SN EN 130000 : AMD 10 1997

Cooperating organizations
National foreword
Foreword
Preface
1. Scope
2. General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
3. Quality assessment procedures
3.1 General
3.2 Primary stage of manufacture
3.3 Subcontracting
3.4 Structurally similar components
3.5 Qualification approval procedures
3.6 Capability approval procedures
3.7 Rework and repair work
3.8 Release for delivery
3.9 Certified test records
3.10 CECC Assessed Process Average Procedure (APA)
3.11 Delayed delivery
3.12 Alternative test methods
3.13 Manufacture outside the geographical limits of
      CECC supervising inspectorates
3.14 Intermediate values within an approved range
4. TEST AND MEASUREMENT PROCEDURES
4.1 General
4.2 Standard atmospheric conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.5 Insulation resistance
4.6 Voltage proof
4.7 Capacitance
4.8 Tangent of loss angle (tan delta)
4.9 Leakage current
4.10 Impedance
4.11 Inductance
4.12 Outer foil termination
4.13 Robustness of terminations
4.14 Resistance to soldering heat
4.15 Solderability
4.16 Rapid change of temperature
4.17 Vibration
4.18 Bump
4.19 Shock
4.20 Container sealing
4.21 Climatic sequence
4.22 Damp heat, steady state
4.23 Endurance
4.24 Variation of capacitance with temperature
4.25 Storage
4.26 Surge
4.27 Charge and discharge test
4.28 Pressure relief (for aluminium electrolytic
      capacitors only)
4.29 Characteristics at high and low temperature
4.30 (Reserved)
4.31 Component solvent resistance
4.32 Solvent resistance of the marking
4.33 Mounting (for surface mounting capacitors only)
4.34 Shear test
4.35 Substrate bending test
4.36 (Reserved)
4.37 Accelerated damp heat steady state test
4.38 Passive flammability
4.39 High surge current test
4.40 Voltage transient overload (for aluminium electrolytic
      capacitors with non-solid electrolyte)
4.41 Equivalent series resistor (ESR)
Annex A - Interpretation of sampling plans and procedures
as described in IEC 410 for use within the CECC system
for electronic components
Annex B - Guidance for the extension of endurance tests
on fixed capacitors
Annex C - Guide for pulse testing of capacitors
Annex D - (normative) Layout of the first page of a
          PCP/CQC specification
Annex E - (normative) Requirements for capability approval
          test report
Table 3 - Measuring points
National annex NA (informative) Committees responsible
National annex NB (informative) Cross-references

Establishes standard terms, inspection procedures and methods of tests for use in sectional and detail specifications within the CECC System for electronic components. Coverage includes marking, voltage proof, impedance, bump, container sealing, vibration, climatic sequence, endurance, leakage current, drying, storage, surge, shear test, pressure relief, passive flammability, pressure relief, and rapid change of temperature.