SAE AS 9003 : 2012
|
INSPECTION AND TEST QUALITY SYSTEMS, REQUIREMENTS FOR AVIATION, SPACE, AND DEFENSE ORGANIZATIONS |
ESD STM3.1 : 2015
|
IONIZATION |
ISO/IEC 17025:2005
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General requirements for the competence of testing and calibration laboratories |
SAE AS 5553B : 2016
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COUNTERFEIT ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION |
SAE AS 6171/1 : 2016
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SUSPECT/COUNTERFEIT TEST EVALUATION METHOD |
MIL STD 883 : K
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TEST METHOD STANDARD - MICROCIRCUITS |
SAE AS 6171/6 : 2016
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TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ACOUSTIC MICROSCOPY (AM) TEST METHODS |
SAE AS 6081 : 2012
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FRAUDULENT/COUNTERFEIT ELECTRONIC PARTS: AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION - DISTRIBUTORS |
SAE AS 6171/11 : 2016
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TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DESIGN RECOVERY TEST METHODS |
SAE AS 6171/7 : 2016
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TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ELECTRICAL TEST METHODS |
MIL PRF 19500 : P
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SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
MIL PRF 38534 : J
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HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
MIL STD 750 : F
|
TEST METHODS FOR SEMICONDUCTOR DEVICES |
SAE ARP 9009 : 2006
|
AEROSPACE CONTRACT CLAUSES |
SAE AS 9100D : 2016
|
QUALITY MANAGEMENT SYSTEMS - REQUIREMENTS FOR AVIATION, SPACE AND DEFENSE ORGANIZATIONS |
J STD 033C-1:2014
|
HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES |
ASTM E 2339 : 2015 : REDLINE
|
Standard Practice for Digital Imaging and Communication in Nondestructive Evaluation (DICONDE) |
SAE AS 6171/8 : 2016
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TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RAMAN SPECTROSCOPY TEST METHODS |
SAE AS 6171/3 : 2016
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TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY X-RAY FLUORESCENCE TEST METHODS |
ESD S20.20 : 2014
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PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS, ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES) |
SAE AS 6171/4 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS |
SAE AS 6171/9 : 2016
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TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY FOURIER TRANSFORM INFRARED SPECTROSCOPY (FTIR) TEST METHODS |
ISO 9001:2015
|
Quality management systems - Requirements |
SAE AS 6171/5 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY RADIOLOGICAL TEST METHODS |
ANSI/ISO/ASQ Q9001:2008
|
Quality Management Systems - Requirements |
MIL STD 1580 : B
|
DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS |
ISO 9000:2015
|
Quality management systems Fundamentals and vocabulary |
SAE AS 9120 : 2016
|
QUALITY MANAGEMENT SYSTEMS - REQUIREMENTS FOR AVIATION, SPACE AND DEFENSE DISTRIBUTORS |
MIL PRF 38535 : K
|
INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR |
MIL STD 202 : H
|
ELECTRONIC AND ELECTRICAL COMPONENT PARTS |
MIL STD 1629 : A
|
PROCEDURES FOR PERFORMING A FAILURE MODE, EFFECTS AND CRITICALITY ANALYSIS |
SAE AS 9110 : 2016
|
QUALITY MANAGEMENT SYSTEMS - REQUIREMENTS FOR AVIATION MAINTENANCE ORGANIZATIONS |
SAE AS 6171/10 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY THERMOGRAVIMETRIC ANALYSIS (TGA) TEST METHODS |