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  • SAE J 1752/3 : 2017

    Current The latest, up-to-date edition.

    MEASUREMENT OF RADIATED EMISSIONS FROM INTEGRATED CIRCUITS - TEM/WIDEBAND TEM (GTEM) CELL METHOD; TEM CELL (150 KHZ TO 1 GHZ), WIDEBAND TEM CELL (150 KHZ TO 8 GHZ)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  22-09-2017

    Publisher:  SAE International

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 References
    3 Definitions
    4 Test Conditions
    5 Test equipment
    6 Test set-up
    7 Test procedure
    8 Data presentation
    9 IC Emissions reference levels
    10 Notes
    Appendix A - Example calibration and set up verification sheet
    Appendix B - 1 GHz tem cell and wideband tem cell
    Appendix C - Calculation of dipole moment from measured data
    Appendix D - Specification of emission levels

    Abstract - (Show below) - (Hide below)

    This measurement procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC).

    General Product Information - (Show below) - (Hide below)

    Committee EMCS
    Document Type Standard
    Product Note This standard is now stabilized
    Publisher SAE International
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    SAE J 1752/1 : 2016 ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS - INTEGRATED CIRCUIT EMC MEASUREMENT PROCEDURES - GENERAL AND DEFINITIONS
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