT DIGITAL 16384 BIT MOS ULTRAVIOLET ERASABLE PROGRAMMABLE READ ONLY MEMORY (EPROM) MONOLITHIC SILICON
    MIL M 38510/616 : NOTICE 3 MICROCIRCUITS, DIGITAL, BIPOLAR, VHSIC, ADDRESS GENERATOR, MONOLITHIC SILICON
    MIL-PRF-27-368 Revision B:2013 INDUCTOR, POWER, SURFACE MOUNT
    SAE AS 83519 : 2015 SHIELD TERMINATION, SOLDER STYLE, INSULATED, HEAT-SHRINKABLE, ENVIRONMENT RESISTANT GENERAL SPECIFICATION FOR
    IEC TR 62572-2:2008 Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation
    ARINC 628-4C : 2005 CABIN EQUIPMENT INTERFACES (CEI) - PART 4C: CABIN MANAGEMENT AND ENTERTAINMENT SYSTEM - CABIN DISTRIBUTION SYSTEM - 2[ND] GENERATION - DAISY CHAIN
    I.S. EN 16602-60-05:2014 SPACE PRODUCT ASSURANCE - GENERIC PROCUREMENT REQUIREMENTS FOR HYBRIDS
    ASTM E 1161 : 2009 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
    I.S. EN 45502-2-3:2010 ACTIVE IMPLANTABLE MEDICAL DEVICES - PART 2-3: PARTICULAR REQUIREMENTS FOR COCHLEAR AND AUDITORY BRAINSTEM IMPLANT SYSTEMS
    DSCC 10017 : A FILTER, EMI, HYBRID, 8 AMP
    SAE AS 6081 : 2012 FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS: AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION - DISTRIBUTORS
    SAE AS 6171/5 : 2016 TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS
    ASTM D 2442 : 1975 : R2007 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
    ASTM D 2442 : 1975 : R2016 Standard Specification for Alumina Ceramics for Electrical and Electronic Applications
    IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
    IEC 62005-9-1:2015 Fibre optic interconnecting devices and passive components - Reliability - Part 9-1: Qualification of passive optical components
    EN 62572-3:2016 Fibre optic active components and devices - Reliability standards - Part 3: Laser modules used for telecommunication
    EN 62005-9-1:2015 Fibre optic interconnecting devices and passive components - Reliability - Part 9-1: Qualification of passive optical components
    IEC 62396-1:2016 RLV Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
    ASME Y14.100 : 2017 ENGINEERING DRAWING PRACTICES - ENGINEERING DRAWING AND RELATED DOCUMENTATION PRACTICES

    Standards Referencing This Book - (Show below) - (Hide below)

    IPC T 50 : M TERMS AND DEFINITIONS FOR INTERCONNECTING AND PACKAGING ELECTRONIC CIRCUITS
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    ASTM E 801 : 2016 : REDLINE Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices
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    MIL-HDBK-1331 Revision A:2003 PARAMETERS TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS
    ASTM E 720 : 2016 : REDLINE Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
    ASTM E 2450 : 2016 : REDLINE Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
    ISO 14644-2:2015 Cleanrooms and associated controlled environments Part 2: Monitoring to provide evidence of cleanroom performance related to air cleanliness by particle concentration
    ANSI/NCSL Z540 3 : 2006(R2013) REQUIREMENTS FOR THE CALIBRATION OF MEASURING AND TEST EQUIPMENT
    MIL-PRF-19500 Revision P:2010 SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    ASTM D 1120 : 2017 : REDLINE Standard Test Method for Boiling Point of Engine Coolants
    MIL-PRF-38534 Revision J:2015 HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR
    ASTM F 526 : 2016 : REDLINE Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
    MIL-STD-1686 Revision C:1995 ELECTROSTATIC DISCHARGE CONTROL PROGRAM FOR PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS, ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES)
    ASTM E 265 : 2015 : REDLINE Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
    MIL-HDBK-781 Revision A:1996 RELIABILITY TEST METHODS, PLANS, AND ENVIRONMENTS FOR ENGINEERING DEVELOPMENT, QUALIFICATION AND PRODUCTION
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    ISO/ASTM 51275:2013 Practice for use of a radiochromic film dosimetry system
    MIL-STD-1916 Base Document:1996 DOD PREFERRED METHODS FOR ACCEPTANCE OF PRODUCT
    MIL-PRF-680 Revision C:2010 DEGREASING SOLVENT
    IPC J STD 006 : C REQUIREMENTS FOR ELECTRONIC GRADE SOLDER ALLOYS AND FLUXED AND NON-FLUXED SOLID SOLDERS FOR ELECTRONIC SOLDERING APPLICATIONS
    A-A-58092 Base Document:1997 TAPE, ANTISEIZE, POLYTETRAFLUOROETHYLENE
    ASTM E 721 : 2016 : REDLINE Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
    IPC J STD 004 : B REQUIREMENTS FOR SOLDERING FLUXES
    IPC J STD 033C-1:2014 HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES
    ASTM E 722 : 2014 : REDLINE Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
    ASTM D 1331 : 2014 : REDLINE Standard Test Methods for Surface and Interfacial Tension of Solutions of Paints, Solvents, Solutions of Surface-Active Agents, and Related Materials
    ASTM E 668 : 2013 : REDLINE Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
    IPC J STD 005 : A REQUIREMENTS FOR SOLDERING PASTES
    ASTM E 1249 : 2015 : REDLINE Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
    MIL-HDBK-217 Revision F:1991 RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT
    ASTM E 1250 : 2015 : REDLINE Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
    ISO 14644-1:2015 Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration
    ASTM D 257 : 2014 : REDLINE Standard Test Methods for DC Resistance or Conductance of Insulating Materials
    MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for
    MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
    EIA 557 : 2006 STATISTICAL PROCESS CONTROL SYSTEMS
    ASTM E 666 : 2014 : REDLINE Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
    MIL-STD-1835 Revision D:2004 ELECTRONIC COMPONENT CASE OUTLINES
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